| Year | Rank | Type | Title / Venue / Authors |
|---|---|---|---|
| 2026 | J | jnl |
IEEE Trans. Emerg. Top. Comput. Intell.
|
| 2026 | J | jnl |
IEEE Trans. Emerg. Top. Comput. Intell.
|
| 2026 | J | jnl |
CoRR
|
| 2025 | A* | conf |
ICML
|
| 2025 | J | jnl |
CoRR
|
| 2025 | J | jnl |
Cross-Modal Learning for Anomaly Detection in Complex Industrial Process: Methodology and Benchmark.
IEEE Trans. Circuits Syst. Video Technol.
|
| 2025 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2025 | J | jnl |
IEEE Trans. Pattern Anal. Mach. Intell.
|
| 2025 | C | conf |
MMSP
|
| 2025 | J | jnl |
IEEE Trans. Vis. Comput. Graph.
|
| 2025 | J | jnl |
IEEE Trans. Pattern Anal. Mach. Intell.
|
| 2025 | J | jnl |
CoRR
|
| 2024 | J | jnl |
IEEE Trans. Consumer Electron.
|
| 2024 | J | jnl |
CoRR
|
| 2023 | J | jnl |
CoRR
|
| 2023 | J | jnl |
IEEE Trans. Pattern Anal. Mach. Intell.
|
| 2023 | J | jnl |
IEEE Trans. Artif. Intell.
|
| 2023 | J | jnl |
ACM Trans. Knowl. Discov. Data
|
| 2023 | — | conf |
CVPR Workshops
|
| 2023 | — | conf |
CICAI (1)
|
| 2022 | J | jnl |
CoRR
|
| 2022 | J | jnl |
CoRR
|
| 2022 | J | jnl |
IEEE Trans. Instrum. Meas.
|
| 2022 | J | jnl |
IEEE Trans. Pattern Anal. Mach. Intell.
|
| 2021 | J | jnl |
IEEE Trans. Image Process.
|
| 2021 | A* | conf |
CVPR
|
| 2021 | J | jnl |
CoRR
|
| 2021 | A* | conf |
ICCV
|
| 2021 | J | jnl |
CoRR
|
| 2021 | J | jnl |
CoRR
|
| 2021 | J | jnl |
IEEE Trans. Image Process.
|
| 2020 | A* | conf |
ACM Multimedia
|
| 2020 | J | jnl |
CoRR
|
| 2020 | J | jnl |
CoRR
|
| 2019 | J | jnl |
Frontiers Comput. Sci.
|
| 2019 | J | jnl |
CoRR
|
| 2019 | J | jnl |
IEEE Trans. Image Process.
|
| 2019 | J | jnl |
IEEE Trans. Pattern Anal. Mach. Intell.
|
| 2018 | J | jnl |
IEEE Trans. Computational Imaging
|
| 2017 | — | conf |
CCCV (1)
|
| 2017 | J | jnl |
IEEE J. Sel. Top. Signal Process.
|
| 2017 | A* | conf |
CVPR
|
| 2015 | J | jnl |
Neurocomputing
|
| 2014 | J | jnl |
Comput. Electr. Eng.
|