Gabriel Torrens

27 papers A 2C 6Journal 12Unranked 7
YearRankTypeTitle / Venue / Authors
2024 J jnl
A 65-nm Reliable 6T CMOS SRAM Cell with Minimum Size Transistors.
CoRR
Gabriel Torrens, Bartomeu Alorda, Cristian Carmona, Daniel Malagón-Periánez, Jaume Segura, Sebastià Antoni Bota
2024 J jnl
An Affordable Experimental Technique for SRAM Write Margin Characterization for Nanometer CMOS Technologies.
CoRR
Bartomeu Alorda, Cristian Carmona, Gabriel Torrens, Sebastià A. Bota
2024 J jnl
Estimation during Design Phases of Suitable SRAM Cells for PUF Applications Using Separatrix and Mismatch Metrics.
CoRR
Abdel Alheyasat, Gabriel Torrens, Sebastià A. Bota, Bartomeu Alorda
2024 J jnl
SRAM Alpha-SER Estimation From Word-Line Voltage Margin Measurements: Design Architecture and Experimental Results.
CoRR
Gabriel Torrens, Ivan de Paúl, Bartomeu Alorda, Sebastià A. Bota, Jaume Segura
2024 J jnl
SRAM-Based PUF Reliability Prediction Using Cell-Imbalance Characterization in the State Space Diagram.
CoRR
Gabriel Torrens, Abdel Alheyasat, Bartomeu Alorda, Sebastià A. Bota
2024 J jnl
Single Event Upsets characterization of 65 nm CMOS 6T and 8T SRAM cells for ground level environment.
CoRR
Daniel Malagón, Gabriel Torrens, Jaume Segura, Sebastià A. Bota
2023 — conf
A Compact Double-Exponential Circuit for Single Event Transient Emulation.
DCIS
Sebastià A. Bota, Salvador Barceló, Gabriel Torrens, Rafel Perelló, Jaume Verd, Ivan de Paúl, Jaume Segura
2022 — conf
SRAM-cells Reproducibility Metrics for Physical Unclonable Function Applications.
DCIS
Abdel Alheyasat, Gabriel Torrens, Sebastià A. Bota, Bartomeu Alorda
2020 C conf
Bit-Cell Selection Analysis for Embedded SRAM-Based PUF.
ISCAS
Abdel Alheyasat, Gabriel Torrens, Sebastià A. Bota, Bartomeu Alorda
2020 — conf
Selection of SRAM Cells to improve Reliable PUF implementation using Cell Mismatch Metric.
DCIS
Abdel Alheyasat, Gabriel Torrens, Sebastià A. Bota, Bartomeu Alorda
2019 J jnl
A 65-nm Reliable 6T CMOS SRAM Cell with Minimum Size Transistors.
IEEE Trans. Emerg. Top. Comput.
Gabriel Torrens, Bartomeu Alorda, Cristian Carmona, Daniel Malagón-Periánez, Jaume Segura, Sebastià A. Bota
2019 — conf
Weak and Strong SRAM cells analysis in embedded memories for PUF applications.
DCIS
Abdel Alheyasat, Gabriel Torrens, Sebastià A. Bota, Bartomeu Alorda
2017 C conf
6T CMOS SRAMs reliability monitoring through stability measurements.
IOLTS
Bartomeu Alorda, Gabriel Torrens, Sebastià A. Bota
2017 — conf
Cantilever NEMS relay-based SRAM devices for enhanced reliability.
DTIS
Sebastià A. Bota, Jaume Verd, Joan Barceló, Xavier Gili, Bartomeu Alorda, Gabriel Torrens, Carol de Benito, Jaume Segura
2017 — conf
Evaluation of SRAM cell write margin metrics for lifetime monitoring of BTI-induced Vth drift.
DTIS
Bartomeu Alorda, Gabriel Torrens
2017 J jnl
Soft error rate comparison of 6T and 8T SRAM ICs using mono-energetic proton and neutron irradiation sources.
Microelectron. Reliab.
Daniel Malagón, Sebastià A. Bota, Gabriel Torrens, Xavier Gili, Javier Praena, B. Fernández, Miguel Macías, José Manuel Quesada, Carlos Guerrero Sanchez, María del Carmen Jiménez-Ramos, Javier García López, José Luis Merino, Jaume Segura
2017 — conf
Statistical characterization and modeling of random telegraph noise effects in 65nm SRAMs cells.
SMACD
Javier Martín-Martínez, Rosana Rodríguez, Montserrat Nafría, Gabriel Torrens, Sebastià A. Bota, Jaume Segura, Francesc Moll, Antonio Rubio
2016 J jnl
An affordable experimental technique for SRAM write margin characterization for nanometer CMOS technologies.
Microelectron. Reliab.
Bartomeu Alorda, Cristian Carmona, Gabriel Torrens, Sebastià A. Bota
2016 C conf
On-line write margin estimator to monitor performance degradation in SRAM cores.
IOLTS
Bartomeu Alorda, Cristian Carmona, Gabriel Torrens, Sebastià A. Bota
2014 J jnl
Adaptive static and dynamic noise margin improvement in minimum-sized 6T-SRAM cells.
Microelectron. Reliab.
Bartomeu Alorda, Gabriel Torrens, Sebastià A. Bota, Jaume Segura
2013 C conf
Accurate alpha soft error rate evaluation in SRAM memories.
IOLTS
Sebastià A. Bota, Gabriel Torrens, Ivan de Paúl, Bartomeu Alorda, L. A. Segura
2011 J jnl
8T vs. 6T SRAM cell radiation robustness: A comparative analysis.
Microelectron. Reliab.
Bartomeu Alorda, Gabriel Torrens, Sebastià A. Bota, Jaume Segura
2011 A conf
Stability optimization of embedded 8T SRAMs using Word-Line Voltage modulation.
DATE
Bartomeu Alorda, Gabriel Torrens, Sebastià A. Bota, Jaume Segura
2010 C conf
Cross-BIC architecture for single and multiple SEU detection enhancement in SRAM memories.
IOLTS
Sebastià A. Bota, Gabriel Torrens, Bartomeu Alorda, Jaume Verd, Jaume Segura
2010 J jnl
Design Hardening of Nanometer SRAMs Through Transistor Width Modulation and Multi-Vt Combination.
IEEE Trans. Circuits Syst. II Express Briefs
Gabriel Torrens, Bartomeu Alorda, Salvador Barceló, José Luis Rosselló, Sebastià A. Bota, Jaume Segura
2010 A conf
Static and dynamic stability improvement strategies for 6T CMOS low-power SRAMs.
DATE
Bartomeu Alorda, Gabriel Torrens, Sebastià A. Bota, Jaume Segura
2009 C conf
Critical charge characterization in 6-T SRAMs during read mode.
IOLTS
Sebastià A. Bota, Gabriel Torrens, Bartomeu Alorda