| Year | Rank | Type | Title / Venue / Authors |
|---|---|---|---|
| 2024 | J | jnl |
IEEE Trans. Instrum. Meas.
|
| 2023 | J | jnl |
Sensors
|
| 2022 | J | jnl |
IEEE Trans. Instrum. Meas.
|
| 2022 | J | jnl |
IEEE Access
|
| 2021 | J | jnl |
IEEE Access
|
| 2021 | J | jnl |
IEEE Access
|
| 2020 | J | jnl |
Improved Stepup Method to Determine the Errors of Voltage Instrument Transformer With High Accuracy.
IEEE Trans. Instrum. Meas.
|
| 2019 | J | jnl |
IEEE Access
|
| 2015 | J | jnl |
Microelectron. Reliab.
|
| 2015 | J | jnl |
Microelectron. Reliab.
|
| 2015 | J | jnl |
Microelectron. Reliab.
|
| 2013 | J | jnl |
Microelectron. Reliab.
|
| 2011 | J | jnl |
IEEE Trans. Instrum. Meas.
|