Frédéric Saigné

18 papers C 3Journal 8Unranked 7
YearRankTypeTitle / Venue / Authors
2020 — conf
Development and evaluation of a flexible instrumentation layer for system-level testing of radiation effects.
LATS
Israel C. Lopes, Vincent Pouget, Frederic Wrobel, Frédéric Saigné, Antoine D. Touboul, Ketil Røed
2020 — conf
Effect of Temperature on Single Event Latchup Sensitivity.
DTIS
S. Guagliardo, Frederic Wrobel, Ygor Q. Aguiar, Jean-Luc Autran, Paul Leroux, Frédéric Saigné, Vincent Pouget, Antoine D. Touboul
2020 — conf
Evaluation and Analysis of Technologies for Robotic Platforms for the Nuclear Decommissioning.
DTIS
Georgios Tsiligiannis, Antoine D. Touboul, Gaëtan Bricas, Tadec Maraine, Jerome Boch, Frederic Wrobel, Alain Michez, Frédéric Saigné, Alain Godot, Asenath Etile, Thibaud Durand, Romain Sueur, Didier Farigoule, Philippe Girones
2018 J jnl
Analysis of the charge sharing effect in the SET sensitivity of bulk 45 nm standard cell layouts under heavy ions.
Microelectron. Reliab.
Ygor Q. Aguiar, Frederic Wrobel, Jean-Luc Autran, Paul Leroux, Frédéric Saigné, Antoine D. Touboul, Vincent Pouget
2017 J jnl
A calculation method to estimate single event upset cross section.
Microelectron. Reliab.
Frederic Wrobel, Antoine D. Touboul, Vincent Pouget, Luigi Dilillo, Jerome Boch, Frédéric Saigné
2017 J jnl
Structural pattern extraction from asynchronous two-photon laser fault injection using spectral analysis.
Microelectron. Reliab.
Vincent Pouget, S. Jonathas, R. Job, J.-R. Vaillé, Frederic Wrobel, Frédéric Saigné
2015 — conf
Real-time SRAM based particle detector.
IWASI
Luigi Dilillo, Alexandre Bosser, Viyas Gupta, Frederic Wrobel, Frédéric Saigné
2013 — conf
Characterization of an SRAM based particle detector for mixed-field radiation environments.
IWASI
Georgios Tsiligiannis, Luigi Dilillo, Alberto Bosio, Patrick Girard, Serge Pravossoudovitch, Aida Todri-Sanial, Arnaud Virazel, Julien Mekki, Markus Brugger, J.-R. Vaillé, Frederic Wrobel, Frédéric Saigné
2013 J jnl
Modeling dose effects in electronics devices: Dose and temperature dependence of power MOSFET.
Microelectron. Reliab.
Alain Michez, Jerome Boch, S. Dhombres, Frédéric Saigné, Antoine D. Touboul, J.-R. Vaillé, Laurent Dusseau, E. Lorfèvre, R. Ecoffet
2013 — conf
On the correlation between Static Noise Margin and Soft Error Rate evaluated for a 40nm SRAM cell.
DFTS
Elena I. Vatajelu, Georgios Tsiligiannis, Luigi Dilillo, Alberto Bosio, Patrick Girard, Serge Pravossoudovitch, Aida Todri, Arnaud Virazel, Frederic Wrobel, Frédéric Saigné
2013 C conf
SRAM soft error rate evaluation under atmospheric neutron radiation and PVT variations.
IOLTS
Georgios Tsiligiannis, Elena I. Vatajelu, Luigi Dilillo, Alberto Bosio, Patrick Girard, Serge Pravossoudovitch, Aida Todri, Arnaud Virazel, Frederic Wrobel, Frédéric Saigné
2013 J jnl
Transient device simulation of neutron-induced failure in IGBT: A first step for developing a compact predictive model.
Microelectron. Reliab.
K. Guetarni, Antoine D. Touboul, Jerome Boch, L. Foro, A. Privat, Alain Michez, J.-R. Vaillé, Frédéric Saigné
2012 C conf
Evaluation of test algorithms stress effect on SRAMs under neutron radiation.
IOLTS
Georgios Tsiligiannis, Luigi Dilillo, Alberto Bosio, Patrick Girard, Aida Todri, Arnaud Virazel, Antoine D. Touboul, Frederic Wrobel, Frédéric Saigné
2012 J jnl
On the reliability assessment of trench fieldstop IGBT under atmospheric neutron spectrum.
Microelectron. Reliab.
Antoine D. Touboul, L. Foro, Frederic Wrobel, Frédéric Saigné
2011 J jnl
High fluence 1.8 MeV proton irradiation effects on n-type MOS capacitors.
Microelectron. Reliab.
R. Arinero, En-xia Zhang, Nadia Rezzak, Ronald D. Schrimpf, Daniel M. Fleetwood, B. K. Choï, A. B. Hmelo, Julien Mekki, Antoine D. Touboul, Frédéric Saigné
2011 J jnl
MC-ORACLE: A tool for predicting Soft Error Rate.
Comput. Phys. Commun.
Frederic Wrobel, Frédéric Saigné
2011 — conf
Neutron detection in atmospheric environment through static and dynamic SRAM-based test bench.
LATW
Luigi Dilillo, Paolo Rech, Jean-Marc Gallière, Patrick Girard, Frederic Wrobel, Frédéric Saigné
2005 C conf
A Review of DASIE Code Family: Contribution to SEU/MBU Understanding.
IOLTS
Guillaume Hubert, Nadine Buard, Cécile Weulersse, Thierry Carrière, Marie-Catherine Palau, Jean-Marie Palau, Damien Lambert, Jacques Baggio, Frederic Wrobel, Frédéric Saigné, Rémi Gaillard