Friedrich Taenzler

15 papers A 3Misc 5Journal 5Unranked 2
YearRankTypeTitle / Venue / Authors
2014 — conf
A novel BIST technique for LDMOS drivers.
MWSCAS
Bruce C. Kim, Saikat Mondal, Friedrich Taenzler, Kenneth Moushegian
2014 Misc conf
Development and empirical verification of an accuracy model for the power down leakage tests.
VTS
Jae Woong Jeong, Sule Ozev, Friedrich Taenzler, Hui-Chuan Chao
2013 Misc conf
Physics Based Fault Models for Testing High-Voltage LDMOS.
VLSI Design
Sukeshwar Kannan, Bruce C. Kim, Anurag Gupta, Friedrich Taenzler, Richard Antley, Ken Moushegian
2013 J jnl
Physics-Based Low-Cost Test Technique for High Voltage LDMOS.
J. Electron. Test.
Sukeshwar Kannan, Kaushal Kannan, Bruce C. Kim, Friedrich Taenzler, Richard Antley, Ken Moushegian, Kenneth M. Butler, Doug Mirizzi
2012 J jnl
Low Cost EVM Testing of Wireless RF SoC Front-Ends Using Multitones.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
Vishwanath Natarajan, Hyun Woo Choi, Aritra Banerjee, Shreyas Sen, Abhijit Chatterjee, Ganesh Srinivasan, Friedrich Taenzler, Soumendu Bhattacharya
2011 J jnl
Embedded RF Circuit Diagnostic Technique with Multi-Tone Dither Scheme.
J. Electron. Test.
Sukeshwar Kannan, Bruce C. Kim, Ganesh Srinivasan, Friedrich Taenzler, Richard Antley, Craig Force
2010 J jnl
Analog Signature- Driven Postmanufacture Multidimensional Tuning of RF Systems.
IEEE Des. Test Comput.
Vishwanath Natarajan, Shreyas Sen, Aritra Banerjee, Abhijit Chatterjee, Ganesh Srinivasan, Friedrich Taenzler
2010 Misc conf
Low cost test and tuning of RF circuits and systems.
VTS
Abhijit Chatterjee, Friedrich Taenzler
2008 J jnl
Loopback DFT for Low-Cost Test of Single-VCO-Based Wireless Transceivers.
IEEE Des. Test Comput.
Ganesh Srinivasan, Friedrich Taenzler, Abhijit Chatterjee
2008 A conf
Octal-Site EVM Tests for WLAN Transceivers on "Very" Low-Cost ATE Platforms.
ITC
Ganesh Srinivasan, Hui-Chuan Chao, Friedrich Taenzler
2008 A conf
Optimized EVM Testing for IEEE 802.11a/n RF ICs.
ITC
Erkan Acar, Sule Ozev, Ganesh Srinivasan, Friedrich Taenzler
2007 — conf
Production Test of High Volume Commercial RFIC.
ATS
Friedrich Taenzler
2006 Misc conf
Alternate Loop-Back Diagnostic Tests for Wafer-Level Diagnosis of Modern Wireless Transceivers using Spectral Signatures.
VTS
Ganesh Srinivasan, Abhijit Chatterjee, Friedrich Taenzler
2006 A conf
Online RF checkers for diagnosing multi-gigahertz automatic test boards on low cost ATE platforms.
DATE
Ganesh Srinivasan, Friedrich Taenzler, Abhijit Chatterjee
1993 Misc conf
Contactless characterization of microwave integrated circuits by device internal indirect electro-optic probing.
VTS
Friedrich Taenzler, Thomas Novak, Erich Kubalek