Friedrich Hapke

35 papers A* 1A 13B 4C 5Misc 1Journal 6Unranked 5

Year	Rank	Type	Title / Venue / Authors
2021	J	`jnl`	Defect-Oriented Test: Effectiveness in High Volume Manufacturing. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. Friedrich Hapke, Will Howell, Peter C. Maxwell, Edward Brazil, Srikanth Venkataraman, Rudrajit Dutta, Andreas Glowatz, Anja Fast, Janusz Rajski
2018	A	`conf`	DPPM Reduction Methods and New Defect Oriented Test Methods Applied to Advanced FinFET Technologies. ITC Will Howell, Friedrich Hapke, Edward Brazil, Srikanth Venkataraman, R. Datta, Andreas Glowatz, Wilfried Redemund, J. Schmerberg, Anja Fast, Janusz Rajski
2018	A	`conf`	Total Critical Area Based Testing. ITC Friedrich Hapke, Peter C. Maxwell
2017	B	`conf`	Bridge over troubled waters: Critical area based pattern generation. ETS Peter C. Maxwell, Friedrich Hapke, Maija Ryynaenen, Peter Weseloh
2016	B	`conf`	Cell-aware diagnosis: Defective inmates exposed in their cells. ETS Peter C. Maxwell, Friedrich Hapke, Huaxing Tang
2016	J	`jnl`	On New Test Points for Compact Cell-Aware Tests. IEEE Des. Test Cesar Acero, Derek Feltham, Marek Patyra, Friedrich Hapke, Elham K. Moghaddam, Nilanjan Mukherjee, Vidya Neerkundar, Janusz Rajski, Jerzy Tyszer, Justyna Zawada
2015	—	`conf`	Diagnosing timing related cell internal defects for FinFET technology. VLSI-DAT Huaxing Tang, Ting-Pu Tai, Wu-Tung Cheng, Brady Benware, Friedrich Hapke
2015	A	`conf`	Embedded deterministic test points for compact cell-aware tests. ITC Cesar Acero, Derek Feltham, Friedrich Hapke, Elham K. Moghaddam, Nilanjan Mukherjee, Vidya Neerkundar, Marek Patyra, Janusz Rajski, Jerzy Tyszer, Justyna Zawada
2014	J	`jnl`	Cell-Aware Test. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. Friedrich Hapke, Wilfried Redemund, Andreas Glowatz, Janusz Rajski, Michael Reese, Marek Hustava, Martin Keim, Juergen Schloeffel, Anja Fast
2014	B	`conf`	Cell-aware experiences in a high-quality automotive test suite. ETS Friedrich Hapke, Ralf Arnold, Matthias Beck, M. Baby, S. Straehle, J. F. Goncalves, A. Panait, R. Behr, Gwenolé Maugard, A. Prashanthi, Juergen Schloeffel, Wilfried Redemund, Andreas Glowatz, Anja Fast, Janusz Rajski
2014	—	`conf`	Diagnosing Cell Internal Defects Using Analog Simulation-Based Fault Models. ATS Huaxing Tang, Brady Benware, Michael Reese, Joseph Caroselli, Thomas Herrmann, Friedrich Hapke, Robert Tao, Wu-Tung Cheng, Manish Sharma
2013	C	`conf`	Fault collapsing of multi-conditional faults. DDECS Rene Krenz-Baath, Andreas Glowatz, Friedrich Hapke
2013	C	`conf`	Industrial Application of IEEE P1687 for an Automotive Product. DSD Martin Keim, Tom Waayers, Richard Morren, Friedrich Hapke, Rene Krenz-Baath
2012	C	`conf`	A new SAT-based ATPG for generating highly compacted test sets. DDECS Stephan Eggersglüß, Rene Krenz-Baath, Andreas Glowatz, Friedrich Hapke, Rolf Drechsler
2012	A	`conf`	Cell-aware Production test results from a 32-nm notebook processor. ITC Friedrich Hapke, Michael Reese, Jason Rivers, A. Over, V. Ravikumar, Wilfried Redemund, Andreas Glowatz, Jürgen Schlöffel, Janusz Rajski
2012	A	`conf`	EDA solutions to new-defect detection in advanced process technologies. DATE Erik Jan Marinissen, Gilbert Vandling, Sandeep Kumar Goel, Friedrich Hapke, Jason Rivers, Nikolaus Mittermaier, Swapnil Bahl
2012	B	`conf`	Introduction to the defect-oriented cell-aware test methodology for significant reduction of DPPM rates. ETS Friedrich Hapke, Jürgen Schlöffel
2012	C	`conf`	Robust Evaluation of Weighted Random Logic BIST Structures in Industrial Designs. DSD Rene Krenz-Baath, Friedrich Hapke, Rolf Hinze, Reinhard Meier, Maija Ryynaenen, Andreas Glowatz
2011	A	`conf`	Cell-aware analysis for small-delay effects and production test results from different fault models. ITC Friedrich Hapke, Jürgen Schlöffel, Wilfried Redemund, Andreas Glowatz, Janusz Rajski, Michael Reese, J. Rearick, Jason Rivers
2010	A	`conf`	Defect-oriented cell-internal testing. ITC Friedrich Hapke, Wilfried Redemund, Jürgen Schlöffel, Rene Krenz-Baath, Andreas Glowatz, Michael Wittke, Hamidreza Hashempour, Stefan Eichenberger
2010	J	`jnl`	MONSOON: SAT-Based ATPG for Path Delay Faults Using Multiple-Valued Logics. J. Electron. Test. Stephan Eggersglüß, Görschwin Fey, Andreas Glowatz, Friedrich Hapke, Jürgen Schlöffel, Rolf Drechsler
2009	A	`conf`	Defect-oriented cell-aware ATPG and fault simulation for industrial cell libraries and designs. ITC Friedrich Hapke, Rene Krenz-Baath, Andreas Glowatz, Jürgen Schlöffel, Hamidreza Hashempour, Stefan Eichenberger, Camelia Hora, Dan Adolfsson
2009	Misc	`conf`	Restrict Encoding for Mixed-Mode BIST. VTS Abdul Wahid Hakmi, Stefan Holst, Hans-Joachim Wunderlich, Jürgen Schlöffel, Friedrich Hapke, Andreas Glowatz
2009	—	`conf`	Using a two-dimensional fault list for compact Automatic Test Pattern Generation. LATW Marc Messing, Andreas Glowatz, Friedrich Hapke, Rolf Drechsler
2008	J	`jnl`	On Acceleration of SAT-Based ATPG for Industrial Designs. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. Rolf Drechsler, Stephan Eggersglüß, Görschwin Fey, Andreas Glowatz, Friedrich Hapke, Jürgen Schlöffel, Daniel Tille
2007	C	`conf`	Combining Multi-Valued Logics in SAT-based ATPG for Path Delay Faults. MEMOCODE Stephan Eggersglüß, Görschwin Fey, Rolf Drechsler, Andreas Glowatz, Friedrich Hapke, Jürgen Schlöffel
2007	A	`conf`	Embedded multi-detect ATPG and Its Effect on the Detection of Unmodeled Defects. ITC Jeroen Geuzebroek, Erik Jan Marinissen, Ananta K. Majhi, Andreas Glowatz, Friedrich Hapke
2007	—	`conf`	Experimental Studies on SAT-Based ATPG for Gate Delay Faults. ISMVL Stephan Eggersglüß, Daniel Tille, Görschwin Fey, Rolf Drechsler, Andreas Glowatz, Friedrich Hapke, Jürgen Schlöffel
2007	A	`conf`	Programmable deterministic Built-In Self-Test. ITC Abdul Wahid Hakmi, Hans-Joachim Wunderlich, Christian G. Zoellin, Andreas Glowatz, Friedrich Hapke, Jürgen Schlöffel, Laurent Souef
2006	A*	`conf`	Fault detection and diagnosis with parity trees for space compaction of test responses. DAC Harald P. E. Vranken, Sandeep Kumar Goel, Andreas Glowatz, Jürgen Schlöffel, Friedrich Hapke
2006	J	`jnl`	X-masking during logic BIST and its impact on defect coverage. IEEE Trans. Very Large Scale Integr. Syst. Yuyi Tang, Hans-Joachim Wunderlich, Piet Engelke, Ilia Polian, Bernd Becker, Jürgen Schlöffel, Friedrich Hapke, Michael Wittke
2005	—	`conf`	PASSAT: Efficient SAT-Based Test Pattern Generation for Industrial Circuits. ISVLSI Junhao Shi, Görschwin Fey, Rolf Drechsler, Andreas Glowatz, Friedrich Hapke, Jürgen Schlöffel
2004	A	`conf`	Efficient Pattern Mapping for Deterministic Logic BIST. ITC Valentin Gherman, Hans-Joachim Wunderlich, Harald P. E. Vranken, Friedrich Hapke, Michael Wittke, Michael Garbers
2004	A	`conf`	X-Masking During Logic BIST and Its Impact on Defect Coverage. ITC Yuyi Tang, Hans-Joachim Wunderlich, Harald P. E. Vranken, Friedrich Hapke, Michael Wittke, Piet Engelke, Ilia Polian, Bernd Becker
2003	A	`conf`	ATPG Padding And ATE Vector Repeat Per Port For Reducing Test Data Volume. ITC Harald P. E. Vranken, Friedrich Hapke, Soenke Rogge, Domenico Chindamo, Erik H. Volkerink