Frederic Wrobel

22 papers A 1B 1C 6Journal 7Unranked 7

Year	Rank	Type	Title / Venue / Authors
2025	A	`conf`	Multi-Partner Project: Twinning for Excellence in Reliable Electronics (TWIN-RELECT). DATE Marko S. Andjelkovic, Fabian Vargas, Milos Krstic, Luigi Dilillo, Alain Michez, Frederic Wrobel, Davide Bertozzi, Mikel Luján, Christos Georgakidis, Nikolaos Chatzivangelis, Katerina Tsilingiri, Nikolaos Zazatis, Georgios Ioannis Paliaroutis, Pelopidas Tsoumanis, Christos P. Sotiriou
2022	B	`conf`	Impact of Atmospheric and Space Radiation on Sensitive Electronic Devices. ETS Lucas Matana Luza, Frederic Wrobel, Luis Entrena, Luigi Dilillo
2020	—	`conf`	Development and evaluation of a flexible instrumentation layer for system-level testing of radiation effects. LATS Israel C. Lopes, Vincent Pouget, Frederic Wrobel, Frédéric Saigné, Antoine D. Touboul, Ketil Røed
2020	—	`conf`	Effect of Temperature on Single Event Latchup Sensitivity. DTIS S. Guagliardo, Frederic Wrobel, Ygor Q. Aguiar, Jean-Luc Autran, Paul Leroux, Frédéric Saigné, Vincent Pouget, Antoine D. Touboul
2020	—	`conf`	Evaluation and Analysis of Technologies for Robotic Platforms for the Nuclear Decommissioning. DTIS Georgios Tsiligiannis, Antoine D. Touboul, Gaëtan Bricas, Tadec Maraine, Jerome Boch, Frederic Wrobel, Alain Michez, Frédéric Saigné, Alain Godot, Asenath Etile, Thibaud Durand, Romain Sueur, Didier Farigoule, Philippe Girones
2018	J	`jnl`	Analysis of the charge sharing effect in the SET sensitivity of bulk 45 nm standard cell layouts under heavy ions. Microelectron. Reliab. Ygor Q. Aguiar, Frederic Wrobel, Jean-Luc Autran, Paul Leroux, Frédéric Saigné, Antoine D. Touboul, Vincent Pouget
2018	J	`jnl`	TCAD simulation of radiation-induced leakage current in 1T1C SDRAM. Microelectron. Reliab. Hoang T. Nguyen, Axel Rodriguez, Frederic Wrobel, Alain Michez, Francoise Bezerra, Nathalie Chatry, Benjamin Vandevelde
2017	J	`jnl`	A calculation method to estimate single event upset cross section. Microelectron. Reliab. Frederic Wrobel, Antoine D. Touboul, Vincent Pouget, Luigi Dilillo, Jerome Boch, Frédéric Saigné
2017	J	`jnl`	Structural pattern extraction from asynchronous two-photon laser fault injection using spectral analysis. Microelectron. Reliab. Vincent Pouget, S. Jonathas, R. Job, J.-R. Vaillé, Frederic Wrobel, Frédéric Saigné
2015	—	`conf`	Real-time SRAM based particle detector. IWASI Luigi Dilillo, Alexandre Bosser, Viyas Gupta, Frederic Wrobel, Frédéric Saigné
2013	—	`conf`	Characterization of an SRAM based particle detector for mixed-field radiation environments. IWASI Georgios Tsiligiannis, Luigi Dilillo, Alberto Bosio, Patrick Girard, Serge Pravossoudovitch, Aida Todri-Sanial, Arnaud Virazel, Julien Mekki, Markus Brugger, J.-R. Vaillé, Frederic Wrobel, Frédéric Saigné
2013	—	`conf`	On the correlation between Static Noise Margin and Soft Error Rate evaluated for a 40nm SRAM cell. DFTS Elena I. Vatajelu, Georgios Tsiligiannis, Luigi Dilillo, Alberto Bosio, Patrick Girard, Serge Pravossoudovitch, Aida Todri, Arnaud Virazel, Frederic Wrobel, Frédéric Saigné
2013	C	`conf`	SRAM soft error rate evaluation under atmospheric neutron radiation and PVT variations. IOLTS Georgios Tsiligiannis, Elena I. Vatajelu, Luigi Dilillo, Alberto Bosio, Patrick Girard, Serge Pravossoudovitch, Aida Todri, Arnaud Virazel, Frederic Wrobel, Frédéric Saigné
2012	C	`conf`	Evaluation of test algorithms stress effect on SRAMs under neutron radiation. IOLTS Georgios Tsiligiannis, Luigi Dilillo, Alberto Bosio, Patrick Girard, Aida Todri, Arnaud Virazel, Antoine D. Touboul, Frederic Wrobel, Frédéric Saigné
2012	J	`jnl`	On the reliability assessment of trench fieldstop IGBT under atmospheric neutron spectrum. Microelectron. Reliab. Antoine D. Touboul, L. Foro, Frederic Wrobel, Frédéric Saigné
2011	J	`jnl`	MC-ORACLE: A tool for predicting Soft Error Rate. Comput. Phys. Commun. Frederic Wrobel, Frédéric Saigné
2011	—	`conf`	Neutron detection in atmospheric environment through static and dynamic SRAM-based test bench. LATW Luigi Dilillo, Paolo Rech, Jean-Marc Gallière, Patrick Girard, Frederic Wrobel, Frédéric Saigné
2008	J	`jnl`	Detailed history of recoiling ions induced by nucleons. Comput. Phys. Commun. Frederic Wrobel
2007	C	`conf`	Multiple Event Transient Induced by Nuclear Reactions in CMOS Logic Cells. IOLTS Claudia Rusu, Antonin Bougerol, Lorena Anghel, Cécile Weulersse, Nadine Buard, S. Benhammadi, Nicolas Renaud, Guillaume Hubert, Frederic Wrobel, Thierry Carrière, Rémi Gaillard
2006	C	`conf`	Prediction of Transient Induced by Neutron/Proton in CMOS Combinational Logic Cells. IOLTS Guillaume Hubert, Antonin Bougerol, Florent Miller, Nadine Buard, Lorena Anghel, Thierry Carrière, Frederic Wrobel, Rémi Gaillard
2005	C	`conf`	A Review of DASIE Code Family: Contribution to SEU/MBU Understanding. IOLTS Guillaume Hubert, Nadine Buard, Cécile Weulersse, Thierry Carrière, Marie-Catherine Palau, Jean-Marie Palau, Damien Lambert, Jacques Baggio, Frederic Wrobel, Frédéric Saigné, Rémi Gaillard
2005	C	`conf`	Use of Nuclear Codes for Neutron-Induced Nuclear Reactions in Microelectronics. IOLTS Frederic Wrobel