| Year | Rank | Type | Title / Venue / Authors |
|---|---|---|---|
| 2025 | J | jnl |
J. Electron. Test.
|
| 2025 | J | jnl |
IEEE Trans. Very Large Scale Integr. Syst.
|
| 2023 | — | conf |
LATS
|
| 2023 | J | jnl |
ACM J. Emerg. Technol. Comput. Syst.
|
| 2019 | — | conf |
LATS
|
| 2019 | B | conf |
ETS
|
| 2019 | J | jnl |
IEEE Trans. Very Large Scale Integr. Syst.
|
| 2018 | — | conf |
VLSI-SoC (Selected Papers)
|
| 2018 | J | jnl |
J. Electron. Test.
|
| 2018 | C | conf |
VLSI-SoC
|
| 2017 | — | conf |
LATS
|
| 2016 | — | conf |
LATS
|
| 2016 | J | jnl |
J. Low Power Electron.
|