Freddy Forero

13 papers B 1C 1Journal 6Unranked 5
YearRankTypeTitle / Venue / Authors
2025 J jnl
A Novel Defect Model Induced by a Single Dust Particle Contamination in the FinFET Gate Fingers.
J. Electron. Test.
Gustavo Aguirre, Víctor H. Champac, Freddy Forero, Michel Renovell, Leonardo Miceli
2025 J jnl
Cost-Effective Analytical Models of Resistive Opens Defects in FinFET Technology.
IEEE Trans. Very Large Scale Integr. Syst.
Gustavo Aguirre, Freddy Forero, Víctor H. Champac, Michel Renovell, Florence Azaïs, Mariane Comte, Jean-Marc Gallière
2023 — conf
A New Defect Model due to a Dust Particle Affecting the Fingers of FinFET Logic Gates.
LATS
Víctor H. Champac, Freddy Forero, Michel Renovell, Leonardo Miceli
2023 J jnl
B-open Defect: A Novel Defect Model in FinFET Technology.
ACM J. Emerg. Technol. Comput. Syst.
Freddy Forero, Víctor H. Champac, Michel Renovell
2019 — conf
A Semi-analytical Model for Interconnect Open Defects in FinFET Logic Cells.
LATS
Freddy Forero, Jean-Marc Gallière, Michel Renovell, Víctor H. Champac
2019 B conf
B-open: A New Defect in Nanometer Technologies due to SADP Process.
ETS
Freddy Forero, Michel Renovell, Víctor H. Champac
2019 J jnl
Modeling and Detectability of Full Open Gate Defects in FinFET Technology.
IEEE Trans. Very Large Scale Integr. Syst.
Freddy Forero, Hector Villacorta, Michel Renovell, Víctor H. Champac
2018 — conf
Analysis of Bridge Defects in STT-MRAM Cells Under Process Variations and a Robust DFT Technique for Their Detection.
VLSI-SoC (Selected Papers)
Víctor H. Champac, Andres F. Gomez, Freddy Forero, Kaushik Roy
2018 J jnl
Detectability Challenges of Bridge Defects in FinFET Based Logic Cells.
J. Electron. Test.
Freddy Forero, Jean-Marc Gallière, Michel Renovell, Víctor H. Champac
2018 C conf
Robust Detection of Bridge Defects in STT-MRAM Cells Under Process Variations.
VLSI-SoC
Andres F. Gomez, Freddy Forero, Kaushik Roy, Víctor H. Champac
2017 — conf
Analysis of short defects in FinFET based logic cells.
LATS
Freddy Forero, Jean-Marc Gallière, Michel Renovell, Víctor H. Champac
2016 — conf
A methodology for NBTI circuit reliability at reduced power consumption using dual supply voltage.
LATS
Freddy Forero, Andres F. Gomez, Víctor H. Champac
2016 J jnl
Improvement of Negative Bias Temperature Instability Circuit Reliability and Power Consumption Using Dual Supply Voltage.
J. Low Power Electron.
Freddy Forero, Andres F. Gomez, Víctor H. Champac