Fred van Keulen

13 papers C 1Journal 11Unranked 1
YearRankTypeTitle / Venue / Authors
2024 J jnl
Regularization in Space-Time Topology Optimization for Multi-Axis Additive Manufacturing.
CoRR
Weiming Wang, Kai Wu, Fred van Keulen, Jun Wu
2023 J jnl
Classification and analysis of common simplifications in part-scale thermal modelling of metal additive manufacturing processes.
Adv. Model. Simul. Eng. Sci.
Rajit Ranjan, Matthijs Langelaar, Fred van Keulen, Can Ayas
2022 J jnl
Fabrication Sequence Optimization for Minimizing Distortion in Multi-Axis Additive Manufacturing.
CoRR
Weiming Wang, Fred van Keulen, Jun Wu
2021 J jnl
A simple and versatile topology optimization formulation for flexure synthesis.
CoRR
Stijn Koppen, Matthijs Langelaar, Fred van Keulen
2021 J jnl
Efficient multi-partition topology optimization.
CoRR
Stijn Koppen, Matthijs Langelaar, Fred van Keulen
2020 J jnl
An Interface-enriched Generalized Finite Element Method for Levelset-based Topology Optimization.
CoRR
Sanne J. van den Boom, Jian Zhang, Fred van Keulen, Alejandro M. Aragón
2018 J jnl
Design and analysis adaptivity in multi-resolution topology optimization.
CoRR
Deepak K. Gupta, Fred van Keulen, Matthijs Langelaar
2014 J jnl
Efficient Kriging-based robust optimization of unconstrained problems.
J. Comput. Sci.
Samee Ur Rehman, Matthijs Langelaar, Fred van Keulen
2013 C conf
Efficient Kriging-based Robust Optimization of Unconstrained Problems.
SIMULTECH
Samee Ur Rehman, Matthijs Langelaar, Fred van Keulen
2009 J jnl
Effect of rotator cuff dysfunction on the initial mechanical stability of cementless glenoid components.
Medical Biol. Eng. Comput.
Daniel R. Suárez, Edward R. Valstar, Jacqueline C. van der Linden, Fred van Keulen, Piet M. Rozing
2009 — conf
Surface contamination-induced resonance frequency shift of cantilevers.
NEMS
Hamed Sadeghian, Chung Kai Yang, Khashayar Babaei Gavan, Hans Goosen, Emile W. J. M. van der Drift, Here van der Zant, Paddy J. French, Andre Bossche, Fred van Keulen
2008 J jnl
Failure analysis of a thin-film nitride MEMS package.
Microelectron. Reliab.
Q. Li, J. F. L. Goosen, J. T. M. van Beek, Fred van Keulen, K. L. Phan, G. Q. Zhang
2006 J jnl
Delamination analysis of Cu/low-k technology subjected to chemical-mechanical polishing process conditions.
Microelectron. Reliab.
Cadmus A. Yuan, Willem D. van Driel, Richard B. R. van Silfhout, Olaf van der Sluis, Roy A. B. Engelen, Leo J. Ernst, Fred van Keulen, G. Q. Zhang