Fred J. Meyer - RankMe

56 papers A 1C 1Misc 3Journal 27Unranked 24

Year	Rank	Type	Title / Venue / Authors
2006	J	`jnl`	Evaluating the Yield of Repairable SRAMs for ATE. IEEE Trans. Instrum. Meas. Marco Ottavi, Luca Schiano, Xiaopeng Wang, Yong-Bin Kim, Fred J. Meyer, Fabrizio Lombardi
2006	J	`jnl`	Measuring the timing jitter of ATE in the frequency domain. IEEE Trans. Instrum. Meas. Luca Schiano, Mariam Momenzadeh, Fengming Zhang, Young-Jun Lee, Thomas Kane, Solomon Max, Philip Perkins, Yong-Bin Kim, Fabrizio Lombardi, Fred J. Meyer
2005	J	`jnl`	Analysis and evaluation of multisite testing for VLSI. IEEE Trans. Instrum. Meas. Hamidreza Hashempour, Fred J. Meyer, Fabrizio Lombardi
2005	—	`conf`	QCA-Based Majority Gate Design under Radius of Effect-Induced Faults. DFT Zachary D. Patitz, Nohpill Park, Minsu Choi, Fred J. Meyer
2004	J	`jnl`	Analysis and measurement of fault coverage in a combined ATE and BIST environment. IEEE Trans. Instrum. Meas. Hamidreza Hashempour, Fred J. Meyer, Fabrizio Lombardi
2004	J	`jnl`	Guest editorial. J. Syst. Archit. Cristiana Bolchini, Fred J. Meyer
2004	—	`conf`	On The Yield of Compiler-Based eSRAMs. DFT Xiaopeng Wang, Marco Ottavi, Fred J. Meyer, Fabrizio Lombardi
2004	—	`conf`	Reliability Modeling and Assurance of Clockless Wave Pipeline. DFT Tao Feng, Nohpill Park, Yong-Bin Kim, Fabrizio Lombardi, Fred J. Meyer
2004	J	`jnl`	Sequential diagnosis of processor array systems. IEEE Trans. Reliab. Jun Zhao, Fred J. Meyer, Nohpill Park, Fabrizio Lombardi
2004	—	`conf`	Simulation of reconfigurable memory core yield. ACM Great Lakes Symposium on VLSI Marco Ottavi, Xiaopeng Wang, Fred J. Meyer, Fabrizio Lombardi
2003	—	`conf`	A Digital and Wide Power Bandwidth H-Field Generator for Automatic Test Equipment. DFT Fengming Zhang, Young-Jun Lee, Thomas Kane, Luca Schiano, Mariam Momenzadeh, Yong-Bin Kim, Fred J. Meyer, Fabrizio Lombardi, Solomon Max, Phil Perkinson
2003	J	`jnl`	Adaptive Algorithms for Maximal Diagnosis of Wiring Interconnects. IEEE Trans. Computers Wenyi Feng, Fred J. Meyer, Fabrizio Lombardi
2003	J	`jnl`	Analysis and measurement of timing jitter induced by radiated EMI noise in automatic test equipment. IEEE Trans. Instrum. Meas. Young-Jun Lee, Thomas Kane, Jong-Jin Lim, Young Jun Schiano, Yong-Bin Kim, Fred J. Meyer, Fabrizio Lombardi, Solomon Max
2003	A	`conf`	Hybrid Multisite Testing at Manufacturing. ITC Hamidreza Hashempour, Fred J. Meyer, Fabrizio Lombardi, Farzin Karimi
2003	J	`jnl`	Maximal diagnosis of interconnects of random access memories. IEEE Trans. Reliab. Jun Zhao, Fred J. Meyer, Fabrizio Lombardi, Nohpill Park
2003	J	`jnl`	Predicting Defect-Tolerant Yield in the Embedded Core Context. IEEE Trans. Computers Fred J. Meyer, Nohpill Park
2002	J	`jnl`	Analyzing and Diagnosing Interconnect Faults in Bus-Structured Systems. IEEE Des. Test Comput. Jun Zhao, Fred J. Meyer, Fabrizio Lombardi
2002	J	`jnl`	Quality-effective repair of multichip module systems. J. Syst. Archit. Nohpill Park, Fred J. Meyer, Fabrizio Lombardi
2002	—	`conf`	Random Testing of Multi-Port Static Random Access Memories. MTDT Farzin Karimi, Fred J. Meyer, Fabrizio Lombardi
2002	—	`conf`	Test Time Reduction in a Manufacturing Environment by Combining BIST and ATE. DFT Hamidreza Hashempour, Fred J. Meyer, Fabrizio Lombardi
2001	C	`conf`	Connectivity-Based Multichip Module Repair. PRDC Minsu Choi, Nohpill Park, Fred J. Meyer, Fabrizio Lombardi
2001	—	`conf`	Novel Approaches for Fault Detection in Two-Dimensional Combinational Arrays. DFT Xiao-Tao Chen, Wei-Kang Huang, Nohpill Park, Fred J. Meyer, Fabrizio Lombardi
2000	J	`jnl`	An Approach for Detecting Multiple Faulty FPGA Logic Blocks. IEEE Trans. Computers Wei-Kang Huang, Fred J. Meyer, Fabrizio Lombardi
2000	—	`conf`	Complexity Bounds for Lookup Table Implementation of Factored Forms in FPGA Technology Mapping. IPDPS Workshops Wenyi Feng, Fred J. Meyer, Fabrizio Lombardi
2000	—	`conf`	Diagnosing the Interconnect of Bus-Connected Multi-RAM Systems under Restricted and General Fault Models. MTDT Jun Zhao, Fred J. Meyer, Fabrizio Lombardi
2000	—	`conf`	Quality-Effective Repair of Multichip Module Systems. DFT Nohpill Park, Fred J. Meyer, Fabrizio Lombardi
2000	J	`jnl`	Testing and testable designs for one-time programmable FPGAs. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. Tong Liu, Wei-Kang Huang, Fred J. Meyer, Fabrizio Lombardi
1999	—	`conf`	A BIST TPG Approach for Interconnect Testing With the IEEE 1149.1 STD. Asian Test Symposium Wenyi Feng, Wei-Kang Huang, Fred J. Meyer, Fabrizio Lombardi
1999	J	`jnl`	Adaptive Fault Detection and Diagnosis of RAM Interconnects. J. Electron. Test. Jun Zhao, Fred J. Meyer, Fabrizio Lombardi
1999	J	`jnl`	Design Verification of FPGA Implementations. IEEE Des. Test Comput. Xiao-Tao Chen, Wei-Kang Huang, Nohpill Park, Fred J. Meyer, Fabrizio Lombardi
1999	—	`conf`	Good Processor Identification in Two-Dimensional Grids. DFT Fred J. Meyer, Fabrizio Lombardi, Jun Zhao
1999	J	`jnl`	Guest Editors' Introduction: DRAM Architecture and Testing. IEEE Des. Test Comput. Bruce F. Cockburn, Fabrizio Lombardi, Fred J. Meyer
1999	—	`conf`	Interconnect Diagnosis of Bus-Connected Multi-RAM Systems. MTDT Jun Zhao, Fred J. Meyer, Fabrizio Lombardi
1999	Misc	`conf`	Maximal Diagnosis of Interconnects of Random Access Memories. VTS Jun Zhao, Fred J. Meyer, Fabrizio Lombardi
1999	—	`conf`	Novel Control Pattern Generators for Interconnect Testing with Boundary Scan. DFT Wenyi Feng, Fred J. Meyer, Fabrizio Lombardi
1999	—	`conf`	Reconfiguration of One-Time Programmable FPGAs with Faulty Logic Resources. DFT Wenyi Feng, Xiao-Tao Chen, Fred J. Meyer, Fabrizio Lombardi
1999	J	`jnl`	Reconfiguring one-time programmable FPGAs. IEEE Micro Xiao-Tao Chen, Wenyi Feng, Jun Zhao, Fred J. Meyer, Fabrizio Lombardi
1999	J	`jnl`	Test generation and scheduling for layout-based detection of bridge faults in interconnects. IEEE Trans. Very Large Scale Integr. Syst. Tong Liu, Xiao-Tao Chen, Fred J. Meyer, Fabrizio Lombardi
1999	—	`conf`	Two-Step Algorithms for Maximal Diagnosis of Wiring Interconnects. FTCS Wenyi Feng, Fred J. Meyer, Fabrizio Lombardi
1998	—	`conf`	A New Method for Testing EEPLA's. DFT Avinash Munshi, Fred J. Meyer, Fabrizio Lombardi
1998	Misc	`conf`	Fault Detection and Diagnosis of Interconnects of Random Access Memories. VTS Jun Zhao, Fred J. Meyer, Fabrizio Lombardi
1998	—	`conf`	Fault Detection in a Tristate System Environment. Asian Test Symposium Wenyi Feng, Wei-Kang Huang, Fred J. Meyer, Fabrizio Lombardi
1998	—	`conf`	On the Complexity of Sequential Testing in Configurable FPGAs. DFT Wenyi Feng, Fred J. Meyer, Wei-Kang Huang, Fabrizio Lombardi
1998	J	`jnl`	Structural diagnosis of interconnects by coloring. ACM Trans. Design Autom. Electr. Syst. Xiao-Tao Chen, Fred J. Meyer, Fabrizio Lombardi
1998	J	`jnl`	Testing configurable LUT-based FPGA's. IEEE Trans. Very Large Scale Integr. Syst. Wei-Kang Huang, Fred J. Meyer, Xiao-Tao Chen, Fabrizio Lombardi
1997	—	`conf`	A XOR-Tree Based Technique for Constant Testability of Configurable FPGAs. Asian Test Symposium Wei-Kang Huang, M. Y. Zhang, Fred J. Meyer, Fabrizio Lombardi
1997	—	`conf`	Multiple fault detection in logic resources of FPGAs. DFT Wei Liang Huang, Fred J. Meyer, Fabrizio Lombardi
1997	Misc	`conf`	On the Fault Coverage of Interconnect Diagnosis. VTS Xiao-Tao Chen, Fred J. Meyer, Fabrizio Lombardi
1997	—	`conf`	Testing of programmable logic devices (PLD) with faulty resources. DFT David Ashen, Fred J. Meyer, Nohpill Park, Fabrizio Lombardi
1997	—	`conf`	Using Virtual Links for Reliable Information Retrieval Across Point-to-Point Networks. FTCS Fred J. Meyer, Xiao-Tao Chen, Wei-Kang Huang, Fabrizio Lombardi
1993	J	`jnl`	Communication structures in fault-tolerant distributed systems. Networks Dhiraj K. Pradhan, Fred J. Meyer
1993	J	`jnl`	Yield optimization of modular and redundant multimegabit RAMs: a study of effectiveness of coding versus static redundancy using the center-satellite model. IEEE Trans. Very Large Scale Integr. Syst. D. D. Sharma, Fred J. Meyer, Dhiraj K. Pradhan
1991	J	`jnl`	Consensus With Dual Failure Modes. IEEE Trans. Parallel Distributed Syst. Fred J. Meyer, Dhiraj K. Pradhan
1989	J	`jnl`	Dynamic Testing Strategy for Distributed Systems. IEEE Trans. Computers Fred J. Meyer, Dhiraj K. Pradhan
1989	J	`jnl`	Modeling Defect Spatial Distribution. IEEE Trans. Computers Fred J. Meyer, Dhiraj K. Pradhan
1988	J	`jnl`	Flip-Trees: Fault-Tolerant Graphs with Wide Containers. IEEE Trans. Computers Fred J. Meyer, Dhiraj K. Pradhan