| Year | Rank | Type | Title / Venue / Authors |
|---|---|---|---|
| 2018 | — | conf |
ICIT
|
| 2015 | J | jnl |
Fast power cycling protocols implemented in an automated test bench dedicated to IGBT module ageing.
Microelectron. Reliab.
|
| 2013 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2012 | C | conf |
IECON
|
| 2011 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2007 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2006 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2005 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2002 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2002 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 1997 | J | jnl |
IEEE Trans. Ind. Electron.
|