Frans P. M. Beenker

11 papers A* 1A 6Journal 4
YearRankTypeTitle / Venue / Authors
1993 A conf
Minimizing Test Time by Exploiting Parallelism in Macro Test.
ITC
Hans Bouwmeester, Steven Oostdijk, Frank Bouwman, Rudi Stans, Loek Thijssen, Frans P. M. Beenker
1992 A conf
Macro Testability: The Results of Production Device Applications.
ITC
Frank Bouwman, Steven Oostdijk, Rudi Stans, Ben Bennetts, Frans P. M. Beenker
1990 J jnl
A realistic fault model and test algorithms for static random access memories.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
Rob Dekker, Frans P. M. Beenker, Loek Thijssen
1990 J jnl
Implementing Macro Test in Silicon Compiler Design.
IEEE Des. Test Comput.
Frans P. M. Beenker, Barry J. Dekker, Richard Stans, Max van der Star
1989 A conf
A Testability Strategy for Silicon Compilers.
ITC
Frans P. M. Beenker, Rob Dekker, Rudi Stans, Max van der Star
1989 J jnl
Realistic built-in self-test for static RAMs.
IEEE Des. Test
Rob Dekker, Frans P. M. Beenker, Loek Thijssen
1988 A conf
A Realistic Self-Test Machine for Static Random Access Memories.
ITC
Frans P. M. Beenker, Rob Dekker, Loek Thijssen
1988 A conf
Fault Modeling and Test Algorithm Development.
ITC
Frans P. M. Beenker, Rob Dekker, Loek Thijssen
1986 A* conf
Design-for-testability of PLA's using statistical cooling.
DAC
Michiel M. Ligthart, Emile H. L. Aarts, Frans P. M. Beenker
1986 J jnl
Macro Testing: Unifying IC and Board Test.
IEEE Des. Test
Frans P. M. Beenker, Karel J. E. van Eerdewijk, Robert B. W. Gerritsen, Frank N. Peacock, Max van der Star
1985 A conf
Systematic and Structured Methods for Digital Board Testing.
ITC
Frans P. M. Beenker