Frans G. M. de Jong

15 papers A 12B 1Misc 1Unranked 1

Year	Rank	Type	Title / Venue / Authors
2008	B	`conf`	Analog Test Bus Infrastructure for RF/AMS Modules in Core-Based Design. ETS Vladimir A. Zivkovic, Frank van der Heyden, Guido Gronthoud, Frans G. M. de Jong
2007	A	`conf`	SiP-test: Predicting delivery quality. ITC Alex S. Biewenga, Frans G. M. de Jong
2006	A	`conf`	SiP-TAP: JTAG for SiP. ITC Frans G. M. de Jong, Alex S. Biewenga
2003	A	`conf`	Board Test Coverage: The Value of Prediction and How to Compare Numbers. ITC Wouter Rijckaert, Frans G. M. de Jong
2003	A	`conf`	IEEE P1581: To Live or Let die? ITC Frans G. M. de Jong, Leon van de Logt
2002	Misc	`conf`	Improved Test Monitor Circuit in Power Pin DfT. VTS Rodger Schuttert, Frans G. M. de Jong, Ben Kup
2001	—	`conf`	System-level DFT for consumer products. ETW D. C. L. (Erik) van Geest, Frans G. M. de Jong
2001	A	`conf`	Testing and programming flash memories on assemblies during high volume production. ITC Frans G. M. de Jong, Alex S. Biewenga, D. C. L. (Erik) van Geest, T. F. Waayers
2000	A	`conf`	Power pin testing: making the test coverage complete. ITC Frans G. M. de Jong, Ben Kup, Rodger Schuttert
1999	A	`conf`	SCITT: Back to Basics in Mass Production Testing. ITC Frans G. M. de Jong
1999	A	`conf`	Static component interconnect test technology (SCITT) a new technology for assembly testing. ITC Alex S. Biewenga, Henk D. L. Hollmann, Frans G. M. de Jong, Maurice Lousberg
1999	A	`conf`	Static component interconnection test technology in practice. ITC Frans G. M. de Jong, Rob Raaijmakers
1992	A	`conf`	Memory Interconnection Test at Board Level. ITC Frans G. M. de Jong, Adriaan J. de Lind van Wijngaarden
1991	A	`conf`	Testing the Integrity of the Boundary Scan Test Infrastructure. ITC Frans G. M. de Jong, Frank van der Heyden
1990	A	`conf`	Boundary scan test used at board level: moving towards reality. ITC Frans G. M. de Jong