| Year | Rank | Type | Title / Venue / Authors |
|---|---|---|---|
| 2025 | J | jnl |
IEEE Embed. Syst. Lett.
|
| 2025 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 2025 | J | jnl |
IEEE Trans. Intell. Transp. Syst.
|
| 2025 | Misc | conf |
VLSID
|
| 2024 | J | jnl |
Comparative analysis of 2D mesh topologies with additional communication links for on-chip networks.
Comput. Networks
|
| 2024 | A | conf |
DATE
|
| 2024 | J | jnl |
Microprocess. Microsystems
|
| 2024 | J | jnl |
Reliab. Eng. Syst. Saf.
|
| 2023 | A | conf |
DATE
|
| 2023 | — | conf |
ICSRS
|
| 2023 | — | conf |
ISVLSI
|
| 2023 | — | conf |
COINS
|
| 2023 | J | jnl |
IEEE Access
|
| 2023 | C | conf |
critis
|
| 2023 | — | conf |
ASP-DAC
|
| 2022 | J | jnl |
IEEE Des. Test
|
| 2022 | — | conf |
ICSRS
|
| 2022 | — | conf |
ISCRAM
|
| 2022 | — | conf |
ASP-DAC
|
| 2021 | J | jnl |
IEEE Trans. Circuits Syst. II Express Briefs
|
| 2021 | A | conf |
DATE
|
| 2021 | — | conf |
ASP-DAC
|
| 2021 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 2021 | — | conf |
ISCRAM
|
| 2020 | — | conf |
FPT
|
| 2020 | — | conf |
ISVLSI
|
| 2020 | J | jnl |
Biomed. Signal Process. Control.
|
| 2020 | J | jnl |
ACM J. Emerg. Technol. Comput. Syst.
|
| 2020 | J | jnl |
Microprocess. Microsystems
|
| 2020 | C | conf |
DSD
|
| 2020 | A* | conf |
DAC
|
| 2019 | C | conf |
ISCAS
|
| 2019 | — | conf |
ISVLSI
|
| 2019 | — | conf |
IRPS
|
| 2019 | J | jnl |
ACM J. Emerg. Technol. Comput. Syst.
|
| 2019 | J | jnl |
IET Comput. Digit. Tech.
|
| 2019 | C | conf |
DSD
|
| 2019 | — | conf |
ASP-DAC
|
| 2019 | J | jnl |
CoRR
|
| 2018 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 2018 | A | conf |
DATE
|
| 2018 | J | jnl |
Microelectron. J.
|
| 2018 | J | jnl |
CoRR
|
| 2018 | J | jnl |
IET Comput. Digit. Tech.
|
| 2018 | C | conf |
ISCAS
|
| 2018 | C | conf |
DSD
|
| 2018 | C | conf |
DSD
|
| 2018 | — | conf |
SBESC
|
| 2017 | J | jnl |
IET Comput. Digit. Tech.
|
| 2017 | J | jnl |
Microelectron. Reliab.
|
| 2017 | J | jnl |
Towards high-sensitive built-in current sensors enabling detection of radiation-induced soft errors.
Microelectron. Reliab.
|
| 2017 | — | conf |
DFT
|
| 2016 | C | conf |
ISCAS
|
| 2016 | — | conf |
SBCCI
|
| 2016 | J | jnl |
J. Electron. Test.
|
| 2016 | C | conf |
ISCAS
|
| 2016 | — | conf |
LASCAS
|
| 2016 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 2015 | — | conf |
SBCCI
|
| 2015 | — | conf |
PATMOS
|
| 2015 | — | conf |
LATS
|
| 2014 | — | conf |
SBCCI
|
| 2013 | — | conf |
HOST
|
| 2013 | — | conf |
PATMOS
|
| 2013 | — | conf |
IESS
|
| 2012 | J | jnl |
Microelectron. Reliab.
|
| 2012 | — | conf |
SBCCI
|
| 2011 | J | jnl |
Microelectron. J.
|
| 2011 | J | jnl |
J. Low Power Electron.
|
| 2011 | — | conf |
LATW
|