Frank Altmann

20 papers A 1Journal 14Unranked 5
YearRankTypeTitle / Venue / Authors
2024 J jnl
Co3O4-Based Materials as Potential Catalysts for Methane Detection in Catalytic Gas Sensors.
Sensors
Olena Yurchenko, Patrick Diehle, Frank Altmann, Katrin Schmitt, Jürgen Wöllenstein
2023 — conf
Modulation to the Rescue: Identifying Sub-Circuitry in the Transistor Morass for Targeted Analysis.
ASHES@CCS
Xhani Marvin Saß, Thilo Krachenfels, Frederik Dermot Pustelnik, Jean-Pierre Seifert, Frank Altmann
2023 J jnl
Modulation to the Rescue: Identifying Sub-Circuitry in the Transistor Morass for Targeted Analysis.
CoRR
Xhani Marvin Saß, Thilo Krachenfels, Frederik Dermot Pustelnik, Jean-Pierre Seifert, Christian Große, Frank Altmann
2021 A conf
Nano Security: From Nano-Electronics to Secure Systems.
DATE
Ilia Polian, Frank Altmann, Tolga Arul, Christian Boit, Ralf Brederlow, Lucas Davi, Rolf Drechsler, Nan Du, Thomas Eisenbarth, Tim Güneysu, Sascha Hermann, Matthias Hiller, Rainer Leupers, Farhad Merchant, Thomas Mussenbrock, Stefan Katzenbeisser, Akash Kumar, Wolfgang Kunz, Thomas Mikolajick, Vivek Pachauri, Jean-Pierre Seifert, Frank Sill Torres, Jens Trommer
2021 — conf
Thermal source separation for 3D defect localization using independent component analysis (ICA) from time-resolved temperature response (TRTR).
CASE
Michael Kögel, Sebastian Brand, Christian Große, Kristof J. P. Jacobs, Ingrid De Wolf, Frank Altmann
2020 — conf
Reliability Physics of GaN HEMT Microwave Devices: The Age of Scaling.
IRPS
Enrico Zanoni, Matteo Meneghini, Gaudenzio Meneghesso, Fabiana Rampazzo, Daniele Marcon, Veronica Gao Zhan, Francesca Chiocchetta, Andreas Graff, Frank Altmann, Michél Simon-Najasek, David Poppitz
2019 — conf
New Access to Soft Breakdown Parameters of Low-k Dielectrics Through Localisation-Based Analysis.
IRPS
Norbert Herfurth, Anne Beyreuther, Elham Amini, Christian Boit, Michél Simon-Najasek, Susanne Hübner, Frank Altmann, R. Herfurth, Chen Wu, Ingrid De Wolf, Kris Croes
2018 — conf
Physical failure analysis methods for wide band gap semiconductor devices.
IRPS
Andreas Graff, Michél Simon-Najasek, David Poppitz, Frank Altmann
2017 J jnl
Exploring the thermal limit of GaN power devices under extreme overload conditions.
Microelectron. Reliab.
Florian Peter Pribahsnik, Michael Nelhiebel, M. Mataln, Mirko Bernardoni, G. Prechtl, Frank Altmann, David Poppitz, A. Lindemann
2017 J jnl
High resolution physical analysis of ohmic contact formation at GaN-HEMT devices.
Microelectron. Reliab.
Andreas Graff, Michél Simon-Najasek, Frank Altmann, Ján Kuzmík, Dagmar Gregusová, S. Hascik, Helmut Jung, T. Baur, Jan Grünenpütt, Hervé Blanck
2016 J jnl
Correlation of gate leakage and local strain distribution in GaN/AlGaN HEMT structures.
Microelectron. Reliab.
Mikael Broas, Andreas Graff, Michél Simon-Najasek, David Poppitz, Frank Altmann, Helmut Jung, Hervé Blanck
2016 J jnl
Detection and analysis of stress-induced voiding in Al-power lines by acoustic GHz-microscopy.
Microelectron. Reliab.
Sebastian Brand, Michél Simon-Najasek, Michael Kögel, Joerg Jatzkowski, R. Portius, Frank Altmann
2016 J jnl
Innovative Failure Analysis Techniques for 3-D Packaging Developments.
IEEE Des. Test
Frank Altmann, Matthias Petzold
2016 J jnl
Magnetic field and current density imaging using off-line lock-in analysis.
Microelectron. Reliab.
Michael Kögel, Frank Altmann, Sebastian Tismer, Sebastian Brand
2016 J jnl
Novel failure mode of chip corrosion at automotive HALL sensor devices under multiple stress conditions.
Microelectron. Reliab.
Michél Simon-Najasek, Georg Lorenz, Achim Lindner, Frank Altmann
2016 J jnl
Reliability evaluation of Si-dies due to assembly issues.
Microelectron. Reliab.
Falk Naumann, Volkmar Gottschalk, Bernd Burchard, Frank Altmann
2014 J jnl
Advanced FIB sample preparation techniques for high resolution TEM investigations of HEMT structures.
Microelectron. Reliab.
Michél Simon-Najasek, Susanne Hübner, Frank Altmann, Andreas Graff
2012 J jnl
Novel techniques for dopant contrast analysis on real IC structures.
Microelectron. Reliab.
Joerg Jatzkowski, Michél Simon-Najasek, Frank Altmann
2010 J jnl
Dynamic lock-in thermography for operation mode-dependent thermally active fault localization.
Microelectron. Reliab.
Rudolf Schlangen, Hervé Deslandes, Ted R. Lundquist, C. Schmidt, Frank Altmann, K. Yu, A. Andreasyan, S. Li
2006 J jnl
Lock-in thermal IR imaging using a solid immersion lens.
Microelectron. Reliab.
O. Breitenstein, Frank Altmann, Thorsten Riediger, D. Karg, V. Gottschalk