Francois Lefevre

16 papers A 1B 2C 2Journal 6Unranked 5
YearRankTypeTitle / Venue / Authors
2025 — conf
Hardware architecture for LE Uncoded PHYs version5.3 Transmitter.
ComComAP
Ibtissam Belakhdhar, Moncef Kadi, Habib Boulzazen, Sahbi Baccar, Francois Lefevre, François Hedin
2023 J jnl
On the Use of the Indirect Test Strategy for Lifetime Performance Monitoring of RF Circuits.
J. Electron. Test.
Hassan El Badawi, Florence Azaïs, Serge Bernard, Mariane Comte, Vincent Kerzerho, Francois Lefevre
2021 J jnl
Evaluation of a Two-Tier Adaptive Indirect Test Flow for a Front-End RF Circuit.
J. Electron. Test.
Hassan El Badawi, Florence Azaïs, Serge Bernard, Mariane Comte, Vincent Kerzerho, Francois Lefevre
2020 — conf
Implementing indirect test of RF circuits without compromising test quality: a practical case study.
LATS
Hassan El Badawi, Florence Azaïs, Serge Bernard, Mariane Comte, Vincent Kerzèrho, Francois Lefevre, I. Gorenflot
2020 J jnl
Investigations on the Use of Ensemble Methods for Specification-Oriented Indirect Test of RF Circuits.
J. Electron. Test.
Hassan El Badawi, Florence Azaïs, Serge Bernard, Mariane Comte, Vincent Kerzerho, Francois Lefevre
2019 B conf
Power Measurement and Spectral Test of ZigBee Transmitters from 1-bit Under-sampled Acquisition.
ETS
T. Vayssade, Florence Azaïs, Laurent Latorre, Francois Lefevre
2019 — conf
Use of ensemble methods for indirect test of RF circuits: can it bring benefits?
LATS
Hassan El Badawi, Florence Azaïs, Serge Bernard, Mariane Comte, Vincent Kerzerho, Francois Lefevre
2018 C conf
Low-cost functional test of a 2.4 GHz OQPSK transmitter using standard digital ATE.
IOLTS
T. Vayssade, Florence Azaïs, Laurent Latorre, Francois Lefevre
2016 J jnl
Digital Embedded Test Instrument for On-Chip Phase Noise Testing of Analog/RF Integrated Circuits.
J. Circuits Syst. Comput.
Florence Azaïs, Stephane David-Grignot, Laurent Latorre, Francois Lefevre
2016 J jnl
SSB Phase Noise Evaluation of Analog/IF Signals on Standard Digital ATE.
J. Electron. Test.
Florence Azaïs, Stephane David-Grignot, Laurent Latorre, Francois Lefevre
2015 — conf
A digital technique for the evaluation of SSB phase noise of analog/RF signals.
LATS
Florence Azaïs, Stephane David-Grignot, Laurent Latorre, Francois Lefevre
2015 B conf
A new technique for low-cost phase noise production testing from 1-bit signal acquisition.
ETS
Stephane David-Grignot, Florence Azaïs, Laurent Latorre, Francois Lefevre
2015 C conf
Embedded Test Instrument for On-Chip Phase Noise Evaluation of Analog/IF Signals.
DDECS
Florence Azaïs, Stephane David-Grignot, Laurent Latorre, Francois Lefevre
2015 J jnl
Phase Noise Testing of Analog/IF Signals Using Digital ATE: A New Post-Processing Algorithm for Extended Measurement Range.
J. Electron. Test.
Stephane David-Grignot, Florence Azaïs, Laurent Latorre, Francois Lefevre
2014 A conf
Low-cost phase noise testing of complex RF ICs using standard digital ATE.
ITC
Stephane David-Grignot, Florence Azaïs, Laurent Latorre, Francois Lefevre
2014 — conf
Phase noise measurement on IF analog signals using standard digital ATE resources.
NEWCAS
Stephane David-Grignot, Florence Azaïs, Laurent Latorre, Francois Lefevre