| Year | Rank | Type | Title / Venue / Authors |
|---|---|---|---|
| 2025 | B | conf |
IJCNN
|
| 2025 | J | jnl |
CoRR
|
| 2025 | J | jnl |
CoRR
|
| 2025 | — | conf |
IWASI
|
| 2022 | J | jnl |
IEEE Trans. Instrum. Meas.
|
| 2022 | J | jnl |
CoRR
|
| 2021 | J | jnl |
Sensors
|
| 2021 | J | jnl |
Sensors
|
| 2021 | J | jnl |
Sensors
|
| 2020 | J | jnl |
Sensors
|
| 2020 | J | jnl |
IEEE J. Solid State Circuits
|
| 2019 | J | jnl |
Sensors
|
| 2018 | J | jnl |
Sensors
|
| 2016 | J | jnl |
IEEE Trans. Intell. Transp. Syst.
|
| 2016 | J | jnl |
IEEE Trans. Instrum. Meas.
|
| 2014 | — | conf |
ESSDERC
|
| 2013 | J | jnl |
IEEE Trans. Circuits Syst. I Regul. Pap.
|
| 2012 | — | conf |
ESSDERC
|
| 2011 | — | conf |
Sensors, Cameras, and Systems for Industrial, Scientific, and Consumer Applications
|
| 2011 | — | conf |
Sensors, Cameras, and Systems for Industrial, Scientific, and Consumer Applications
|
| 2011 | — | conf |
Sensors, Cameras, and Systems for Industrial, Scientific, and Consumer Applications
|
| 2006 | J | jnl |
IEEE Trans. Instrum. Meas.
|
| 2005 | — | conf |
ICECS
|
| 2005 | J | jnl |
Microelectron. Reliab.
|
| 2004 | J | jnl |
IEEE Trans. Instrum. Meas.
|
| 2004 | J | jnl |
Microelectron. Reliab.
|
| 2004 | J | jnl |
Microelectron. Reliab.
|
| 2003 | J | jnl |
Microelectron. Reliab.
|
| 2003 | J | jnl |
IEEE J. Solid State Circuits
|
| 2003 | — | conf |
ESSCIRC
|
| 2001 | J | jnl |
Microelectron. Reliab.
|
| 2000 | J | jnl |
IEEE Trans. Instrum. Meas.
|