Francesco Angione

19 papers A 2B 3Misc 2Journal 6Unranked 5
YearRankTypeTitle / Venue / Authors
2026 J jnl
Netlist-Independent Functional Stress Pattern Generation Strategy for AI HW Accelerators Embedded into SoCs.
IEEE Trans. Computers
Gabriele Filipponi, Denis Schwachhofer, Francesco Angione, Claudia Bertani, Simone Corbellini, Nicola Di Gruttola Giardino, Giuseppe Garozzo, Giorgio Insinga, Vincenzo Tancorre, Paolo Bernardi
2025 J jnl
A Novel Indirect Methodology Based on Execution Traces for Grading Functional Test Programs.
IEEE Trans. Computers
Francesco Angione, Paolo Bernardi, Andrea Calabrese, Lorenzo Cardone, Stefano Quer, Claudia Bertani, Vincenzo Tancorre
2025 J jnl
A System-Level Test Methodology for Communication Peripherals in System-on-Chips.
IEEE Trans. Computers
Francesco Angione, Paolo Bernardi, Nicola Di Gruttola Giardino, Gabriele Filipponi, Claudia Bertani, Vincenzo Tancorre
2025 J jnl
Automatic Generation of System-Level Test for Un-Core Logic of Large Automotive SoC.
IEEE Trans. Computers
Francesco Angione, Paolo Bernardi, Giusy Iaria, Claudia Bertani, Vincenzo Tancorre
2025 — conf
Leveraging ATE to Optimize System-Level-Test for Multicore Automotive SoCs.
LATS
Francesco Angione, Paolo Bernardi, Claudia Bertani, Lorenzo Bertetto, Lorenzo Cardone, Nicola Di Gruttola Giardino, Stefano Quer, Vincenzo Tancorre
2025 Misc conf
Special Session: Trustworthy Hardware-AI at the Cloud.
VTS
Francesco Angione, Paolo Bernardi, Alberto Bosio, Harish Dattatraya Dixit, Salvatore Pappalardo, Annachiara Ruospo, Ernesto Sánchez, Arani Sinha, Vittorio Turco
2025 A conf
System-Level Test techniques for Automotive SoCs.
ITC
Francesco Angione, Paolo Bernardi, Riccardo Cantoro
2025 — —
System-Level Test techniques for Automotive SoCs.
Francesco Angione
2024 — conf
A Flexible FPGA-Based Test Equipment for Enabling Out-of-Production Manufacturing Test Flow of Digital Systems.
DFT
Nicola Di Gruttola Giardino, Francesco Angione, Paolo Bernardi, Tommaso Foscale, Claudia Bertani, Vincenzo Tancorre
2024 B conf
Optimizing System-Level Test Program Generation via Genetic Programming.
ETS
Denis Schwachhofer, Francesco Angione, Steffen Becker, Stefan Wagner, Matthias Sauer, Paolo Bernardi, Ilia Polian
2023 J jnl
A Low-Cost Burn-In Tester Architecture to Supply Effective Electrical Stress.
IEEE Trans. Computers
Francesco Angione, Davide Appello, Paolo Bernardi, Claudia Bertani, Giovambattista Gallo, Stefano Littardi, Giorgio Pollaccia, Walter Ruggeri, Matteo Sonza Reorda, Vincenzo Tancorre, Roberto Ugioli
2023 J jnl
A Toolchain to Quantify Burn-In Stress Effectiveness on Large Automotive System-on-Chips.
IEEE Access
Francesco Angione, Davide Appello, Paolo Bernardi, Andrea Calabrese, Stefano Quer, Matteo Sonza Reorda, Vincenzo Tancorre, Roberto Ugioli
2023 Misc conf
A guided debugger-based fault injection methodology for assessing functional test programs.
VTS
Francesco Angione, Paolo Bernardi, Nicola Di Gruttola Giardino, Davide Appello, Claudia Bertani, Vincenzo Tancorre
2023 — conf
On the integration and hardening of Software Test Libraries in Real-Time Operating Systems.
LATS
Francesco Angione, Paolo Bernardi, Riccardo Cantoro, Nicola Di Gruttola Giardino, Davide Piumatti, Matteo Sonza Reorda, Davide Appello, Vincenzo Tancorre
2022 — conf
A novel Pattern Selection Algorithm to reduce the Test Cost of large Automotive Systems-on-Chip.
LATS
Giusy Iaria, Francesco Angione, Paolo Bernardi, Matteo Sonza Reorda, Davide Appello, Giuseppe Garozzo, Vincenzo Tancorre
2022 B conf
An Optimized Burn-In Stress Flow targeting Interconnections logic to Embedded Memories in Automotive Systems-on-Chip.
ETS
Francesco Angione, Paolo Bernardi, Gabriele Filipponi, Matteo Sonza Reorda, Davide Appello, Vincenzo Tancorre, Roberto Ugioli
2022 A conf
An innovative Strategy to Quickly Grade Functional Test Programs.
ITC
Francesco Angione, Paolo Bernardi, Andrea Calabrese, Lorenzo Cardone, A. Niccoletti, Davide Piumatti, Stefano Quer, Davide Appello, Vincenzo Tancorre, Roberto Ugioli
2022 — conf
Online scheduling of concurrent Memory BISTs execution at Real-Time Operating-System level.
DFT
Francesco Angione, Paolo Bernardi, Gabriele Filipponi, Claudia Tempesta, Matteo Sonza Reorda, Davide Appello, Vincenzo Tancorre, Roberto Ugioli
2022 B conf
Test, Reliability and Functional Safety Trends for Automotive System-on-Chip.
ETS
Francesco Angione, Davide Appello, Joseph Aribido, Jyotika Athavale, Nicolò Bellarmino, Paolo Bernardi, Riccardo Cantoro, Corrado De Sio, Tommaso Foscale, Gabriele Gavarini, Juan-David Guerrero-Balaguera, Martin Huch, Giusy Iaria, Tobias Kilian, Riccardo Mariani, Raffaele Martone, Annachiara Ruospo, Ernesto Sánchez, Ulf Schlichtmann, Giovanni Squillero, Matteo Sonza Reorda, Luca Sterpone, Vincenzo Tancorre, Roberto Ugioli