Florian Cacho

51 papers A 5C 7Misc 2Journal 8Unranked 29
YearRankTypeTitle / Venue / Authors
2024 — conf
A Methodology to Address RF Aging of 40nm CMOS PA Cells Under 5G mmW Modulation Profiles.
IRPS
A. Divay, Cédric Dehos, Ismael Charlet, Fred Gaillard, B. Duriez, Xavier Garros, J. Antonijevic, Joycelyn Hai, Nathalie Revil, Jeremie Forest, Vincent Knopik, Florian Cacho, David Roy, X. Federspiel, S. Crémer, Pascal Chevalier
2024 — conf
A Versatile 55-nm SiGe BiCMOS Technology for Wired, Wireless, and Satcom Applications.
BCICTS
Pascal Chevalier, Florian Cacho, C. Durand, N. Derrier, V. Millon, Frederic Monsieur, A. Gauthier, P. Billy, Sébastien Fregonese, Thomas Zimmer, H. Audouin, Michel Buczko, Didier Céli, C. Deglise-Favre, Cheikh Diouf, O. Foissey, M. Hello, N. Guitard, S. Madassamy, S. Ramirez-Ruiz, C. Renard, F. Sonnerat, V. Yon, D. Gloria, G. Waltisperger
2024 — conf
Non-conducting Hot carrier temperature activation and temperature sense effect.
IRPS
X. Federspiel, Cheikh Diouf, B. Arunachalam, David Roy, Florian Cacho
2024 — conf
Robustness Assessment Through 77GHz Operating Life Test of Power Amplifier for Radar Applications in 28nm FD-SOI CMOS.
IRPS
Florian Cacho, P. Cathelin, Joycelyn Hai, S. Bouvot, Jean-Francois Jozef Nowakowski, M. Martinez, R. Debroucke, S. Jean, R. Paulin, J. Antonijevic, X. Federspiel, Nicolas Planes, Giuseppe Papotto, Alessandro Parisi, Alessandro Finocchiaro, Andrea Cavarra, Alessandro Castorina, Claudio Nocera, Giuseppe Palmisano
2023 — conf
Integrated Test Circuit for Off-State Dynamic Drain Stress Evaluation.
IRPS
Joycelyn Hai, Florian Cacho, X. Federspiel, Tidjani Garba-Seybou, A. Divay, Estelle Lauga-Larroze, Jean-Daniel Arnould
2023 — conf
Location of Oxide Breakdown Events under Off-state TDDB in 28nm N-MOSFETs dedicated to RF applications.
IRPS
Tidjani Garba-Seybou, Xavier Federspiel, Frederic Monsieur, Mathieu Sicre, Florian Cacho, Joycelyn Hai, Alain Bravaix
2023 C conf
Minimum SRAM Retention Voltage: Insight about optimizing Power Efficiency across Temperature Profile, Process Variation and Aging.
IOLTS
Yunus Emre Aslan, Florian Cacho, T. Kumar, D. K. Janardan, A. Kumar, F. Giner, M. Faurichon, Lorena Anghel
2022 Misc conf
40nm Ultra-low Leakage SRAM with Embedded Sub-threshold Analog Closed Loop System for Efficient Source Biasing of the Memory Array in Retention Mode.
VLSID
Kedar Janardan Dhori, Promod Kumar, Christophe Lecocq, Pascal Urard, Olivier Callen, Florian Cacho, Maryline Parra, Prashant Pandey, Daniel Noblet
2022 — conf
Comprehensive Analysis of RF Hot-Carrier Reliability Sensitivity and Design Explorations for 28GHz Power Amplifier Applications.
IRPS
Joycelyn Hai, Florian Cacho, A. Divay, Estelle Lauga-Larroze, Jean-Daniel Arnould, Jeremie Forest, Vincent Knopik, Xavier Garros
2022 J jnl
Design-Time Exploration for Process, Environment and Aging Compensation Techniques for Low Power Reliable-Aware Design.
IEEE Trans. Emerg. Top. Comput.
Lorena Anghel, Florian Cacho
2022 — conf
Frequency dependant gate oxide TDDB model.
IRPS
M. Arabi, X. Federspiel, Florian Cacho, M. Rafik, S. Blonkowski, Xavier Garros, G. Guibaudo
2022 — conf
New Modelling Off-state TDDB for 130nm to 28nm CMOS nodes.
IRPS
Tidjani Garba-Seybou, Xavier Federspiel, Alain Bravaix, Florian Cacho
2021 — conf
Analysis of the interactions of HCD under "On" and "Off" state modes for 28nm FDSOI AC RF modelling.
IRPS
Tidjani Garba-Seybou, Xavier Federspiel, Alain Bravaix, Florian Cacho
2021 — conf
BTI Arbitrary Stress Patterns Characterization & Machine-Learning optimized CET Maps Simulations.
IRPS
Louis Gerrer, Jacques Cluzel, Fred Gaillard, Xavier Garros, Xavier Federspiel, Florian Cacho, David Roy, E. Vincent
2021 — conf
HCI Temperature sense effect from 180nm to 28nm nodes.
IRPS
Xavier Federspiel, Abdourahmane Camara, Audrey Michard, Cheikh Diouf, Florian Cacho
2021 — conf
Monitoring Setup and Hold Timing Limits.
IRPS
Florian Cacho, Lorena Anghel, Xavier Federspiel
2020 — conf
Comparison of variability of HCI induced drift for SiON and HKMG devices.
IRPS
Xavier Federspiel, Cheikh Diouf, Florian Cacho, Emmanuel Vincent
2020 — conf
Hot-Carrier induced Breakdown events from Off to On mode in NEDMOS.
IRPS
Alain Bravaix, Edith Kussener, David Ney, Xavier Federspiel, Florian Cacho
2019 C conf
Global and Local Process Variation Simulations in Design for Reliability approach.
IOLTS
Audrey Michard, Florian Cacho, Damien Celeste, Xavier Federspiel
2019 — conf
Impact of Passive & Active Load Gate Impedance on Breakdown Hardness in 28nm FDSOI Technology.
IRPS
A. P. Nguyen, Xavier Garros, M. Rafik, Florian Cacho, David Roy, Xavier Federspiel, Fred Gaillard
2019 — conf
Investigation of NBTI Dynamic Behavior with Ultra-Fast Measurement.
IRPS
Florian Cacho, X. Federspiel, D. Nouguier, Cheikh Diouf
2018 C conf
Integrated Test Structures for Reliability Investigation under Dynamic Stimuli.
IOLTS
Florian Cacho, D. Nouguier, M. Arabi, X. Federspiel, Y. Carminati, M. Saliva
2018 — conf
Investigation of speed sensors accuracy for process and aging compensation.
IRPS
Riddhi Jitendrakumar Shah, Florian Cacho, Vincent Huard, Souhir Mhira, D. Arora, Pankaj Agarwal, Shubham Kumar, S. Balaraman, Bijoy Kumar Singh, Lorena Anghel
2018 A conf
NBTI aged cell rejuvenation with back biasing and resulting critical path reordering for digital circuits in 28nm FDSOI.
DATE
Ajith Sivadasan, Riddhi Jitendrakumar Shah, Vincent Huard, Florian Cacho, Lorena Anghel
2018 — conf
Reliability assessment of 4GSP/s interleaved SAR ADC.
IRPS
Rania Lajmi, Florian Cacho, O. David, Jean-Pierre Blanc, Emmanuel Rouat, Sébastien Haendler, Ph. Benech, Estelle Lauga-Larroze, Sylvain Bourdel
2017 J jnl
Characterization of Low Drop-Out during ageing and design for yield.
Microelectron. Reliab.
R. Lajmi, Florian Cacho, Estelle Lauga-Larroze, Sylvain Bourdel, Ph. Benech, Vincent Huard, X. Federspiel
2017 A conf
Cognitive approach to support dynamic aging compensation.
ITC
Souhir Mhira, Vincent Huard, Ahmed Benhassain, Florian Cacho, David Meyer, Sylvie Naudet, Abhishek Jain, C. R. Parthasarathy, Alain Bravaix
2017 C conf
Dynamic aging compensation and Safety measures in Automotive environment.
IOLTS
Souhir Mhira, Vincent Huard, Ahmed Benhassain, Florian Cacho, Sylvie Naudet, Abhishek Jain, C. R. Parthasarathy, Alain Bravaix
2017 J jnl
Enabling robust automotive electronic components in advanced CMOS nodes.
Microelectron. Reliab.
Vincent Huard, Souhir Mhira, Florian Cacho, Alain Bravaix
2017 — conf
High-yield design of high-density SRAM for low-voltage and low-leakage operations.
DFT
Kedar Janardan Dhori, Hitesh Chawla, Ashish Kumar, Prashant Pandey, Promod Kumar, Lorenzo Ciampolini, Florian Cacho, Damien Croain
2017 C conf
Investigation of critical path selection for in-situ monitors insertion.
IOLTS
Florian Cacho, Ahmed Benhassain, Riddhi Jitendrakumar Shah, Souhir Mhira, Vincent Huard, Lorena Anghel
2017 A conf
Workload dependent reliability timing analysis flow.
DATE
Ajith Sivadasan, Armelle Notin, Vincent Huard, Etienne Maurin, Souhir Mhira, Florian Cacho, Lorena Anghel
2016 — conf
28nm FDSOI technology sub-0.6V SRAM Vmin assessment for ultra low voltage applications.
VLSI Circuits
Rossella Ranica, Nicolas Planes, Vincent Huard, Olivier Weber, Daniel Noblet, Damien Croain, Fabien Giner, Sylvie Naudet, P. Mergault, S. Ibars, A. Villaret, Maryline Parra, Sébastien Haendler, M. Quoirin, Florian Cacho, C. Julien, F. Terrier, Lorenzo Ciampolini, David Turgis, Christophe Lecocq, Franck Arnaud
2016 C conf
Activity profiling: Review of different solutions to develop reliable and performant design.
IOLTS
Florian Cacho, Ahmed Benhassain, Souhir Mhira, Ajith Sivadasan, Vincent Huard, P. Cathelin, Vincent Knopik, Abhishek Jain, C. R. Parthasarathy, Lorena Anghel
2016 — conf
Early failure prediction by using in-situ monitors: Implementation and application results.
ERMAVSS@DATE
Ahmed Benhassain, Florian Cacho, Vincent Huard, Lorena Anghel
2016 Misc conf
Early system failure prediction by using aging in situ monitors: Methodology of implementation and application results.
VTS
Lorena Anghel, Ahmed Benhassain, Ajith Sivadasan, Florian Cacho, Vincent Huard
2016 C conf
Hot-carrier and BTI damage distinction for high performance digital application in 28nm FDSOI and 28nm LP CMOS nodes.
IOLTS
Alain Bravaix, M. Saliva, Florian Cacho, X. Federspiel, Cheikh Ndiaye, Souhir Mhira, Edith Kussener, E. Pauly, Vincent Huard
2016 — conf
In-situ slack monitors: taking up the challenge of on-die monitoring of variability and reliability.
IVSW
Ahmed Benhassain, Souhir Mhira, Florian Cacho, Vincent Huard, Lorena Anghel
2016 J jnl
Performance vs. reliability adaptive body bias scheme in 28 nm & 14 nm UTBB FDSOI nodes.
Microelectron. Reliab.
Cheikh Ndiaye, Vincent Huard, X. Federspiel, Florian Cacho, Alain Bravaix
2016 J jnl
Potentiality of healing techniques in hot-carrier damaged 28 nm FDSOI CMOS nodes.
Microelectron. Reliab.
Alain Bravaix, Florian Cacho, X. Federspiel, Cheikh Ndiaye, Souhir Mhira, Vincent Huard
2016 A conf
Study of workload impact on BTI HCI induced aging of digital circuits.
DATE
Ajith Sivadasan, Florian Cacho, Sidi Ahmed Benhassain, Vincent Huard, Lorena Anghel
2016 — conf
Workload Impact on BTI HCI Induced Aging of Digital Circuits: A System level Analysis.
ERMAVSS@DATE
Ajith Sivadasan, Florian Cacho, Sidi Ahmed Benhassain, Vincent Huard, Lorena Anghel
2015 — conf
28nm UTBB FDSOI product reliability/performance trade-off optimization through body bias operation.
IRPS
P. Mora, X. Federspiel, Florian Cacho, Vincent Huard, Wafa Arfaoui
2015 A conf
Digital circuits reliability with in-situ monitors in 28nm fully depleted SOI.
DATE
M. Saliva, Florian Cacho, Vincent Huard, X. Federspiel, D. Angot, Ahmed Benhassain, Alain Bravaix, Lorena Anghel
2015 — conf
From BTI variability to product failure rate: A technology scaling perspective.
IRPS
Vincent Huard, D. Angot, Florian Cacho
2015 — conf
Impact of gate oxide breakdown in logic gates from 28nm FDSOI CMOS technology.
IRPS
M. Saliva, Florian Cacho, Cheikh Ndiaye, Vincent Huard, D. Angot, Alain Bravaix, Lorena Anghel
2015 — conf
Timing in-situ monitors: Implementation strategy and applications results.
CICC
Ahmed Benhassain, Florian Cacho, Vincent Huard, M. Saliva, Lorena Anghel, C. R. Parthasarathy, Abhishek Jain, Fabien Giner
2012 J jnl
Reliability Characterization and Modeling Solution to Predict Aging of 40-nm MOSFET DC and RF Performances Induced by RF Stresses.
IEEE J. Solid State Circuits
Laurent Negre, David Roy, Florian Cacho, Patrick Scheer, Sebastien Jan, Samuel Boret, Daniel Gloria, Gérard Ghibaudo
2011 J jnl
A bottom-up approach for System-On-Chip reliability.
Microelectron. Reliab.
Vincent Huard, N. Ruiz Amador, Florian Cacho, E. Pion
2011 — conf
Bottom-up digital system-level reliability modeling.
CICC
N. Ruiz Amador, Vincent Huard, E. Pion, Florian Cacho, Damien Croain, V. Robert, Sylvain Engels, Philippe Flatresse, Lorena Anghel
2007 J jnl
A constitutive single crystal model for the silicon mechanical behavior: Applications to the stress induced by silicided lines and STI in MOS technologies.
Microelectron. Reliab.
Florian Cacho, S. Orain, G. Cailletaud, H. Jaouen