Fidel Muradali

19 papers A 9Misc 4Journal 2Unranked 4
YearRankTypeTitle / Venue / Authors
2008 — conf
Load-Board/PCB Noise Suppression via Electromagnetic Band Gap Power Plane Patterning.
ATS
Fidel Muradali, Suzanne Huh, Madhavan Swaminathan
2007 — conf
Special Session: Analog Production Test.
ATS
Fidel Muradali, Jochen Rivoir
2007 — conf
Test Roles in Diagnosis and Silicon Debug.
ATS
Anis Uzzaman, Fidel Muradali, Takashi Aikyo, Robert C. Aitken, Tom Jackson, Rajesh Galivanche, Takeshi Onodera
2006 — conf
Practical Needs and Wants for Silicon Debug and Diagnosis.
ATS
Fidel Muradali
2005 A conf
Business constraints drive test decisions.
ITC
Fidel Muradali
2004 A conf
From Working Design Flow to Working Chips: Dependencies and Impacts of Methodology Decisions.
DATE
Robert C. Aitken, Fidel Muradali
2004 J jnl
ITC 2003 panels: Part 2.
IEEE Des. Test Comput.
Carol Stolicny, Mustapha Slamani, Fidel Muradali, Geir Eide, Mike Li
2003 A conf
Diagnosis in Modern Design - Just the Tip of the Iceberg.
ITC
Fidel Muradali
2003 A conf
Future ATE: Perspectives & Requirements.
ITC
Fidel Muradali
2002 Misc conf
Analog and Mixed Signal BIST: Too Much, Too Little, Too Late?
VTS
Adam Osseiran, William De Wilkins, Barry Baril, Sassan Tabatabaei, Fidel Muradali, Ken Posse, Lee Song
2002 Misc conf
Reducing Time to Volume and Time to Market: Is Silicon Debug and Diagnosis the Answer?
VTS
Fidel Muradali, Mike Ricchetti, Bart Vermeulen, Bulent I. Dervisoglu, Bob Gottlieb, Bernd Koenemann, C. J. Clark
2002 A conf
The Impact of Outsourcing on Test.
ITC
Fidel Muradali
2001 A conf
Power supply transient signal integration circuit.
ITC
Chintan Patel, Fidel Muradali, James F. Plusquellic
2000 Misc conf
Do I Need this Tool for My Chips to Work?
VTS
Fidel Muradali, André Ivanov
1999 A conf
Defect detection using power supply transient signal analysis.
ITC
Amy Germida, Zheng Yan, James F. Plusquellic, Fidel Muradali
1999 A conf
Trends in SLI design and their effect on test.
ITC
Robert C. Aitken, Fidel Muradali
1996 Misc conf
A self-driven test structure for pseudorandom testing of non-scan sequential circuits.
VTS
Fidel Muradali, Janusz Rajski
1995 J jnl
A structure and technique for pseudorandom-based testing of sequential circuits.
J. Electron. Test.
Fidel Muradali, Takao Nishida, Tsuguo Shimizu
1990 A conf
A new procedure for weighted random built-in self-test.
ITC
Fidel Muradali, Vinod K. Agarwal, Benoit Nadeau-Dostie