| Year | Rank | Type | Title / Venue / Authors |
|---|---|---|---|
| 2026 | J | jnl |
Expert Syst. Appl.
|
| 2026 | J | jnl |
CoRR
|
| 2025 | J | jnl |
CoRR
|
| 2025 | J | jnl |
IEICE Electron. Express
|
| 2025 | J | jnl |
IEEE Trans. Geosci. Remote. Sens.
|
| 2024 | J | jnl |
IEEE J. Sel. Top. Appl. Earth Obs. Remote. Sens.
|
| 2024 | J | jnl |
Microelectron. J.
|
| 2024 | B | conf |
SMC
|
| 2024 | J | jnl |
IEEE Trans. Geosci. Remote. Sens.
|
| 2023 | J | jnl |
IEEE Trans. Veh. Technol.
|
| 2023 | J | jnl |
IEEE Trans. Intell. Transp. Syst.
|
| 2023 | J | jnl |
IEEE Trans. Intell. Transp. Syst.
|
| 2022 | J | jnl |
Neural Comput. Appl.
|
| 2022 | J | jnl |
Int. J. Pattern Recognit. Artif. Intell.
|
| 2022 | J | jnl |
Pattern Recognit.
|
| 2021 | J | jnl |
IEEE Trans. Veh. Technol.
|
| 2021 | — | conf |
WorldCIST (1)
|
| 2021 | J | jnl |
Trans. Inst. Meas. Control
|
| 2021 | J | jnl |
IEEE Trans. Veh. Technol.
|
| 2020 | J | jnl |
IEEE Trans. Veh. Technol.
|
| 2019 | — | conf |
ICONIP (1)
|
| 2019 | — | conf |
PRICAI (3)
|
| 2019 | J | jnl |
IEEE Trans. Veh. Technol.
|
| 2019 | — | conf |
ITSC
|
| 2018 | J | jnl |
IEEE Access
|
| 2018 | J | jnl |
IEEE Trans. Veh. Technol.
|
| 2018 | J | jnl |
Modeling the impact of well contacts on SEE response with bias-dependent Single-Event compact model.
Microelectron. Reliab.
|
| 2018 | J | jnl |
Single-event multiple transients in guard-ring hardened inverter chains of different layout designs.
Microelectron. Reliab.
|
| 2017 | J | jnl |
Heavy ion micro-beam study of single-event transient (SET) in SiGe heterjunction bipolar transistor.
Sci. China Inf. Sci.
|
| 2017 | J | jnl |
Microelectron. Reliab.
|
| 2017 | J | jnl |
IEEE Trans. Intell. Transp. Syst.
|
| 2016 | B | conf |
Intelligent Vehicles Symposium
|
| 2009 | — | conf |
IFITA (3)
|