| Year | Rank | Type | Title / Venue / Authors |
|---|---|---|---|
| 2016 | J | jnl |
Microelectron. Reliab.
|
| 2014 | J | jnl |
Microelectron. Reliab.
|
| 2013 | J | jnl |
Microelectron. Reliab.
|
| 2013 | J | jnl |
Microelectron. Reliab.
|
| 2013 | J | jnl |
Microelectron. Reliab.
|
| 2012 | J | jnl |
Microelectron. Reliab.
|
| 2012 | J | jnl |
Microelectron. Reliab.
|
| 2012 | J | jnl |
Microelectron. Reliab.
|
| 2010 | — | conf |
ASP-DAC
|
| 2010 | — | conf |
Fine resolution double edge clipping with calibration technique for built-in at-speed delay testing.
ASP-DAC
|
| 2007 | J | jnl |
IEICE Trans. Electron.
|
| 2006 | J | jnl |
IEICE Trans. Electron.
|
| 2005 | J | jnl |
IEICE Trans. Electron.
|
| 1999 | J | jnl |
IEEE J. Solid State Circuits
|