Felix Palumbo - RankMe

16 papers Journal 6Unranked 10

Year	Rank	Type	Title / Venue / Authors
2026	—	`conf`	Polysilicon Heater Control for Fast and Stable Temperature-Dependent Measurements. LASCAS Nicolas Gabriel Cotti, Lucas Liaño, Felix Palumbo, Andres Kasulin, Juan P. Goyret, Mariano Garcia Inza
2021	—	`conf`	Line Resistance Impact in Memristor-based Multi Layer Perceptron for Pattern Recognition. LASCAS Fernando L. Aguirre, Sebastián Matías Pazos, Felix Palumbo, N. Gomez, Enrique Miranda, Jordi Suñé
2020	J	`jnl`	Application of the Quasi-Static Memdiode Model in Cross-Point Arrays for Large Dataset Pattern Recognition. IEEE Access Fernando Leonel Aguirre, Sebastián Matías Pazos, Felix Palumbo, Jordi Suñé, Enrique Miranda
2019	—	`conf`	Spatio-Temporal Defect Generation Process in Irradiated HfO2 MOS Stacks: Correlated Versus Uncorrelated Mechanisms. IRPS Fernando Leonel Aguirre, Andrea Padovani, Alok Ranjan, Nagarajan Raghavan, Nahuel Vega, Nahuel Muller, Sebastián Matías Pazos, Mario Debray, Joel Molina Reyes, Kin Leong Pey, Felix Palumbo
2018	—	`conf`	Enhanced reliability of hexagonal boron nitride dielectric stacks due to high thermal conductivity. IRPS Xianhu Liang, Bin Yuan, Yuanyuan Shi, Fei Hui, Xu Jing, Mario Lanza, Felix Palumbo
2018	—	`conf`	Heavy Ion Microbeam Experimental Study of ASET on a Full-Custom CMOS OpAmp. SBCCI Andrés Fontana, Sebastián Matías Pazos, Fernando L. Aguirre, Felix Palumbo, Nahuel Vega, Nahuel A. Müller, Emanuel de la Fourniere, Mario Debray
2018	—	`conf`	Impact of forming gas annealing on the degradation dynamics of Ge-based MOS stacks. IRPS Fernando L. Aguirre, Sebastián Matías Pazos, Felix Palumbo, Sivan Fadida, Roy Winter, Moshe Eizenberg
2018	J	`jnl`	Performance-reliability trade-offs in short range RF power amplifier design. Microelectron. Reliab. Sebastián Matías Pazos, Fernando L. Aguirre, Felix Palumbo, Fernando Silveira
2016	J	`jnl`	Influence of gate oxides with high thermal conductivity on the failure distribution of InGaAs-based MOS stacks. Microelectron. Reliab. Felix Palumbo, Salvatore Lombardo, Moshe Eizenberg
2015	—	`conf`	General features of progressive breakdown in gate oxides: A compact model. IRPS Felix Palumbo, Moshe Eizenberg, Salvatore Lombardo
2013	—	`conf`	A dual core low power microcontroller with openMSP430 architecture for high reliability lockstep applications using a 180 nm high voltage technology node. LASCAS Santiago Martin Sondón, Pablo Sergio Mandolesi, Favio R. Masson, Pedro Julián, Felix Palumbo
2013	—	`conf`	Diagnose of radiation induced single event effects in a PLL using a heavy ion microbeam. LATW Santiago Martin Sondón, Alfredo Falcon, Pablo Sergio Mandolesi, Pedro Julián, Nahuel Vega, Francisco Nesprias, Jorge Davidson, Felix Palumbo, Mario Debray
2010	J	`jnl`	Radiation effects in nitride read-only memories. Microelectron. Reliab. Sebania Libertino, Domenico Corso, G. Murè, A. Marino, Felix Palumbo, Fabio Principato, G. Cannella, T. Schillaci, S. Giarusso, F. Celi, Michael Lisiansky, Yakov Roizin, Salvatore Lombardo
2009	—	`conf`	Radiation damage characterization of digital integrated circuits. LATW Santiago Martin Sondón, Pablo Sergio Mandolesi, Pedro Julián, Felix Palumbo, Martin Alurralde, Alberto Filevich
2008	J	`jnl`	A novel approach to characterization of progressive breakdown in high-k/metal gate stacks. Microelectron. Reliab. R. Pagano, Salvatore Lombardo, Felix Palumbo, Paul Kirsch, S. A. Krishnan, Chadwin D. Young, Rino Choi, Gennadi Bersuker, James H. Stathis
2005	J	`jnl`	Structure of the oxide damage under progressive breakdown. Microelectron. Reliab. Felix Palumbo, G. Condorelli, Salvatore Lombardo, Kin Leong Pey, C. H. Tung, L. J. Tang