| Year | Rank | Type | Title / Venue / Authors |
|---|---|---|---|
| 2025 | — | conf |
MODELS-C
|
| 2025 | J | jnl |
CoRR
|
| 2025 | Misc | conf |
BTW
|
| 2024 | J | jnl |
Datenbank-Spektrum
|
| 2018 | Misc | conf |
Efficient generation of parametric test conditions for AMS chips with an interval constraint solver.
VTS
|
| 2017 | — | conf |
MBMV
|
| 2017 | J | jnl |
J. Electron. Test.
|
| 2017 | — | conf |
LATS
|
| 2016 | — | conf |
SC²@SYNASC
|
| 2016 | B | conf |
FMCAD
|
| 2016 | — | conf |
Haifa Verification Conference
|