Felix Beaudoin

33 papers A 1Journal 30Unranked 2
YearRankTypeTitle / Venue / Authors
2025 — conf
Monolithically Integrated High-Performance Ge-on-Si PIN Photodetectors with Nearly 60 GHz EO Bandwidth, 0.95 A/W Responsivity, <30 nA Dark Current and -36 dB Optical Return Loss Enabled by Ge Shape Optimization.
OFC
Yusheng Bian, Abdelsalam Aboketaf, Won Suk Lee, Sujith Chandran, Edgar Huante-Ceron, Arman Najafi, Ana Villafranca, Hatef Shiran, Judson Holt, Francis Afzal, Kevin K. Dezfulian, Michelle Zhang, Brian Popielarski, Ming Gong, Javier Ayala, Patrick Snow, Helen Wong, Qidi Liu, Mrunal Shah, Felix Beaudoin, Frank Pavlik, Crystal Hedges, Frieder Baumann, Michal Rakowski, Takako Hirokawa, Andy Stricker, Oscar Restrepo, Brett Yatzor, Massimo Sorbara, Yahui Xiao, Kyle Murray, Mohammad Karimi, Akram Hajebifard, Prova Christina Gomes, Richard Grzybowski, John Martinho, Yu Zhang, Amit Gupta, Hanyi Ding, Kate McLean, Teodor Stanev, Paul Webster-Pact, Ah Fatt Tong, Prashanth Prasad Raghavendra, Mini Modh Ghosal, Mohamed Gheith, Ian Stobert, Ryan Sweeney, Minghui Zhang, Jonathan Rullan, Feng Chen, Arunima Dasgupta, Jae Rascoe, Andrea Paganini, Alban Zaka, Xinggong Wan, Asli Sahin, Janet Tinkler, Bob Mulfinger, Scott Hildreth, George Gifford, Rainer Gehres, Ryan Sporer, Rick Carter, Vikas Gupta, Ken Giewont, Isabelle Ferain, Ted Letavic
2007 J jnl
Dynamic laser stimulation techniques for advanced failure analysis and design debug applications.
Microelectron. Reliab.
Felix Beaudoin, Kevin Sanchez, Philippe Perdu
2006 J jnl
Application of various optical techniques for ESD defect localization.
Microelectron. Reliab.
Fabien Essely, Frédéric Darracq, Vincent Pouget, Mustapha Remmach, Felix Beaudoin, Nicolas Guitard, Marise Bafleur, Philippe Perdu, André Touboul, Dean Lewis
2005 J jnl
Dynamic Laser Stimulation Case Studies.
Microelectron. Reliab.
Felix Beaudoin, Kevin Sanchez, Romain Desplats, Philippe Perdu, Jean Marc Nicot, J. P. Roux, M. Otte
2005 J jnl
Failure analysis of micro-heating elements suspended on thin membranes.
Microelectron. Reliab.
Danick Briand, Felix Beaudoin, Jérôme Courbat, Nico F. de Rooij, Romain Desplats, Philippe Perdu
2005 J jnl
Impact of semiconductors material on IR Laser Stimulation signal.
Microelectron. Reliab.
Abdellatif Firiti, Felix Beaudoin, Gérald Haller, Philippe Perdu, Dean Lewis, Pascal Fouillat
2005 J jnl
NIR laser stimulation for dynamic timing analysis.
Microelectron. Reliab.
Kevin Sanchez, Romain Desplats, Felix Beaudoin, Philippe Perdu, J. P. Roux, G. Woods, Dean Lewis
2005 J jnl
Oxide charge measurements in EEPROM devices.
Microelectron. Reliab.
C. De Nardi, Romain Desplats, Philippe Perdu, Felix Beaudoin, J.-L. Gauffier
2004 J jnl
Femtosecond Laser Ablation for Backside Silicon Thinning.
Microelectron. Reliab.
Felix Beaudoin, J. López, M. Faucon, Romain Desplats, Philippe Perdu
2004 J jnl
Time Resolved Photon Emission Processing Flow for IC Analysis.
Microelectron. Reliab.
Romain Desplats, Gaël Faggion, Mustapha Remmach, Felix Beaudoin, Philippe Perdu, Dean Lewis
2004 J jnl
Understanding the effects of NIR laser stimulation on NMOS transistor.
Microelectron. Reliab.
Abdellatif Firiti, Felix Beaudoin, Gérald Haller, Philippe Perdu, Dean Lewis, Pascal Fouillat
2003 J jnl
A physical approach on SCOBIC investigation in VLSI.
Microelectron. Reliab.
Thomas Beauchêne, Dean Lewis, Felix Beaudoin, Vincent Pouget, Philippe Perdu, Pascal Fouillat, Yves Danto
2003 J jnl
Faster IC Analysis with PICA Spatial Temporal Photon Correlation and CAD Autochanneling.
Microelectron. Reliab.
Romain Desplats, A. Eral, Felix Beaudoin, Philippe Perdu, Alan J. Weger, Moyra K. McManus, Peilin Song, Franco Stellari
2003 A conf
Fault Localization using Time Resolved Photon Emission and STIL Waveforms.
ITC
Romain Desplats, Felix Beaudoin, Philippe Perdu, Nagamani Nataraj, Ted R. Lundquist, Ketan Shah
2003 J jnl
From Static Thermal and Photoelectric Laser Stimulation (TLS/PLS) to Dynamic Laser Testing.
Microelectron. Reliab.
Felix Beaudoin, Romain Desplats, Philippe Perdu, Abdellatif Firiti, Gérald Haller, Vincent Pouget, Dean Lewis
2003 J jnl
Magnetic emission mapping for passive integrated components characterisation.
Microelectron. Reliab.
Olivier Crépel, Romain Desplats, Y. Bouttement, Philippe Perdu, C. Goupil, Philippe Descamps, Felix Beaudoin, L. Marina
2003 J jnl
Short defect characterization based on TCR parameter extraction.
Microelectron. Reliab.
Abdellatif Firiti, D. Faujour, Gérald Haller, J. M. Moragues, Vincent Goubier, Philippe Perdu, Felix Beaudoin, Dean Lewis
2003 J jnl
Solar Cell Analysis with Light Emission and OBIC Techniques.
Microelectron. Reliab.
Kevin Sanchez, Romain Desplats, Guy Perez, V. Pichetto, Felix Beaudoin, Philippe Perdu
2003 J jnl
TCAD and SPICE modeling help solve ESD protection issues in analog CMOS technology.
Microelectron. Reliab.
David Trémouilles, Géraldine Bertrand, Marise Bafleur, Felix Beaudoin, Philippe Perdu, Nicolas Guitard, Lionel Lescouzères
2003 J jnl
The advent of MEMS in space.
Microelectron. Reliab.
Xavier Lafontan, Francis Pressecq, Felix Beaudoin, Sebastien Rigo, M. Dardalhon, J.-L. Roux, Petra Schmitt, J. Kuchenbecker, B. Baradat, Djemel Lellouchi
2003 J jnl
Thermal laser stimulation and NB-OBIC techniques applied to ESD defect localization.
Microelectron. Reliab.
Thomas Beauchêne, Dean Lewis, Felix Beaudoin, Vincent Pouget, Romain Desplats, Pascal Fouillat, Philippe Perdu, Marise Bafleur, David Trémouilles
2003 J jnl
Time Resolved Photoemission (PICA) - From the Physics to Practical Considerations.
Microelectron. Reliab.
Mustapha Remmach, Romain Desplats, Felix Beaudoin, E. Frances, Philippe Perdu, Dean Lewis
2002 — conf
A 2.5 Gbit/s CMOS optical receiver frontend.
ISCAS (5)
Patrick Mitran, Felix Beaudoin, Mourad N. El-Gamal
2002 J jnl
Backside Defect Localizations and Revelations Techniques on Gallium Arsenide (GaAs) Devices.
Microelectron. Reliab.
Felix Beaudoin, D. Carisetti, Romain Desplats, Philippe Perdu, Dean Lewis, J. C. Clement
2002 J jnl
Backside Hot Spot Detection Using Liquid Crystal Microscopy.
Microelectron. Reliab.
Olivier Crépel, Felix Beaudoin, Lionel Dantas de Morais, Gérald Haller, C. Goupil, Philippe Perdu, Romain Desplats, Dean Lewis
2002 J jnl
Comprehensive failure analysis of leakage faults in bipolar transistors.
Microelectron. Reliab.
Bernadette Domengès, P. Schwindenhammer, Patrick Poirier, Felix Beaudoin, Philippe Descamps
2002 J jnl
IR confocal laser microscopy for MEMS Technological Evaluation.
Microelectron. Reliab.
Djemel Lellouchi, Felix Beaudoin, Christophe Le Touze, Philippe Perdu, Romain Desplats
2002 J jnl
Reliability Defect Monitoring with Thermal Laser Stimulation: Biased Versus Unbiased.
Microelectron. Reliab.
Felix Beaudoin, Gérald Haller, Philippe Perdu, Romain Desplats, Thomas Beauchêne, Dean Lewis
2001 J jnl
A New Versatile Testing Interface for Failure Analysis in Integrated Circuits.
Microelectron. Reliab.
Romain Desplats, Philippe Perdu, Felix Beaudoin
2001 J jnl
Backside Localization of Current Leakage Faults Using Thermal Laser Stimulation.
Microelectron. Reliab.
Romain Desplats, Felix Beaudoin, Philippe Perdu, Patrick Poirier, David Trémouilles, Marise Bafleur, Dean Lewis
2001 J jnl
Front Side and Backside OBIT Mappings applied to Single Event Transient Testing.
Microelectron. Reliab.
Dean Lewis, Vincent Pouget, Thomas Beauchêne, Hervé Lapuyade, Pascal Fouillat, André Touboul, Felix Beaudoin, Philippe Perdu
2001 J jnl
Modeling Thermal Laser Stimulation.
Microelectron. Reliab.
Felix Beaudoin, X. Chauffleur, Jean-Pierre Fradin, Philippe Perdu, Romain Desplats, Dean Lewis
2001 J jnl
Silicon Thinning and Polishing on Packaged Devices.
Microelectron. Reliab.
Felix Beaudoin, Philippe Perdu, Romain Desplats, Sebastien Rigo, Dean Lewis