Felice Crupi

73 papers B 1C 4Journal 47Unranked 21
YearRankTypeTitle / Venue / Authors
2025 C conf
A Multi-Bit PUF Architecture Using a 2T Sub-Threshold Voltage Divider.
ISCAS
Massimo Vatalaro, Raffaele De Rose, Vincenzo Maccaronio, Marco Lanuzza, Felice Crupi
2025 J jnl
C4TERO: Configurable Cascaded Carry Chains for High Reliability TERO PUFs on FPGAs.
IEEE Trans. Circuits Syst. I Regul. Pap.
Fanny Spagnolo, Massimo Vatalaro, Stefania Perri, Felice Crupi, Pasquale Corsonello
2025 — conf
Design of a Temperature-Aware Voltage Generator for 2-Bit Read Operation in STT-MRAM Based SIMPLY Architecture.
ICICDT
Massimo Vatalaro, Vincenzo Maccaronio, Tommaso Zanotti, Erika Borellini, Felice Crupi, Francesco Maria Puglisi, Raffaele De Rose
2025 J jnl
Highly Stable PUFs Based on Stacked Voltage Divider for Near-Zero BER Native Sensitivity to Voltage Variations.
IEEE Trans. Circuits Syst. I Regul. Pap.
Massimo Vatalaro, Raffaele De Rose, Vincenzo Maccaronio, Marco Lanuzza, Felice Crupi
2025 J jnl
Highly Stable Reconfigurable TERO PUF Architecture for Hardware Security Applications.
IEEE Trans. Very Large Scale Integr. Syst.
Kevin Vicuña, Massimo Vatalaro, Frédéric Amiel, Felice Crupi, Lionel Trojman
2025 J jnl
PUF-Based Authentication-Oriented Architecture for Identification Tags.
IEEE Trans. Dependable Secur. Comput.
Antonino Rullo, Carmelo Felicetti, Massimo Vatalaro, Raffaele De Rose, Marco Lanuzza, Felice Crupi, Domenico Saccà
2024 J jnl
Exploring the Usage of Fast Carry Chains to Implement Multistage Ring Oscillators on FPGAs: Design and Characterization.
IEEE Trans. Very Large Scale Integr. Syst.
Fanny Spagnolo, Stefania Perri, Massimo Vatalaro, Fabio Frustaci, Felice Crupi, Pasquale Corsonello
2023 J jnl
Efficiency of Double-Barrier Magnetic Tunnel Junction-Based Digital eNVM Array for Neuro-Inspired Computing.
IEEE Trans. Circuits Syst. II Express Briefs
Tatiana Moposita, Esteban Garzón, Felice Crupi, Lionel Trojman, Andrei Vladimirescu, Marco Lanuzza
2023 J jnl
Experimental analysis of variability in WS
CoRR
Massimo Vatalaro, H. Neill, F. Gity, Paolo Magnone, Vincenzo Maccaronio, C. Márquez, J. C. Galdon, F. Gamiz, Felice Crupi, P. Hurley, Raffaele De Rose
2023 B conf
OSA evaluation by using clinical parameters monitoring system based on Radar Technology.
EWSN
Marco Mercuri, Patrizia Vizza, Pierangelo Veltri, Felice Crupi
2023 J jnl
SIMPLY+: A Reliable STT-MRAM-Based Smart Material Implication Architecture for In-Memory Computing.
IEEE Access
Tatiana Moposita, Esteban Garzón, Raffaele De Rose, Felice Crupi, Andrei Vladimirescu, Lionel Trojman, Marco Lanuzza
2023 J jnl
Voltage Reference With Corner-Aware Replica Selection/Merging for 1.4-mV Accuracy in Harvested Systems Down to 3.9 pW, 0.2 V.
IEEE Access
Luigi Fassio, Longyang Lin, Raffaele De Rose, Marco Lanuzza, Felice Crupi, Massimo Alioto
2022 J jnl
A 0.05 mm², 350 mV, 14 nW Fully-Integrated Temperature Sensor in 180-nm CMOS.
IEEE Trans. Circuits Syst. II Express Briefs
Benjamin Zambrano, Esteban Garzón, Sebastiano Strangio, Felice Crupi, Marco Lanuzza
2022 J jnl
Adjusting Thermal Stability in Double-Barrier MTJ for Energy Improvement in Cryogenic STT-MRAMs.
CoRR
Esteban Garzón, Raffaele De Rose, Felice Crupi, Lionel Trojman, Adam Teman, Marco Lanuzza
2022 J jnl
Analysis of Signal Processing Methods to Reject the DC Offset Contribution of Static Reflectors in FMCW Radar-Based Vital Signs Monitoring.
Sensors
Marco Mercuri, Tom Torfs, Maxim Rykunov, Stefano Laureti, Marco Ricci, Felice Crupi
2022 J jnl
Modified FMCW Scheme for Improved Ultrasonic Positioning and Ranging of Unmanned Ground Vehicles at Distances < 50 mm.
Sensors
Stefano Laureti, Marco Mercuri, David Hutchins, Felice Crupi, Marco Ricci
2022 J jnl
Smart Material Implication Using Spin-Transfer Torque Magnetic Tunnel Junctions for Logic-in-Memory Computing.
CoRR
Raffaele De Rose, Tommaso Zanotti, Francesco Maria Puglisi, Felice Crupi, Paolo Pavan, Marco Lanuzza
2022 — conf
Stability-Area Trade-off in Static CMOS PUF Based on 4T Subthreshold Voltage Divider.
ICECS 2022
Massimo Vatalaro, Raffaele De Rose, Marco Lanuzza, Felice Crupi
2022 J jnl
Static CMOS Physically Unclonable Function Based on 4T Voltage Divider With 0.6%-1.5% Bit Instability at 0.4-1.8 V Operation in 180 nm.
IEEE J. Solid State Circuits
Massimo Vatalaro, Raffaele De Rose, Marco Lanuzza, Felice Crupi
2022 — conf
Voltage-to-Voltage Sigmoid Neuron Activation Function Design for Artificial Neural Networks.
LASCAS
Tatiana Moposita, Lionel Trojman, Felice Crupi, Marco Lanuzza, Andrei Vladimirescu
2021 J jnl
A 0.6-to-1.8V CMOS Current Reference With Near-100% Power Utilization.
IEEE Trans. Circuits Syst. II Express Briefs
Luigi Fassio, Longyang Lin, Raffaele De Rose, Marco Lanuzza, Felice Crupi, Massimo Alioto
2021 — conf
A 3.2-pW, 0.2-V Trimming-Less Voltage Reference with 1.4-mV Across-Wafer Total Accuracy.
ESSCIRC
Luigi Fassio, Longyang Lin, Raffaele De Rose, Marco Lanuzza, Felice Crupi, Massimo Alioto
2021 J jnl
A Robust, High-Speed and Energy-Efficient Ultralow-Voltage Level Shifter.
IEEE Trans. Circuits Syst. II Express Briefs
Luigi Fassio, Francesco Settino, Longyang Lin, Raffaele De Rose, Marco Lanuzza, Felice Crupi, Massimo Alioto
2021 — conf
Exploiting Silicon Fingerprint for Device Authentication Using CMOS-PUF and ECC.
SmartIoT
Carmelo Felicetti, Marco Lanuzza, Antonino Rullo, Domenico Saccà, Felice Crupi
2021 J jnl
Trimming-Less Voltage Reference for Highly Uncertain Harvesting Down to 0.25 V, 5.4 pW.
IEEE J. Solid State Circuits
Luigi Fassio, Longyang Lin, Raffaele De Rose, Marco Lanuzza, Felice Crupi, Massimo Alioto
2020 — conf
A 0.25-V, 5.3-pW Voltage Reference with 25-μV/°C Temperature Coefficient, 140-μV/V Line Sensitivity and 2, 200-μm
VLSI Circuits
Luigi Fassio, Longyang Lin, Raffaele De Rose, Marco Lanuzza, Felice Crupi, Massimo Alioto
2020 J jnl
Assessment of STT-MRAMs based on double-barrier MTJs for cache applications by means of a device-to-system level simulation framework.
Integr.
Esteban Garzón, Raffaele De Rose, Felice Crupi, Lionel Trojman, Giovanni Finocchio, Mario Carpentieri, Marco Lanuzza
2019 — conf
An Energy Aware Variation-Tolerant Writing Termination Control for STT-based Non Volatile Flip-Flops.
ICECS
Marco Lanuzza, Raffaele De Rose, Felice Crupi, Massimo Alioto
2019 — conf
Characterization and Modeling of BTI in SiC MOSFETs.
ESSDERC
Davide Cornigli, Andrea Natale Tallarico, Susanna Reggiani, Claudio Fiegna, Enrico Sangiorgi, Luis Sanchez, Carlos Valdivieso, Giuseppe Consentino, Felice Crupi
2019 — conf
Device-to-System Level Simulation Framework for STT-DMTJ Based Cache Memory.
ICECS
Esteban Garzón, Raffaele De Rose, Felice Crupi, Marco Lanuzza
2019 — conf
Evaluating the Energy Efficiency of STT-MRAMs Based on Perpendicular MTJs with Double Reference Layers.
ASICON
Marco Lanuzza, Raffaele De Rose, Esteban Garzón, Felice Crupi
2019 — conf
Exploiting Double-Barrier MTJs for Energy-Efficient Nanoscaled STT-MRAMs.
SMACD
Esteban Garzón, Raffaele De Rose, Felice Crupi, Lionel Trojman, Giovanni Finocchio, Mario Carpentieri, Marco Lanuzza
2019 — conf
Making IoT Services Accountable: A Solution Based on Blockchain and Physically Unclonable Functions.
IDCS
Carmelo Felicetti, Angelo Furfaro, Domenico Saccà, Massimo Vatalaro, Marco Lanuzza, Felice Crupi
2018 J jnl
A Variation-Aware Timing Modeling Approach for Write Operation in Hybrid CMOS/STT-MTJ Circuits.
IEEE Trans. Circuits Syst. I Regul. Pap.
Raffaele De Rose, Marco Lanuzza, Felice Crupi, Giulio Siracusano, Riccardo Tomasello, Giovanni Finocchio, Mario Carpentieri, Massimo Alioto
2018 J jnl
A portable class of 3-transistor current references with low-power sub-0.5 V operation.
Int. J. Circuit Theory Appl.
Felice Crupi, Raffaele De Rose, Maksym Paliy, Marco Lanuzza, Mattia Perna, Giuseppe Iannaccone
2018 — conf
Design of a 3T current reference for low-voltage, low-power operation.
ICICDT
Raffaele De Rose, Felice Crupi, Maksym Paliy, Marco Lanuzza, Giuseppe Iannaccone
2018 — conf
Impact of the Emitter Contact Pattern in c-Si BC- BJ Solar Cells by Numerical Simulations.
RTSI
Noemi Guerra, Raffaele De Rose, Marco Guevara, Paul Procel, Marco Lanuzza, Felice Crupi
2017 J jnl
A physical unclonable function based on a 2-transistor subthreshold voltage divider.
Int. J. Circuit Theory Appl.
Raffaele De Rose, Felice Crupi, Marco Lanuzza, Domenico Albano
2017 C conf
A variation-aware simulation framework for hybrid CMOS/spintronic circuits.
ISCAS
Raffaele De Rose, Marco Lanuzza, Felice Crupi, Giulio Siracusano, Riccardo Tomasello, Giovanni Finocchio, Mario Carpentieri, Massimo Alioto
2017 J jnl
An Ultralow-Voltage Energy-Efficient Level Shifter.
IEEE Trans. Circuits Syst. II Express Briefs
Marco Lanuzza, Felice Crupi, Sandro Rao, Raffaele De Rose, Sebastiano Strangio, Giuseppe Iannaccone
2017 — conf
Design of a sub-1-V nanopower CMOS current reference.
ECCTD
Raffaele De Rose, Domenico Albano, Felice Crupi, Marco Lanuzza
2017 — conf
Impact of voltage scaling on STT-MRAMs through a variability-aware simulation framework.
SMACD
Raffaele De Rose, Greta Carangelo, Marco Lanuzza, Felice Crupi, Giovanni Finocchio, Mario Carpentieri
2017 J jnl
Low energy/delay overhead level shifter for wide-range voltage conversion.
Int. J. Circuit Theory Appl.
Marco Lanuzza, Felice Crupi, Sandro Rao, Raffaele De Rose, Giuseppe Iannaccone
2015 J jnl
A Sub-kT/q Voltage Reference Operating at 150 mV.
IEEE Trans. Very Large Scale Integr. Syst.
Domenico Albano, Felice Crupi, Francesca Cucchi, Giuseppe Iannaccone
2015 J jnl
A sub-1 V nanopower temperature-compensated sub-threshold CMOS voltage reference with 0.065%/V line sensitivity.
Int. J. Circuit Theory Appl.
Luca Magnelli, Felice Crupi, Pasquale Corsonello, Giuseppe Iannaccone
2015 J jnl
Gate-level body biasing for subthreshold logic circuits: analytical modeling and design guidelines.
Int. J. Circuit Theory Appl.
Domenico Albano, Marco Lanuzza, Ramiro Taco, Felice Crupi
2015 — conf
Origins and implications of increased channel hot carrier variability in nFinFETs.
IRPS
Ben Kaczer, Jacopo Franco, M. Cho, Tibor Grasser, Philippe J. Roussel, Stanislav Tyaginov, M. Bina, Yannick Wimmer, Luis-Miguel Procel, Lionel Trojman, Felice Crupi, Gregory Pitner, Vamsi Putcha, Pieter Weckx, Erik Bury, Z. Ji, An De Keersgieter, Thomas Chiarella, Naoto Horiguchi, Guido Groeseneken, Aaron Thean
2014 J jnl
A picopower temperature-compensated, subthreshold CMOS voltage reference.
Int. J. Circuit Theory Appl.
Domenico Albano, Felice Crupi, Francesca Cucchi, Giuseppe Iannaccone
2014 — conf
Analysis of TFET based 6T SRAM cells implemented with state of the art silicon nanowires.
ESSDERC
Sebastiano Strangio, Pierpaolo Palestri, David Esseni, Luca Selmi, Felice Crupi
2014 J jnl
Design of a 75-nW, 0.5-V subthreshold complementary metal-oxide-semiconductor operational amplifier.
Int. J. Circuit Theory Appl.
Luca Magnelli, Francesco A. Amoroso, Felice Crupi, Gregorio Cappuccino, Giuseppe Iannaccone
2013 — conf
Impact of Al2O3 position on performances and reliability in high-k metal gated DRAM periphery transistors.
ESSDERC
Marc Aoulaiche, Eddy Simoen, Romain Ritzenthaler, Tom Schram, Hiroaki Arimura, Moonju Cho, Thomas Kauerauf, Guido Groeseneken, Naoto Horiguchi, Aaron Thean, Antonio Federico, Felice Crupi, Alessio Spessot, Christian Caillat, Pierre Fazan, Hyuokju Na, Y. Son, K. B. Noh
2012 J jnl
A methodology to account for the finger interruptions in solar cell performance.
Microelectron. Reliab.
Raffaele De Rose, Antonio Malomo, Paolo Magnone, Felice Crupi, Giorgio Cellere, Marco Martire, Diego Tonini, Enrico Sangiorgi
2012 J jnl
BTI reliability of ultra-thin EOT MOSFETs for sub-threshold logic.
Microelectron. Reliab.
Jacopo Franco, S. Graziano, Ben Kaczer, Felice Crupi, Lars-Åke Ragnarsson, Tibor Grasser, Guido Groeseneken
2012 J jnl
Buried Silicon-Germanium pMOSFETs: Experimental Analysis in VLSI Logic Circuits Under Aggressive Voltage Scaling.
IEEE Trans. Very Large Scale Integr. Syst.
Felice Crupi, Massimo Alioto, Jacopo Franco, Paolo Magnone, Ben Kaczer, Guido Groeseneken, Jérôme Mitard, Liesbeth Witters, Thomas Y. Hoffmann
2012 — conf
Low-frequency noise assessment of the transport mechanisms in SiGe channel bulk FinFETs.
ESSDERC
Tommaso Romeo, Luigi Pantisano, Eddy Simoen, Raymond Krom, Mitsuhiro Togo, N. Horiguchi, Jérôme Mitard, Aaron Thean, Guido Groeseneken, Cor Claeys, Felice Crupi
2012 — conf
Superior reliability and reduced Time-Dependent variability in high-mobility SiGe channel pMOSFETs for VLSI logic applications.
ICICDT
Jacopo Franco, Ben Kaczer, Jérôme Mitard, Maria Toledano-Luque, Felice Crupi, Geert Eneman, Ph. J. Rousse, Tibor Grasser, M. Cho, Thomas Kauerauf, Liesbeth Witters, Geert Hellings, L.-Å. Ragnarsson, Naoto Horiguchi, Marc M. Heyns, Guido Groeseneken
2012 J jnl
Understanding the Basic Advantages of Bulk FinFETs for Sub- and Near-Threshold Logic Circuits From Device Measurements.
IEEE Trans. Circuits Syst. II Express Briefs
Felice Crupi, Massimo Alioto, Jacopo Franco, Paolo Magnone, Mitsuhiro Togo, N. Horiguchi, Guido Groeseneken
2011 J jnl
A 2.6 nW, 0.45 V Temperature-Compensated Subthreshold CMOS Voltage Reference.
IEEE J. Solid State Circuits
Luca Magnelli, Felice Crupi, Pasquale Corsonello, Calogero Pace, Giuseppe Iannaccone
2011 C conf
Experimental analysis of buried SiGe pMOSFETs from the perspective of aggressive voltage scaling.
ISCAS
Felice Crupi, Massimo Alioto, Jacopo Franco, Paolo Magnone, Ben Kaczer, Guido Groeseneken, Jérôme Mitard, Liesbeth Witters, Thomas Y. Hoffmann
2011 J jnl
Understanding the Potential and the Limits of Germanium pMOSFETs for VLSI Circuits From Experimental Measurements.
IEEE Trans. Very Large Scale Integr. Syst.
Paolo Magnone, Felice Crupi, Massimo Alioto, Ben Kaczer, Brice De Jaeger
2010 C conf
Experimental study of leakage-delay trade-off in Germanium pMOSFETs for logic circuits.
ISCAS
Paolo Magnone, Felice Crupi, Massimo Alioto, Ben Kaczer
2009 J jnl
Cross-correlation-based trans-impedance amplifier for current noise measurements.
Int. J. Circuit Theory Appl.
Gino Giusi, Calogero Pace, Felice Crupi
2009 J jnl
Full Model and Characterization of Noise in Operational Amplifier.
IEEE Trans. Circuits Syst. I Regul. Pap.
Gino Giusi, Felice Crupi, Calogero Pace, Paolo Magnone
2008 J jnl
Detection and Classification of Single-Electron Jumps in Si Nanocrystal Memories.
IEEE Trans. Instrum. Meas.
Calogero Pace, Gino Giusi, Felice Crupi, Salvatore Lombardo
2007 J jnl
A New Circuit Topology for the Realization of Very Low-Noise Wide-Bandwidth Transimpedance Amplifier.
IEEE Trans. Instrum. Meas.
Carmine Ciofi, Felice Crupi, Calogero Pace, Graziella Scandurra, Maurizio Patane
2007 J jnl
Interfacial layer quality effects on low-frequency noise (1/f) in p-MOSFETs with advanced gate stacks.
Microelectron. Reliab.
Paolo Srinivasan, Felice Crupi, Eddy Simoen, Paolo Magnone, Calogero Pace, Durga Misra, Cor Claeys
2007 J jnl
Low frequency noise in nMOSFETs with subnanometer EOT hafnium-based gate dielectrics.
Microelectron. Reliab.
Paolo Magnone, Calogero Pace, Felice Crupi, Gino Giusi
2006 J jnl
Enhanced sensitivity cross-correlation method for voltage noise measurements.
IEEE Trans. Instrum. Meas.
Felice Crupi, Gino Giusi, Carmine Ciofi, Calogero Pace
2006 J jnl
How to enlarge the bandwidth without increasing the noise in OP-AMP-based transimpedance amplifier.
IEEE Trans. Instrum. Meas.
Carmine Ciofi, Felice Crupi, Calogero Pace, Graziella Scandurra
2004 J jnl
Extraction of the trap distribution responsible for SILCs in MOS structures from the measurements and simulations of DC and noise properties.
Microelectron. Reliab.
A. Nannipieri, Giuseppe Iannaccone, Felice Crupi
2003 J jnl
Micro-prober for wafer-level low-noise measurements in MOS devices.
IEEE Trans. Instrum. Meas.
Carmine Ciofi, Felice Crupi, Calogero Pace, Graziella Scandurra
2003 J jnl
Very low-noise, high-accuracy programmable voltage reference.
IEEE Trans. Instrum. Meas.
Calogero Pace, Carmine Ciofi, Felice Crupi
2002 J jnl
A new method for high-sensitivity noise measurements.
IEEE Trans. Instrum. Meas.
Carmine Ciofi, Felice Crupi, Calogero Pace