| Year | Rank | Type | Title / Venue / Authors |
|---|---|---|---|
| 2025 | J | jnl |
IEEE Access
|
| 2025 | J | jnl |
Intell. Data Anal.
|
| 2025 | J | jnl |
Neurocomputing
|
| 2025 | J | jnl |
Knowl. Inf. Syst.
|
| 2024 | J | jnl |
Knowl. Inf. Syst.
|
| 2024 | — | conf |
NAACL-HLT (Findings)
|
| 2023 | J | jnl |
J. Intell. Fuzzy Syst.
|
| 2023 | J | jnl |
CoRR
|
| 2023 | J | jnl |
Electron. Commer. Res.
|
| 2022 | J | jnl |
CoRR
|
| 2021 | J | jnl |
CoRR
|
| 2021 | J | jnl |
Entropy
|
| 2020 | J | jnl |
Entropy
|
| 2020 | J | jnl |
Axioms
|
| 2016 | J | jnl |
BMC Genom.
|
| 2016 | J | jnl |
J. Electron. Test.
|
| 2012 | J | jnl |
Microelectron. Reliab.
|
| 2012 | J | jnl |
Microelectron. Reliab.
|
| 2012 | J | jnl |
Microelectron. Reliab.
|
| 2010 | J | jnl |
Microelectron. Reliab.
|
| 2010 | J | jnl |
Modeling the effect of barrier thickness and low-k dielectric on circuit reliability using 3D model.
Microelectron. Reliab.
|