| Year | Rank | Type | Title / Venue / Authors |
|---|---|---|---|
| 2025 | J | jnl |
Eng. Appl. Artif. Intell.
|
| 2025 | J | jnl |
CoRR
|
| 2025 | J | jnl |
IEEE Trans. Instrum. Meas.
|
| 2025 | J | jnl |
Eng. Appl. Artif. Intell.
|
| 2025 | — | conf |
ICCVW
|
| 2024 | J | jnl |
IEEE Trans. Instrum. Meas.
|
| 2024 | — | conf |
ECCV (76)
|
| 2024 | J | jnl |
CoRR
|
| 2024 | — | conf |
ICPR (9)
|
| 2024 | — | conf |
ECCV (69)
|
| 2024 | J | jnl |
CoRR
|
| 2023 | — | conf |
CVPR Workshops
|
| 2023 | J | jnl |
CoRR
|
| 2023 | J | jnl |
CoRR
|
| 2023 | J | jnl |
IEEE Trans. Instrum. Meas.
|
| 2023 | J | jnl |
CoRR
|
| 2023 | J | jnl |
CoRR
|
| 2023 | — | conf |
Unsupervised Automatic Defect Inspection based on Image Matching and Local One-class Classification.
CVPR Workshops
|
| 2022 | — | conf |
CASE
|
| 2021 | J | jnl |
IEEE Trans. Instrum. Meas.
|
| 2021 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2021 | J | jnl |
Pattern Recognit.
|
| 2018 | — | conf |
CASE
|
| 2018 | J | jnl |
Int. J. Autom. Comput.
|
| 2018 | J | jnl |
IEEE Trans. Syst. Man Cybern. Syst.
|
| 2017 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2016 | — | conf |
CASE
|