| Year | Rank | Type | Title / Venue / Authors |
|---|---|---|---|
| 2024 | — | conf |
ICAIP
|
| 2024 | — | conf |
DSIT
|
| 2023 | — | conf |
M2VIP
|
| 2023 | J | jnl |
Eng. Comput.
|
| 2023 | — | conf |
AAIA
|
| 2022 | C | conf |
ICMV
|
| 2022 | J | jnl |
Eng. Comput.
|
| 2022 | J | jnl |
Math. Comput. Simul.
|
| 2022 | J | jnl |
Pattern Anal. Appl.
|
| 2022 | J | jnl |
Error Calibration Method Based on Perspective Mapping for Wafer Automatic Optical Inspection System.
IEEE Trans. Instrum. Meas.
|
| 2021 | — | conf |
IPMV
|
| 2021 | — | conf |
ISCSIC
|
| 2020 | — | conf |
CSAE
|
| 2016 | J | jnl |
IET Image Process.
|