Fausto Fantini

16 papers Journal 15
YearRankTypeTitle / Venue / Authors
2013 J jnl
Impact of field-plate geometry on the reliability of GaN-on-SiC HEMTs.
Microelectron. Reliab.
Alessandro Chini, Fabio Soci, Fausto Fantini, A. Nanni, A. Pantellini, Claudio Lanzieri, Gaudenzio Meneghesso, Enrico Zanoni
2012 J jnl
Field plate related reliability improvements in GaN-on-Si HEMTs.
Microelectron. Reliab.
Alessandro Chini, Fabio Soci, Fausto Fantini, Antonio Nanni, Alessio Pantellini, Claudio Lanzieri, Davide Bisi, Gaudenzio Meneghesso, Enrico Zanoni
2010 J jnl
Analysis of current collapse effect in AlGaN/GaN HEMT: Experiments and numerical simulations.
Microelectron. Reliab.
Mustapha Faqir, Mohsine Bouya, Nathalie Malbert, Nathalie Labat, D. Carisetti, Benoit Lambert, Giovanni Verzellesi, Fausto Fantini
2010 J jnl
Experimental and simulated dc degradation of GaN HEMTs by means of gate-drain and gate-source reverse bias stress.
Microelectron. Reliab.
Valerio Di Lecce, Michele Esposto, Matteo Bonaiuti, Gaudenzio Meneghesso, Enrico Zanoni, Fausto Fantini, Alessandro Chini
2008 J jnl
Sulfur-contamination of high power white LED.
Microelectron. Reliab.
Giovanna Mura, G. Cassanelli, Fausto Fantini, Massimo Vanzi
2007 J jnl
Characterization and analysis of trap-related effects in AlGaN-GaN HEMTs.
Microelectron. Reliab.
Mustapha Faqir, Giovanni Verzellesi, Fausto Fantini, Francesca Danesin, Fabiana Rampazzo, Gaudenzio Meneghesso, Enrico Zanoni, Anna Cavallini, Antonio Castaldini, Nathalie Labat, André Touboul, Christian Dua
2006 J jnl
Failure Analysis-assisted FMEA.
Microelectron. Reliab.
G. Cassanelli, Giovanna Mura, Fausto Fantini, Massimo Vanzi, Bernard Plano
2005 J jnl
Reliability predictions in electronic industrial applications.
Microelectron. Reliab.
G. Cassanelli, Giovanna Mura, F. Cesaretti, Massimo Vanzi, Fausto Fantini
2004 J jnl
Failure Analysis of RuO
Microelectron. Reliab.
Simona Podda, G. Cassanelli, Fausto Fantini, Massimo Vanzi
2003 J jnl
High Electric Field Induced Degradation of the DC Characteristics in Si/SiGe HEMT's.
Microelectron. Reliab.
J. Kuchenbecker, Mattia Borgarino, M. Zeuner, U. König, Robert Plana, Fausto Fantini
2003 J jnl
Reliability in automotive electronics: a case study applied to diesel engine control.
Microelectron. Reliab.
G. Cassanelli, Fausto Fantini, G. Serra, S. Sgatti
2002 J jnl
Degradation Based Long-Term Reliability Assessment for Electronic Components in Submarine Applications.
Microelectron. Reliab.
V. Lista, P. Garbossa, T. Tomasi, Mattia Borgarino, Fausto Fantini, L. Gherardi, A. Righetti, M. Villa
2002 J jnl
Editorial.
Microelectron. Reliab.
Fausto Fantini, Massimo Vanzi
2001 J jnl
Reliability physics of compound semiconductor transistors for microwave applications.
Microelectron. Reliab.
Mattia Borgarino, Roberto Menozzi, Domenico Dieci, Laura Cattani, Fausto Fantini
1990 J jnl
VLSI reliability: Contributions from a three year national research program.
Eur. Trans. Telecommun.
Giovanni Soncini, Claudio Canali, Enrico Zanoni, Francrsco Cors, Alessandro Diligenti, Fausto Fantini, Vito A. Monaco, Guido Masetti, Carlo Morandi
1989 — ch.
A Foveated Retina-Like Sensor Using CCD Technology.
Analog VLSI Implementation of Neural Systems
Jan Van der Spiegel, G. Kreider, C. Claeys, I. Debusschere, Giulio Sandini, Paolo Dario, Fausto Fantini, P. Bellutti, Giovanni Soncini