Farzin Karimi

11 papers A 1Journal 3Unranked 7
YearRankTypeTitle / Venue / Authors
2008 — conf
Applications of decorator and observer design patterns in functional verification.
HLDVT
Farzin Karimi
2004 J jnl
Using data compression in automatic test equipment for system-on-chip testing.
IEEE Trans. Instrum. Meas.
Farzin Karimi, Zainalabedin Navabi, Waleed Meleis, Fabrizio Lombardi
2003 A conf
Hybrid Multisite Testing at Manufacturing.
ITC
Hamidreza Hashempour, Fred J. Meyer, Fabrizio Lombardi, Farzin Karimi
2003 J jnl
Parallel testing of multi-port static random access memories.
Microelectron. J.
Farzin Karimi, V. Swamy Irrinki, T. Crosby, Nohpill Park, Fabrizio Lombardi
2002 — conf
A Scan-Bist Environment for Testing Embedded Memories.
IOLTW
Farzin Karimi, Fabrizio Lombardi
2002 — conf
A Scan-Bist Environment for Testing Embedded Memories.
MTDT
Farzin Karimi, Fabrizio Lombardi
2002 — conf
Data Compression for System-on-Chip Testing Using ATE.
DFT
Farzin Karimi, Waleed Meleis, Zainalabedin Navabi, Fabrizio Lombardi
2002 — conf
Random Testing of Multi-Port Static Random Access Memories.
MTDT
Farzin Karimi, Fred J. Meyer, Fabrizio Lombardi
2001 — conf
A Parallel Approach for Testing Multi-Port Static Random Access Memories.
MTDT
Farzin Karimi, Fabrizio Lombardi, V. Swamy Irrinki, T. Crosby
2001 J jnl
Fault Detection in a Tristate System Environment.
IEEE Micro
Wenyi Feng, Farzin Karimi, Fabrizio Lombardi
2001 — conf
Parallel Testing of Multi-port Static Random Access Memories for BIST.
DFT
Farzin Karimi, Fabrizio Lombardi