| Year | Rank | Type | Title / Venue / Authors |
|---|---|---|---|
| 2026 | J | jnl |
Int. J. Intell. Syst.
|
| 2026 | J | jnl |
Knowl. Based Syst.
|
| 2025 | J | jnl |
J. Electron. Test.
|
| 2023 | J | jnl |
J. Electronic Imaging
|
| 2022 | J | jnl |
Vis. Comput.
|
| 2022 | J | jnl |
Vis. Comput.
|
| 2022 | J | jnl |
J. Electronic Imaging
|
| 2019 | J | jnl |
Comput. J.
|
| 2018 | J | jnl |
Int. J. Next Gener. Comput.
|
| 2017 | J | jnl |
Pattern Anal. Appl.
|
| 2016 | — | conf |
SIU
|
| 2015 | — | — |