| Year | Rank | Type | Title / Venue / Authors |
|---|---|---|---|
| 2021 | — | conf |
BECB
|
| 2020 | J | jnl |
IEEE Access
|
| 2019 | J | jnl |
IEEE Access
|
| 2018 | J | jnl |
Frontiers Inf. Technol. Electron. Eng.
|
| 2016 | B | conf |
KES
|
| 2015 | B | conf |
KES
|
| 2009 | A | conf |
IROS
|
| 2008 | J | jnl |
Eng. Appl. Artif. Intell.
|
| 2008 | Misc | conf |
HAIS
|
| 2005 | J | jnl |
Eng. Appl. Artif. Intell.
|
| 2005 | J | jnl |
IEEE Trans. Syst. Man Cybern. Part B
|
| 2005 | J | jnl |
Electron. Commer. Res. Appl.
|
| 2005 | J | jnl |
Pattern Recognit. Lett.
|
| 2004 | J | jnl |
Electron. Commer. Res. Appl.
|
| 2004 | J | jnl |
IEEE Trans. Syst. Man Cybern. Part B
|
| 2004 | J | jnl |
Appl. Soft Comput.
|
| 2004 | J | jnl |
Int. J. Comput. Intell. Appl.
|
| 2004 | J | jnl |
J. Res. Pract. Inf. Technol.
|
| 2004 | J | jnl |
Int. J. Intell. Syst.
|
| 2003 | J | jnl |
Int. J. Intell. Syst.
|
| 2002 | J | jnl |
Int. J. Inf. Technol. Decis. Mak.
|
| 2002 | — | conf |
IMSA
|
| 2002 | J | jnl |
Electron. Commer. Res. Appl.
|
| 2001 | B | conf |
SMC
|
| 2001 | B | conf |
CEC
|