| Year | Rank | Type | Title / Venue / Authors |
|---|---|---|---|
| 2026 | J | jnl |
CoRR
|
| 2025 | J | jnl |
Qual. Reliab. Eng. Int.
|
| 2024 | J | jnl |
Qual. Reliab. Eng. Int.
|
| 2024 | A | conf |
IROS
|
| 2024 | J | jnl |
CoRR
|
| 2024 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2023 | — | conf |
HCI (32)
|
| 2023 | J | jnl |
Reliab. Eng. Syst. Saf.
|
| 2023 | — | conf |
INFOCOM Workshops
|
| 2023 | — | conf |
I2MTC
|
| 2022 | J | jnl |
Sensors
|
| 2021 | J | jnl |
IEEE Trans. Ind. Informatics
|
| 2021 | J | jnl |
CoRR
|
| 2021 | — | conf |
CNS
|
| 2021 | J | jnl |
CoRR
|
| 2021 | J | jnl |
Reliab. Eng. Syst. Saf.
|
| 2021 | J | jnl |
Reliab. Eng. Syst. Saf.
|
| 2021 | J | jnl |
Complex.
|
| 2020 | J | jnl |
CoRR
|
| 2020 | J | jnl |
Appl. Soft Comput.
|
| 2020 | J | jnl |
IEEE Trans. Ind. Informatics
|
| 2020 | J | jnl |
Neurocomputing
|
| 2020 | B | conf |
NSS
|
| 2020 | B | conf |
NSS
|
| 2020 | J | jnl |
Sensors
|
| 2020 | A | conf |
ECAI
|
| 2020 | J | jnl |
Remote. Sens.
|
| 2019 | J | jnl |
IEEE Access
|
| 2019 | J | jnl |
IEEE Access
|
| 2019 | J | jnl |
IEEE Access
|
| 2019 | J | jnl |
Complex.
|
| 2019 | J | jnl |
IEEE Access
|
| 2018 | — | conf |
SCIS&ISIS
|
| 2017 | J | jnl |
Microelectron. Reliab.
|
| 2017 | J | jnl |
Microelectron. Reliab.
|
| 2017 | J | jnl |
Microelectron. Reliab.
|
| 2016 | J | jnl |
IEEE Trans. Instrum. Meas.
|
| 2010 | — | conf |
IALP
|
| 2010 | — | conf |
ICIMCS
|