Fabrice Caignet

11 papers Journal 10Unranked 1
YearRankTypeTitle / Venue / Authors
2024 — conf
Analysis of Operational Amplifier Susceptibility to Multifrequency Disturbance.
EMC Compo
A. Boyer, Fabrice Caignet
2021 J jnl
Closed-Form Expressions of Electric and Magnetic Near-Fields for the Calibration of Near-Field Probes.
IEEE Trans. Instrum. Meas.
Alexandre Boyer, Nicolas Nolhier, Fabrice Caignet, Sonia Ben Dhia
2017 J jnl
Prediction of LIN communication robustness against EFT events using dedicated failure models.
Microelectron. Reliab.
Frédéric Escudié, Fabrice Caignet, Nicolas Nolhier, Marise Bafleur
2016 J jnl
Impact of non-linear capacitances on transient waveforms during system level ESD stress.
Microelectron. Reliab.
Frédéric Escudié, Fabrice Caignet, Nicolas Nolhier, Marise Bafleur
2015 J jnl
20 GHz on-chip measurement of ESD waveform for system level analysis.
Microelectron. Reliab.
Fabrice Caignet, Nicolas Nolhier, Marise Bafleur, A. Wang, Nicolas Mauran
2014 J jnl
Reliability of ESD protection devices designed in a 3D technology.
Microelectron. Reliab.
Bertrand Courivaud, Nicolas Nolhier, Gilles Ferru, Marise Bafleur, Fabrice Caignet
2013 J jnl
Building-up of system level ESD modeling: Impact of a decoupling capacitance on ESD propagation.
Microelectron. Reliab.
Nicolas Monnereau, Fabrice Caignet, David Trémouilles, Nicolas Nolhier, Marise Bafleur
2013 J jnl
On-chip measurement to analyze failure mechanisms of ICs under system level ESD stress.
Microelectron. Reliab.
Fabrice Caignet, Nicolas Nolhier, Marise Bafleur, A. Wang, Nicolas Mauran
2008 J jnl
Comparison among emission and susceptibility reduction techniques for electromagnetic interference in digital integrated circuits.
Microelectron. J.
Ali Alaeldine, Nicolas Lacrampe, Alexandre Boyer, Richard Perdriau, Fabrice Caignet, Mohammed Ramdani, Etienne Sicard, M'hamed Drissi
2001 J jnl
The challenge of signal integrity in deep-submicrometer CMOS technology.
Proc. IEEE
Fabrice Caignet, Sonia Delmas-Bendhia, Etienne Sicard
2000 J jnl
On the measurement of crosstalk in integrated circuits.
IEEE Trans. Very Large Scale Integr. Syst.
Fabrice Caignet, S. D.-B. Dhia, Etienne Sicard