Fabio Coccetti

20 papers Journal 17Unranked 3
YearRankTypeTitle / Venue / Authors
2017 — conf
200 mm Wafer level graphene transfer by wafer bonding technique.
ESSDERC
Mesut Inac, Grzegorz Lupina, Matthias Wietstruck, Marco Lisker, Mirko Fraschke, Andreas Mai, Fabio Coccetti, Mehmet Kaynak
2015 J jnl
Large electromagnetic simulation by hybrid approach on large-scale parallel computing systems.
Concurr. Comput. Pract. Exp.
Mihai Alexandru, Thierry Monteil, Petr Lorenz, Fabio Coccetti, Hervé Aubert
2013 J jnl
Failure analysis and detection methodology for capacitive RF-MEMS switches based on BEOL BiCMOS process.
Microelectron. Reliab.
Nuria Torres Matabosch, Fabio Coccetti, Mehmet Kaynak, Beatrice Espana, Bernd Tillack, Jean-Louis Cazaux
2012 J jnl
An Accelerated Stress Test Method for Electrostatically Driven MEMS Devices.
IEEE Trans. Instrum. Meas.
Jinyu Jason Ruan, Nicolas Monnereau, David Trémouilles, Nicolas Mauran, Fabio Coccetti, Nicolas Nolhier, Robert Plana
2012 J jnl
Estimation of RF performance from LF measurements: Towards the design for reliability in RF-MEMS.
Microelectron. Reliab.
Nuria Torres Matabosch, Mehmet Kaynak, Fabio Coccetti, Matthias Wietstruck, Bernd Tillack, Jean Louis Cazaux
2012 — conf
Large electromagnetic problem on large scale parallel computing systems.
HPCS
Mihai Alexandru, Thierry Monteil, Fabio Coccetti, Hervé Aubert, Petr Lorenz
2011 J jnl
Erratum to "On the reliability of electrostatic NEMS/MEMS devices: Review of present knowledge on the dielectric charging and stiction failure mechanisms and novel characterization methodologies" [MR 51/9-11 (2011) 1810-1818].
Microelectron. Reliab.
Usama Zaghloul, George J. Papaioannou, Bharat Bhushan, Fabio Coccetti, Patrick Pons, Robert Plana
2011 J jnl
On the reliability of electrostatic NEMS/MEMS devices: Review of present knowledge on the dielectric charging and stiction failure mechanisms and novel characterization methodologies.
Microelectron. Reliab.
Usama Zaghloul, George J. Papaioannou, Bharat Bhushan, Fabio Coccetti, Patrick Pons, Robert Plana
2010 J jnl
Assessment of dielectric charging in electrostatically driven MEMS devices: A comparison of available characterization techniques.
Microelectron. Reliab.
Usama Zaghloul, Matroni Koutsoureli, H. Wang, Fabio Coccetti, George J. Papaioannou, Patrick Pons, Robert Plana
2010 J jnl
Life expectancy and characterization of capacitive RF MEMS switches.
Microelectron. Reliab.
Mohamed Matmat, K. Koukos, Fabio Coccetti, T. Idda, Antoine Marty, Christophe Escriba, Jean-Yves Fourniols, Daniel Estève
2009 J jnl
Accelerated lifetime test of RF-MEMS switches under ESD stress.
Microelectron. Reliab.
Jinyu Jason Ruan, Nicolas Nolhier, George J. Papaioannou, David Trémouilles, Vincent Puyal, C. Villeneuve, T. Idda, Fabio Coccetti, Robert Plana
2009 J jnl
Capacitive RF MEMS analytical predictive reliability and lifetime characterization.
Microelectron. Reliab.
Mohamed Matmat, Fabio Coccetti, Antoine Marty, Robert Plana, Christophe Escriba, Jean-Yves Fourniols, Daniel Estève
2009 — conf
Deployment and management of large planar reflectarray antennas simulation on grid.
CLADE@HPDC
Rémi Sharrock, Fadi Khalil, Thierry Monteil, Hervé Aubert, Fabio Coccetti, Patricia Stolf, Laurent Broto, Robert Plana
2009 J jnl
Dielectric charging in silicon nitride films for MEMS capacitive switches: Effect of film thickness and deposition conditions.
Microelectron. Reliab.
Usama Zaghloul, George J. Papaioannou, Fabio Coccetti, Patrick Pons, Robert Plana
2009 J jnl
Three-Dimensional RF MEMS Switch for Power Applications.
IEEE Trans. Ind. Electron.
Joo-Young Choi, Jinyu Jason Ruan, Fabio Coccetti, Stepan Lucyszyn
2008 J jnl
Alpha particle radiation effects in RF MEMS capacitive switches.
Microelectron. Reliab.
Jinyu Jason Ruan, E. Papandreou, Mohamed Lamhamdi, Matroni Koutsoureli, Fabio Coccetti, Patrick Pons, George J. Papaioannou, Robert Plana
2008 J jnl
ESD failure signature in capacitive RF MEMS switches.
Microelectron. Reliab.
Jinyu Jason Ruan, George J. Papaioannou, Nicolas Nolhier, Nicolas Mauran, Marise Bafleur, Fabio Coccetti, Robert Plana
2008 J jnl
Voltage and temperature effect on dielectric charging for RF-MEMS capacitive switches reliability investigation.
Microelectron. Reliab.
Mohamed Lamhamdi, Patrick Pons, Usama Zaghloul, Laurent Boudou, Fabio Coccetti, Jean Guastavino, Y. Segui, George J. Papaioannou, Robert Plana
2007 J jnl
Electrostatic discharge failure analysis of capacitive RF MEMS switches.
Microelectron. Reliab.
Jinyu Jason Ruan, Nicolas Nolhier, Marise Bafleur, Laurent Bary, Fabio Coccetti, T. Lisec, Robert Plana
2005 J jnl
Investigation of charging mechanisms in metal-insulator-metal structures.
Microelectron. Reliab.
M. A. Exarchos, V. Theonas, Patrick Pons, George J. Papaioannou, S. Mellé, David Dubuc, Fabio Coccetti, Robert Plana