| Year | Rank | Type | Title / Venue / Authors |
|---|---|---|---|
| 2019 | — | conf |
ICGEC
|
| 2019 | J | jnl |
IEICE Electron. Express
|
| 2018 | J | jnl |
IEICE Electron. Express
|
| 2017 | J | jnl |
Sensors
|
| 2017 | J | jnl |
J. Electr. Comput. Eng.
|
| 2017 | J | jnl |
Microelectron. Reliab.
|
| 2017 | J | jnl |
IEICE Electron. Express
|
| 2017 | J | jnl |
J. Sensors
|
| 2017 | J | jnl |
J. Electron. Test.
|
| 2016 | J | jnl |
J. Electron. Test.
|
| 2016 | J | jnl |
J. Electron. Test.
|
| 2015 | J | jnl |
Microelectron. J.
|
| 2014 | J | jnl |
Signal Image Video Process.
|
| 2013 | J | jnl |
IEICE Trans. Inf. Syst.
|
| 2013 | J | jnl |
Signal Image Video Process.
|
| 2013 | — | conf |
IIH-MSP
|
| 2012 | — | conf |
IIH-MSP
|
| 2012 | J | jnl |
Int. J. Digit. Crime Forensics
|
| 2012 | — | conf |
ICGEC
|
| 2011 | J | jnl |
Inf. Sci.
|
| 2010 | J | jnl |
J. Inf. Hiding Multim. Signal Process.
|
| 2009 | C | conf |
IAS
|
| 2009 | J | jnl |
IEICE Trans. Fundam. Electron. Commun. Comput. Sci.
|
| 2009 | J | jnl |
IEICE Trans. Inf. Syst.
|
| 2008 | C | conf |
IAS
|
| 2008 | — | conf |
ISDA (3)
|
| 2008 | — | conf |
ISDA (3)
|