Eugene R. Hnatek

13 papers A 8Journal 5
YearRankTypeTitle / Venue / Authors
1997 J jnl
Diagnosing IC Failures in a Fast Environment.
IEEE Des. Test Comput.
Donald Staab, Eugene R. Hnatek
1995 A conf
User Application of Statistical Process Monitor Techniques to ASIC Critical Parameters.
ITC
Alex M. Ijaz, Eugene R. Hnatek
1993 A conf
Application of Statistical Techniques to Critical System Parameters.
ITC
Rick Boyle, Jack Donovan, Eugene R. Hnatek, Alex M. Ijaz
1989 A conf
Quality Issues of High Pin Count Fine Pitch VLSI Packages.
ITC
Eugene R. Hnatek, Billy R. Livesay
1986 A conf
IC Burn-In : The Changing Scene.
ITC
Eugene R. Hnatek
1984 A conf
Problems Encountered in Developing VLSI Test Programs for COT (A Practical Outlook).
ITC
Beau R. Wilson Jr., Eugene R. Hnatek
1984 A conf
Thoughts on VLSI Burn-in.
ITC
Eugene R. Hnatek
1982 A conf
An Evaluation of the 2816 EEPROM.
ITC
Eugene R. Hnatek, Beau R. Wilson Jr.
1981 A conf
Documentation for Testability : The Supplier's Responsibility to the User.
ITC
Eugene R. Hnatek
1977 J jnl
Microprocessor device reliability.
Microprocess.
Eugene R. Hnatek
1977 J jnl
Microprocessor-digital converter applications.
Microprocess.
Eugene R. Hnatek
1977 J jnl
Physics of computer memory devices: S Middelhoek, P K George and P Dekker. Academic Press (1976), 402 pp, £12.50.
Microprocess.
Eugene R. Hnatek
1976 J jnl
Semiconductor memories: A review.
Microprocess.
Eugene R. Hnatek