| Year | Rank | Type | Title / Venue / Authors |
|---|---|---|---|
| 2025 | — | conf |
ICM
|
| 2025 | — | conf |
ICM
|
| 2025 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2024 | — | conf |
AIM
|
| 2024 | — | conf |
AIM
|
| 2024 | — | conf |
AIM
|
| 2024 | — | conf |
AIM
|
| 2024 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2024 | C | conf |
IECON
|
| 2024 | J | jnl |
IEEE Trans. Instrum. Meas.
|
| 2024 | — | conf |
AIM
|
| 2024 | — | conf |
Reducing the uncertainty of laser straightness measurements via local saturation of imaging sensors.
AIM
|
| 2023 | C | conf |
ACC
|
| 2023 | J | jnl |
IEEE Trans. Instrum. Meas.
|
| 2023 | J | jnl |
IEEE Trans. Instrum. Meas.
|
| 2023 | — | conf |
I2MTC
|
| 2022 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2022 | J | jnl |
IEEE Trans. Instrum. Meas.
|
| 2022 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2022 | — | conf |
AIM
|
| 2022 | — | conf |
I2MTC
|
| 2022 | J | jnl |
IEEE Trans. Instrum. Meas.
|
| 2022 | — | conf |
AIM
|
| 2022 | — | conf |
I2MTC
|
| 2022 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2021 | J | jnl |
IEEE Trans. Instrum. Meas.
|
| 2020 | — | conf |
AIM
|
| 2020 | — | conf |
AIM
|
| 2020 | — | conf |
AIM
|
| 2020 | J | jnl |
IEEE Trans. Instrum. Meas.
|
| 2020 | — | conf |
I2MTC
|
| 2020 | — | conf |
Self-Aligning Scanning Shack-Hartmann Sensor for Automatic Wavefront Measurements of High-NA Optics.
I2MTC
|
| 2018 | — | conf |
AIM
|
| 2018 | J | jnl |
Elektrotech. Informationstechnik
|
| 2017 | — | conf |
AIM
|
| 2017 | C | conf |
ACC
|
| 2017 | — | conf |
CCTA
|
| 2016 | C | conf |
ACC
|
| 2015 | J | jnl |
Autom.
|