Erich Gornik

17 papers Journal 17
YearRankTypeTitle / Venue / Authors
2011 J jnl
Application of transient interferometric mapping method for ESD and latch-up analysis.
Microelectron. Reliab.
Dionyz Pogany, Sergey Bychikhin, Michael Heer, W. Mamanee, Erich Gornik
2010 J jnl
Single pulse energy capability and failure modes of n- and p-channel LDMOS with thick copper metallization.
Microelectron. Reliab.
A. Podgaynaya, Ralf Rudolf, B. Elattari, Dionyz Pogany, Erich Gornik, Matthias Stecher, Marc Strasser
2009 J jnl
Thermal imaging of smart power DMOS transistors in the thermally unstable regime using a compact transient interferometric mapping system.
Microelectron. Reliab.
Georg Haberfehlner, Sergey Bychikhin, Viktor Dubec, Michael Heer, A. Podgaynaya, M. Pfost, Matthias Stecher, Erich Gornik, Dionyz Pogany
2009 J jnl
Transient interferometric mapping of carrier plasma during external transient latch-up phenomena in latch-up test structures and I/O cells processed in CMOS technology.
Microelectron. Reliab.
Michael Heer, Krzysztof Domanski, Kai Esmark, Ulrich Glaser, Dionyz Pogany, Erich Gornik, Wolfgang Stadler
2007 J jnl
Backside interferometric methods for localization of ESD-induced leakage current and metal shorts.
Microelectron. Reliab.
Viktor Dubec, Sergey Bychikhin, Dionyz Pogany, Erich Gornik, Tilo Brodbeck, Wolfgang Stadler
2006 J jnl
Analysis of triggering behaviour of high voltage CMOS LDMOS clamps and SCRs during ESD induced latch-up.
Microelectron. Reliab.
Michael Heer, Viktor Dubec, Sergey Bychikhin, Dionyz Pogany, Erich Gornik, M. Frank, A. Konrad, J. Schulz
2005 J jnl
Automated setup for thermal imaging and electrical degradation study of power DMOS devices.
Microelectron. Reliab.
Michael Heer, Viktor Dubec, M. Blaho, Sergey Bychikhin, Dionyz Pogany, Erich Gornik, Marie Denison, Matthias Stecher, Gerhard Groos
2005 J jnl
Scanning heterodyne interferometer setup for the time-resolved thermal and free-carrier mapping in semiconductor devices.
IEEE Trans. Instrum. Meas.
Martin Litzenberger, Christoph Furböck, Sergey Bychikhin, Dionyz Pogany, Erich Gornik
2004 J jnl
Multiple-time-instant 2D thermal mapping during a single ESD event.
Microelectron. Reliab.
Viktor Dubec, Sergey Bychikhin, M. Blaho, Michael Heer, Dionyz Pogany, Marie Denison, Nils Jensen, Matthias Stecher, Gerhard Groos, Erich Gornik
2004 J jnl
Transient interferometric mapping of smart power SOI ESD protection devices under TLP and vf-TLP stress.
Microelectron. Reliab.
Sergey Bychikhin, Viktor Dubec, Dionyz Pogany, Erich Gornik, M. Graf, V. Dudek, Winfried Soppa
2003 J jnl
A dual-beam Michelson interferometer for investigation of trigger dynamics in ESD protection devices under very fast TLP stress.
Microelectron. Reliab.
Viktor Dubec, Sergey Bychikhin, M. Blaho, Dionyz Pogany, Erich Gornik, J. Willemen, Ning Qu, Wolfgang Wilkening, L. Zullino, A. Andreini
2003 J jnl
Study of internal behavior in a vertical DMOS transistor under short high current stress by an interferometric mapping method.
Microelectron. Reliab.
M. Blaho, Dionyz Pogany, Erich Gornik, Marie Denison, Gerhard Groos, Matthias Stecher
2002 J jnl
Device Simulation and Backside Laser Interferometry--Powerful Tools for ESD Protection Development.
Microelectron. Reliab.
Wolfgang Stadler, Kai Esmark, Harald Gossner, Martin Streibl, M. Wendel, Wolfgang Fichtner, Dionyz Pogany, Martin Litzenberger, Erich Gornik
2002 J jnl
Electrical field mapping in InGaP HEMTs and GaAs terahertz emitters using backside infrared OBIC technique.
Microelectron. Reliab.
Dionyz Pogany, Ján Kuzmík, Juraj Darmo, Martin Litzenberger, Sergey Bychikhin, Karl Unterrainer, Z. Mozolova, S. Hascik, Tibor Lalinsky, Erich Gornik
2002 J jnl
Experimental and simulation analysis of a BCD ESD protection element under the DC and TLP stress conditions.
Microelectron. Reliab.
M. Blaho, Dionyz Pogany, L. Zullino, A. Andreini, Erich Gornik
2001 J jnl
Effect of pulse risetime on trigger homogeneity in single finger grounded gate nMOSFET electrostatic discharge protection devices.
Microelectron. Reliab.
Martin Litzenberger, R. Pichler, Sergey Bychikhin, Dionyz Pogany, Erich Gornik, Kai Esmark, Harald Gossner
2001 J jnl
Thermal and free carrier laser interferometric mapping and failure analysis of anti-serial smart power ESD protection structures.
Microelectron. Reliab.
Sergey Bychikhin, Martin Litzenberger, R. Pichler, Dionyz Pogany, Erich Gornik, Gerhard Groos, Matthias Stecher