| 2025 |
J |
jnl |
IEEE J. Emerg. Sel. Topics Circuits Syst.
Tassawar Hussain, Jaber Derakhshandeh, Tom Cochet, Ehsan Shafahian, Prathamesh Dhakras, Aksel Göhnermeier, Eric Beyne, Ingrid De Wolf
|
| 2025 |
— |
conf |
IRPS
Emmanuel Chery, Lucie Sourgen, Jacopo Franco, Mihaela Ioana Popovici, Eric Beyne
|
| 2024 |
— |
conf |
VLSI Technology and Circuits
P. Zhao, Liesbeth Witters, Anne Jourdain, Michele Stucchi, Nicolas Jourdan, J. W. Maes, H. Bana, C. Zhu, R. Chukka, F. Sebaai, Kevin Vandersmissen, N. Heylen, D. Montero, S. Wang, K. D'Have, F. Schleicher, J. De Vos, Gerald Beyer, A. Miller, Eric Beyne
|
| 2024 |
— |
conf |
3DIC
Akito Hiro, Damien Jon Leech, Geert Schoofs, John Slabbekoorn, Alain Phommahaxay, Koen Kennes, Gerald Beyer, Eric Beyne
|
| 2024 |
— |
conf |
VLSI Technology and Circuits
S.-H. Lin, Marko Simicic, N. Pantano, S.-H. Chen, Geert Van der Plas, Eric Beyne, Piet Wambacq
|
| 2023 |
— |
conf |
3DIC
Mohamed Naeim, Hanqi Yang, Pinhong Chen, Rong Bao, Antoine Dekeyser, Giuliano Sisto, Moritz Brunion, Rongmei Chen, Geert Van der Plas, Eric Beyne, Dragomir Milojevic
|
| 2023 |
Misc |
conf |
VTS
Bapi Vinnakota, Jaber Derakhshandeh, Eric Beyne, Erik Jan Marinissen, Sreejit Chakravarty
|
| 2023 |
J |
jnl |
CoRR
Quentin Delhaye, Eric Beyne, Joël Goossens, Geert Van der Plas, Dragomir Milojevic
|
| 2023 |
J |
jnl |
Microelectron. J.
Quentin Delhaye, Eric Beyne, Joël Goossens, Geert Van der Plas, Dragomir Milojevic
|
| 2023 |
— |
conf |
VLSI Technology and Circuits
Eric Beyne, Anne Jourdain, Gerald Beyer
|
| 2023 |
A |
conf |
DATE
Xabier Iturbe, Nassim Abderrahmane, Jaume Abella, Sergi Alcaide, Eric Beyne, Henri-Pierre Charles, Christelle Charpin-Nicolle, Lars Chittka, Angélica Dávila, Arne Erdmann, Carles Estrada, Ander Fernández, Anna Fontanelli, José Flich, Gianluca Furano, Alejandro Hernán Gloriani, Erik Isusquiza, Radu Grosu, Carles Hernández, Daniele Ielmini, David Jackson, Maha Kooli, Nicola Lepri, Bernabé Linares-Barranco, Jean-Loup Lachese, Eric Laurent, Menno Lindwer, Frank Linsenmaier, Mikel Luján, Karel Masarík, Nele Mentens, Orlando Moreira, Chinmay Nawghane, Luca Peres, Jean-Philippe Noel, Arash Pourtaherian, Christoph Posch, Peter Priller, Zdenek Prikryl, Felix Resch, Oliver Rhodes, Todor P. Stefanov, Moritz Storring, Michele Taliercio, Rafael Tornero, Marcel D. van de Burgwal, Geert Van der Plas, Elisa Vianello, Pavel Zaykov
|
| 2022 |
— |
conf |
VLSI Technology and Circuits
Michaël Peeters, S. Sinha, Xiao Sun, Claude Desset, Giuseppe Gramegna, John Slabbekoorn, Pieter Bex, Nelson Pinho, Tomas Webers, Dimitrios Velenis, Andy Miller, Nadine Collaert, Geert Van der Plas, Eric Beyne, Martijn Huynen, R. Broucke
|
| 2022 |
J |
jnl |
IEEE Trans. Very Large Scale Integr. Syst.
Hesheng Lin, Dimitrios Velenis, Philip Nolmans, Xiao Sun, Francky Catthoor, Rudy Lauwereins, Geert Van der Plas, Eric Beyne
|
| 2022 |
— |
conf |
VLSI Technology and Circuits
Rongmei Chen, Giuliano Sisto, Michele Stucchi, Anne Jourdain, Kenichi Miyaguchi, Pieter Schuddinck, P. Woeltgens, H. Lin, Naveen Kakarla, Anabela Veloso, Dragomir Milojevic, Odysseas Zografos, Pieter Weckx, Geert Hellings, Geert Van der Plas, Julien Ryckaert, Eric Beyne
|
| 2022 |
J |
jnl |
IEEE Trans. Very Large Scale Integr. Syst.
Hesheng Lin, Geert Van der Plas, Xiao Sun, Dimitrios Velenis, Francky Catthoor, Rudy Lauwereins, Eric Beyne
|
| 2022 |
— |
conf |
VLSI Technology and Circuits
Kateryna Serbulova, S.-H. Chen, Geert Hellings, Anabela Veloso, Anne Jourdain, Dimitri Linten, Jo De Boeck, Guido Groeseneken, Julien Ryckaert, Geert Van der Plas, Eric Beyne, Eugenio Dentoni Litta, Naoto Horiguchi
|
| 2022 |
— |
conf |
SLIP
Rongmei Chen, Giuliano Sisto, Odysseas Zografos, Dragomir Milojevic, Pieter Weckx, Geert Van der Plas, Eric Beyne
|
| 2022 |
— |
conf |
IRPS
Lin Hou, Emmanuel Chery, Kristof Croes, Davide Tierno, Soon Aik Chew, Yangyin Chen, Peter Rakbin, Eric Beyne
|
| 2022 |
— |
conf |
VLSI Technology and Circuits
Anabela Veloso, Anne Jourdain, D. Radisic, Rongmei Chen, G. Arutchelvan, B. O'Sullivan, Hiroaki Arimura, Michele Stucchi, An De Keersgieter, M. Hosseini, T. Hopf, K. D'Have, S. Wang, E. Dupuy, G. Mannaert, Kevin Vandersmissen, S. Iacovo, P. Marien, S. Choudhury, Filip Schleicher, F. Sebaai, Yusuke Oniki, X. Zhou, A. Gupta, Tom Schram, B. Briggs, C. Lorant, E. Rosseel, Andriy Hikavyy, Roger Loo, J. Geypen, D. Batuk, G. T. Martinez, J. P. Soulie, Katia Devriendt, B. T. Chan, S. Demuynck, Gaspard Hiblot, Geert Van der Plas, Julien Ryckaert, Gerald Beyer, E. Dentoni Litta, Eric Beyne, Naoto Horiguchi
|
| 2021 |
— |
conf |
SLIP
Giuliano Sisto, Rongmei Chen, Richard Chou, Geert Van der Plas, Eric Beyne, Rod Metcalfe, Dragomir Milojevic
|
| 2021 |
— |
conf |
VLSI Circuits
Geert Van der Plas, Eric Beyne
|
| 2021 |
J |
jnl |
IEEE Trans. Instrum. Meas.
Kristof J. P. Jacobs, Michele Stucchi, Eric Beyne
|
| 2019 |
— |
conf |
3DIC
Giuliano Sisto, Peter Debacker, Rongmei Chen, Geert Van der Plas, Richard Chou, Eric Beyne, Dragomir Milojevic
|
| 2019 |
— |
conf |
3DIC
Dimitrios Velenis, Joeri De Vos, Soon-Wook Kim, Jaber Derakhshandeh, Pieter Bex, Giovanni Capuz, Samuel Suhard, Kenneth June Rebibis, Stefaan Van Huylenbroeck, Erik Jan Marinissen, Alain Phommahaxay, Andy Miller, Gerald Beyer, Geert Van der Plas, Eric Beyne
|
| 2019 |
— |
conf |
3DIC
Fumihiro Inoue, Julien Bertheau, Samuel Suhard, Alain Phommahaxay, Takuya Ohashi, Tetsuro Kinoshita, Yohei Kinoshita, Eric Beyne
|
| 2018 |
J |
jnl |
IEICE Electron. Express
Yuuki Araga, Makoto Nagata, Joeri De Vos, Geert Van der Plas, Eric Beyne
|
| 2018 |
J |
jnl |
Microelectron. Reliab.
Melina Lofrano, Vladimir Cherman, Mario Gonzalez, Eric Beyne
|
| 2018 |
— |
conf |
IRPS
Kristof Croes, Vladimir Cherman, Melina Lofrano, Houman Zahedmanesh, Luka Kljucar, Mario Gonzalez, Ingrid De Wolf, Zsolt Tökei, Eric Beyne
|
| 2018 |
— |
conf |
IRPS
Yunlong Li, Michele Stucchi, Stefaan Van Huylenbroeck, Geert Van der Plas, Gerald Beyer, Eric Beyne, Kristof Croes
|
| 2017 |
J |
jnl |
Microelectron. Reliab.
Luka Kljucar, Mario Gonzalez, Kristof Croes, Ingrid De Wolf, Joke De Messemaeker, Gayle Murdoch, Philip Nolmans, Joeri De Vos, Jürgen Bömmels, Eric Beyne, Zsolt Tökei
|
| 2017 |
J |
jnl |
Microelectron. Reliab.
Kristof J. P. Jacobs, T. Wang, Michele Stucchi, Mario Gonzalez, Kris Croes, Ingrid De Wolf, Eric Beyne
|
| 2016 |
— |
conf |
3DIC
Stefaan Van Huylenbroeck, Yunlong Li, Michele Stucchi, Lieve Bogaerts, Joeri De Vos, Gerald Beyer, Eric Beyne, Mohand Brouri, Praveen Nalla, Sanjay Gopinath, Matthew Thorum, Joe Richardson, Jengyi Yu
|
| 2016 |
— |
conf |
3DIC
Jaber Derakhshandeh, Lin Hou, Inge De Preter, Carine Gerets, Samuel Suhard, Vikas Dubey, Geraldine Jamieson, Fumihiro Inoue, Tomas Webers, Pieter Bex, Giovanni Capuz, Eric Beyne, John Slabbekoorn, Teng Wang, Anne Jourdain, Gerald Beyer, Kenneth June Rebibis, Andy Miller
|
| 2016 |
— |
conf |
3DIC
Anne Jourdain, Joeri De Vos, Fumihiro Inoue, Kenneth J. Rebibis, Andy Miller, Gerald Beyer, Eric Beyne, Edward Walsby, Jash Patel, Oliver Ansell, Janet Hopkins, Huma Ashraf, Dave Thomas
|
| 2016 |
— |
conf |
3DIC
C. Roda Neve, Mikael Detalle, Philip Nolmans, Yunlong Li, Joeri De Vos, Geert Van der Plas, Gerald Beyer, Eric Beyne
|
| 2016 |
— |
conf |
3DIC
Joeri De Vos, Lan Peng, Alain Phommahaxay, Joost Van Ongeval, Andy Miller, Eric Beyne, Florian Kurz, Thomas Wagenleiter, Markus Wimplinger, Thomas Uhrmann
|
| 2016 |
J |
jnl |
IEEE Des. Test
Kristof Croes, Joke De Messemaeker, Yunlong Li, Wei Guo, Olalla Varela Pedreira, Vladimir Cherman, Michele Stucchi, Ingrid De Wolf, Eric Beyne
|
| 2016 |
J |
jnl |
IEEE Des. Test
Eric Beyne
|
| 2015 |
— |
conf |
3DIC
Eric Beyne
|
| 2015 |
— |
conf |
VLSIC
Geert Hellings, Mirko Scholz, Mikael Detalle, Dimitrios Velenis, Muriel de Potter de ten Broeck, C. Roda Neve, Y. Li, Stefaan Van Huylenbroeck, Shih-Hung Chen, Erik Jan Marinissen, Antonio La Manna, Geert Van der Plas, Dimitri Linten, Eric Beyne, Aaron Thean
|
| 2015 |
— |
conf |
IRPS
Joke De Messemaeker, O. Varela Pedreira, A. Moussa, Nabi Nabiollahi, Kris Vanstreels, Stefaan Van Huylenbroeck, Harold Philipsen, Patrick Verdonck, Bart Vandevelde, Ingrid De Wolf, Eric Beyne, Kris Croes
|
| 2015 |
J |
jnl |
Microelectron. Reliab.
Nabi Nabiollahi, Nele Moelans, Mario Gonzalez, Joke De Messemaeker, Christopher J. Wilson, Kristof Croes, Eric Beyne, Ingrid De Wolf
|
| 2015 |
— |
conf |
3DIC
Soon-Wook Kim, Lan Peng, Andy Miller, Gerald Beyer, Eric Beyne, Chung-Sun Lee
|
| 2015 |
— |
conf |
3DIC
Dimitrios Velenis, Mikael Detalle, Geert Hellings, Mirko Scholz, Erik Jan Marinissen, Geert Van der Plas, Antonio La Manna, Andy Miller, Dimitri Linten, Eric Beyne
|
| 2015 |
— |
conf |
ICICDT
Herman Oprins, Vladimir Cherman, Geert Van der Plas, F. L. T. Maggioni, Joeri De Vos, Eric Beyne
|
| 2015 |
— |
conf |
ICICDT
A. Rouhi Najaf Abadi, W. Guo, X. Sun, K. Ben Ali, Jean-Pierre Raskin, Martin Rack, C. Roda Neve, M. Choi, V. Moroz, Geert Van der Plas, Ingrid De Wolf, Eric Beyne, Philippe P. Absil
|
| 2014 |
— |
conf |
3DIC
X. Sun, Geert Van der Plas, Mikael Detalle, Eric Beyne
|
| 2014 |
J |
jnl |
Microelectron. Reliab.
Bart Vandevelde, Andrej Ivankovic, B. Debecker, Melina Lofrano, Kris Vanstreels, Wei Guo, Vladimir Cherman, Marcel Gonzalez, Geert Van der Plas, Ingrid De Wolf, Eric Beyne, Zsolt Tokei
|
| 2014 |
— |
conf |
3DIC
Joeri De Vos, Vladimir Cherman, Mikael Detalle, Teng Wang, Abdellah Salahouelhadj, Robert Daily, Geert Van der Plas, Eric Beyne
|
| 2014 |
J |
jnl |
Microelectron. J.
F. L. T. Maggioni, Herman Oprins, Eric Beyne, Ingrid De Wolf, Martine Baelmans
|
| 2014 |
J |
jnl |
Microelectron. Reliab.
Yunlong Li, Stefaan Van Huylenbroeck, Els Van Besien, Xiaoping Shi, Chen Wu, Michele Stucchi, Gerald Beyer, Eric Beyne, Ingrid De Wolf, Kristof Croes
|
| 2014 |
J |
jnl |
IEEE Embed. Syst. Lett.
Prashant Agrawal, Dragomir Milojevic, Praveen Raghavan, Francky Catthoor, Liesbet Van der Perre, Eric Beyne, Ravi Varadarajan
|
| 2013 |
— |
conf |
ASP-DAC
Dragomir Milojevic, Pol Marchal, Erik Jan Marinissen, Geert Van der Plas, Diederik Verkest, Eric Beyne
|
| 2013 |
— |
conf |
3DIC
Dimitrios Velenis, Mikael Detalle, Erik Jan Marinissen, Eric Beyne
|
| 2012 |
— |
conf |
ICICDT
Wei Guo, Geert Van der Plas, Andrej Ivankovic, Geert Eneman, Vladimir Cherman, Bart De Wachter, Abdelkarim Mercha, Mario Gonzalez, Yann Civale, Augusto Redolfi, Thibault Buisson, A. Jourdan, Bart Vandevelde, Kenneth J. Rebibis, Ingrid De Wolf, Antonio La Manna, Gerald Beyer, Eric Beyne, Bart Swinnen
|
| 2011 |
A* |
conf |
DAC
Eric Beyne, Pol Marchal, Geert Van der Plas
|
| 2011 |
— |
conf |
3DIC
Y. H. Hu, C. S. Liu, M. J. Lii, Kenneth J. Rebibis, Anne Jourdain, Antonio La Manna, Gerald Beyer, Eric Beyne, C. H. Yu
|
| 2011 |
— |
conf |
3DIC
Antonio La Manna, Dimitrios Velenis, Thibault Buisson, Mikael Detalle, Kenneth J. Rebibis, Wenqi Zhang, Eric Beyne
|
| 2011 |
A |
conf |
DATE
Geert Eneman, J. Cho, V. Moroz, Dragomir Milojevic, M. Choi, Kristin De Meyer, Abdelkarim Mercha, Eric Beyne, Thomas Hoffmann, Geert Van der Plas
|
| 2011 |
— |
conf |
3DIC
Andrej Ivankovic, Geert Van der Plas, V. Moroz, M. Choi, Vladimir Cherman, Abdelkarim Mercha, Paul Marchal, Marcel Gonzalez, Geert Eneman, Wenqi Zhang, Thibault Buisson, Mikael Detalle, Antonio La Manna, Diederik Verkest, Gerald Beyer, Eric Beyne, Bart Vandevelde, Ingrid De Wolf, Dirk Vandepitte
|
| 2011 |
J |
jnl |
Microelectron. Reliab.
Ingrid De Wolf, Kris Croes, O. Varela Pedreira, Riet Labie, Augusto Redolfi, M. Van De Peer, Kris Vanstreels, C. Okoro, Bart Vandevelde, Eric Beyne
|
| 2011 |
J |
jnl |
IEEE J. Solid State Circuits
Geert Van der Plas, Paresh Limaye, Igor Loi, Abdelkarim Mercha, Herman Oprins, Cristina Torregiani, Steven Thijs, Dimitri Linten, Michele Stucchi, Guruprasad Katti, Dimitrios Velenis, Vladimir Cherman, Bart Vandevelde, Veerle Simons, Ingrid De Wolf, Riet Labie, Dan Perry, Stephane Bronckers, Nikolaos Minas, Miro Cupac, Wouter Ruythooren, Jan Van Olmen, Alain Phommahaxay, Muriel de Potter de ten Broeck, Ann Opdebeeck, Michal Rakowski, Bart De Wachter, Morin Dehan, Marc Nelis, Rahul Agarwal, Antonio Pullini, Federico Angiolini, Luca Benini, Wim Dehaene, Youssef Travaly, Eric Beyne, Paul Marchal
|
| 2011 |
— |
conf |
3DIC
Eric Beyne
|
| 2011 |
— |
conf |
3DIC
Sandip Halder, Ingrid De Wolf, Alain Phommahaxay, Andy Miller, Mireille Maenhoudt, Gerald Beyer, Bart Swinnen, Eric Beyne
|
| 2011 |
— |
conf |
3DIC
Yuuki Araga, Makoto Nagata, Geert Van der Plas, Jaemin Kim, Nikolaos Minas, Pol Marchal, Youssef Travaly, Michael Libois, Antonio La Manna, Wenqi Zhang, Eric Beyne
|
| 2011 |
— |
conf |
3DIC
Alain Phommahaxay, Anne Jourdain, Greet Verbinnen, Tobias Woitke, Peter Bisson, Markus Gabriel, Walter Spiess, Alice Guerrero, Jeremy McCutcheon, Rama Puligadda, Pieter Bex, Axel Van den Eede, Bart Swinnen, Gerald Beyer, Andy Miller, Eric Beyne
|
| 2010 |
— |
conf |
3DIC
Anne Jourdain, Thibault Buisson, Alain Phommahaxay, Mark Privett, Dan Wallace, Sumant Sood, Peter Bisson, Eric Beyne, Youssef Travaly, Bart Swinnen
|
| 2010 |
— |
conf |
3DIC
Yann Civale, Marcel Gonzalez, Deniz Sabuncuoglu Tezcan, Youssef Travaly, Philippe Soussan, Eric Beyne
|
| 2010 |
— |
conf |
3DIC
Dimitrios Velenis, Erik Jan Marinissen, Eric Beyne
|
| 2010 |
— |
conf |
ISSCC
Geert Van der Plas, Paresh Limaye, Abdelkarim Mercha, Herman Oprins, Cristina Torregiani, Steven Thijs, Dimitri Linten, Michele Stucchi, Guruprasad Katti, Dimitrios Velenis, Domae Shinichi, Vladimir Cherman, Bart Vandevelde, Veerle Simons, Ingrid De Wolf, Riet Labie, Dan Perry, Stephane Bronckers, Nikolaos Minas, Miro Cupac, Wouter Ruythooren, Jan Van Olmen, Alain Phommahaxay, Muriel de Potter de ten Broeck, Ann Opdebeeck, Michal Rakowski, Bart De Wachter, Morin Dehan, Marc Nelis, Rahul Agarwal, Wim Dehaene, Youssef Travaly, Pol Marchal, Eric Beyne
|
| 2010 |
— |
conf |
CICC
Geert Van der Plas, Steven Thijs, Dimitri Linten, Guruprasad Katti, Paresh Limaye, Abdelkarim Mercha, Michele Stucchi, Herman Oprins, Bart Vandevelde, Nikolaos Minas, Miro Cupac, Morin Dehan, Marc Nelis, Rahul Agarwal, Wim Dehaene, Youssef Travaly, Eric Beyne, Paul Marchal
|
| 2009 |
J |
jnl |
Proc. IEEE
Paul Marchal, Bruno Bougard, Guruprasad Katti, Michele Stucchi, Wim Dehaene, Antonis Papanikolaou, Diederik Verkest, Bart Swinnen, Eric Beyne
|
| 2009 |
— |
conf |
3DIC
Jan Van Olmen, Jan Coenen, Wim Dehaene, Kristin De Meyer, Cedric Huyghebaert, Anne Jourdain, Guruprasad Katti, Abdelkarim Mercha, Michal Rakowski, Michele Stucchi, Youssef Travaly, Eric Beyne, Bart Swinnen
|
| 2009 |
— |
conf |
3DIC
Yann Civale, Deniz Sabuncuoglu Tezcan, Harold G. G. Philipsen, P. Jaenen, Rahul Agarwal, F. Duval, Philippe Soussan, Youssef Travaly, Eric Beyne
|
| 2009 |
— |
conf |
3DIC
Dimitrios Velenis, Michele Stucchi, Erik Jan Marinissen, Bart Swinnen, Eric Beyne
|
| 2007 |
J |
jnl |
Microelectron. Reliab.
Bart Vandevelde, Mario Gonzalez, Paresh Limaye, Petar Ratchev, Eric Beyne
|
| 2007 |
Misc |
conf |
VLSI Design
Eric Beyne
|
| 2006 |
— |
conf |
EMBC
Mathieu Vanden Bulcke, Kris Baert, Eric Beyne, Mario Gonzalez, Christophe Winters, Tomas Webers
|
| 2006 |
A |
conf |
DATE
J. Balachandran, Steven Brebels, Geert Carchon, Tomas Webers, Walter De Raedt, Bart Nauwelaers, Eric Beyne
|
| 2006 |
— |
conf |
ISQED
J. Balachandran, Steven Brebels, Geert Carchon, Walter De Raedt, Eric Beyne, Maarten Kuijk, Bart Nauwelaers
|
| 2006 |
— |
conf |
SLIP
J. Balachandran, Steven Brebels, Geert Carchon, Maarten Kuijk, Walter De Raedt, Bart Nauwelaers, Eric Beyne
|
| 2006 |
— |
conf |
SoC
J. Balachandran, Maarten Kuijk, Steven Brebels, Geert Carchon, Walter De Raedt, Bart Nauwelaers, Eric Beyne
|
| 2006 |
J |
jnl |
Microelectron. J.
Kris Baert, Bert Gyselinckx, Tom Torfs, Vladimir Leonov, Refet Firat Yazicioglu, Steven Brebels, Stéphane Donnay, J. Vanfletern, M. Pastreen, Eric Beyne, Chris Van Hoof
|
| 2006 |
J |
jnl |
IEEE Trans. Very Large Scale Integr. Syst.
J. Balachandran, Steven Brebels, Geert Carchon, Maarten Kuijk, Walter De Raedt, Bart Nauwelaers, Eric Beyne
|
| 2005 |
— |
conf |
SLIP
J. Balachandran, Steven Brebels, Geert Carchon, Tomas Webers, Walter De Raedt, Bart Nauwelaers, Eric Beyne
|
| 2004 |
J |
jnl |
Microelectron. Reliab.
Marcel Gonzalez, Bart Vandevelde, R. Van Hoof, Eric Beyne
|
| 2003 |
J |
jnl |
Microelectron. Reliab.
Philippe Soussan, G. Lekens, R. Dreesen, Ward De Ceuninck, Eric Beyne
|
| 2003 |
J |
jnl |
Microelectron. Reliab.
Hong Meng Ho, Wai Lam, Serguei Stoukatch, Petar Ratchev, Charles J. Vath, Eric Beyne
|
| 2003 |
J |
jnl |
Microelectron. Reliab.
Bart Vandevelde, Dominiek Degryse, Eric Beyne, Eric Roose, Dorina Corlatan, Guido Swaelen, Geert Willems, Filip Christiaens, Alcatel Bell, Dirk Vandepitte
|
| 2003 |
J |
jnl |
Microelectron. Reliab.
Arun Chandrasekhar, Steven Brebels, Serguei Stoukatch, Eric Beyne, Walter De Raedt, Bart Nauwelaers
|
| 2000 |
J |
jnl |
Proc. IEEE
Stéphane Donnay, Philip Pieters, Kristof Vaesen, Wim Diels, Piet Wambacq, Walter De Raedt, Eric Beyne, Marc Engels, Ivo Bolsens
|
| 1996 |
— |
conf |
ED&TC
Claudio Truzzi, Eric Beyne, Edwin Ringoot
|
| 1995 |
C |
conf |
ICCD
Claudio Truzzi, Eric Beyne, Edwin Ringoot, J. Peeters
|