Ephraim Suhir

16 papers Journal 12Unranked 4
YearRankTypeTitle / Venue / Authors
2025 J jnl
Collaborative Robotics: Application of Delphi Method.
J. Field Robotics
Jean Marc Salotti, Ephraim Suhir
2022 J jnl
Probabilistic Fitts' Law with Application to Spacecraft Collision with an Asteroid.
J. Aerosp. Inf. Syst.
Ephraim Suhir
2020 — conf
Extraordinary Automated Driving Situations: Probabilistic Analytical Modeling of Human-Systems-Integration (HSI) and the Role of Trust.
AHFE (6)
Ephraim Suhir, Sofia Scataglini, Gunther Paul
2020 — conf
Towards Probabilistic Analysis of Human-System Integration in Automated Driving.
IHSI
Ephraim Suhir, Gunther Paul, Hermann Kaindl
2016 — conf
Predicted thermal stresses in a TSV design.
3DIC
Ephraim Suhir, Sung Yi
2015 J jnl
A unified multiple stress reliability model for microelectronic devices - Application to 1.55 μm DFB laser diode module for space validation.
Microelectron. Reliab.
Alain Bensoussan, Ephraim Suhir, Philip Henderson, Mustapha Zahir
2015 — conf
Probabilistic design for reliability in electronics and photonics: Role, significance, attributes, challenges.
IRPS
Ephraim Suhir, A. Bensoussan, Golta Khatibi, Johann Nicolics
2014 J jnl
Minimizing thermally induced interfacial shearing stress in a thermoelectric module with low fractional area coverage.
Microelectron. J.
Amirkoushyar Ziabari, Ephraim Suhir, Ali Shakouri
2014 J jnl
Thermal stress in through-silicon-vias: Theory-of-elasticity approach.
Microelectron. Reliab.
Ephraim Suhir
2014 J jnl
Three-step concept (TSC) in modeling microelectronics reliability (MR): Boltzmann-Arrhenius-Zhurkov (BAZ) probabilistic physics-of-failure equation sandwiched between two statistical models.
Microelectron. Reliab.
Ephraim Suhir
2013 J jnl
Could electronics reliability be predicted, quantified and assured?
Microelectron. Reliab.
Ephraim Suhir
2013 J jnl
Saint-Venant's principle and the minimum length of a dual-coated optical fiber specimen in reliability (proof) testing.
Microelectron. Reliab.
Ephraim Suhir, Laurent Béchou
2012 J jnl
When adequate and predictable reliability is imperative.
Microelectron. Reliab.
Ephraim Suhir
2010 J jnl
Elastizitätsmodell eines keramischen Sensorstreifens bei longitudinaler Verformung.
Elektrotech. Informationstechnik
Walter Gschohsmann, Johann Nicolics, Ephraim Suhir
2008 J jnl
Portable 2008 - Second ieee international interdisciplinary intersociety conference on pids.
IEEE Veh. Technol. Mag.
Ephraim Suhir, Jyrki Joutsensalo
2007 J jnl
Response of a heavy electronic component to harmonic excitations applied to its external electric leads.
Elektrotech. Informationstechnik
Ephraim Suhir