Enrique Dehaerne

13 papers Journal 10Unranked 3

Year	Rank	Type	Title / Venue / Authors
2025	—	`conf`	A Deep Learning Framework for Verilog Autocompletion Towards Design and Verification Automation. SOCC Enrique Dehaerne, Bappaditya Dey, Sandip Halder, Stefan De Gendt
2023	J	`jnl`	A Deep Learning Framework for Verilog Autocompletion Towards Design and Verification Automation. CoRR Enrique Dehaerne, Bappaditya Dey, Sandip Halder, Stefan De Gendt
2023	J	`jnl`	A Machine Learning Approach Towards SKILL Code Autocompletion. CoRR Enrique Dehaerne, Bappaditya Dey, Wannes Meert
2023	J	`jnl`	Automated Semiconductor Defect Inspection in Scanning Electron Microscope Images: a Systematic Review. CoRR Thibault Lechien, Enrique Dehaerne, Bappaditya Dey, Víctor Blanco, Sandip Halder, Stefan De Gendt
2023	J	`jnl`	Benchmarking Feature Extractors for Reinforcement Learning-Based Semiconductor Defect Localization. CoRR Enrique Dehaerne, Bappaditya Dey, Sandip Halder, Stefan De Gendt
2023	J	`jnl`	Optimizing YOLOv7 for Semiconductor Defect Detection. CoRR Enrique Dehaerne, Bappaditya Dey, Sandip Halder, Stefan De Gendt
2023	J	`jnl`	SEMI-CenterNet: A Machine Learning Facilitated Approach for Semiconductor Defect Inspection. CoRR Vic De Ridder, Bappaditya Dey, Enrique Dehaerne, Sandip Halder, Stefan De Gendt, Bartel Van Waeyenberge
2023	J	`jnl`	SEMI-PointRend: Improved Semiconductor Wafer Defect Classification and Segmentation as Rendering. CoRR MinJin Hwang, Bappaditya Dey, Enrique Dehaerne, Sandip Halder, Young-han Shin
2023	J	`jnl`	YOLOv8 for Defect Inspection of Hexagonal Directed Self-Assembly Patterns: A Data-Centric Approach. CoRR Enrique Dehaerne, Bappaditya Dey, Hossein Esfandiar, Lander Verstraete, Hyo Seon Suh, Sandip Halder, Stefan De Gendt
2022	—	`conf`	A Comparative Study of Deep-Learning Object Detectors for Semiconductor Defect Detection. ICECS 2022 Enrique Dehaerne, Bappaditya Dey, Sandip Halder
2022	J	`jnl`	Code Generation Using Machine Learning: A Systematic Review. IEEE Access Enrique Dehaerne, Bappaditya Dey, Sandip Halder, Stefan De Gendt, Wannes Meert
2022	J	`jnl`	Deep Learning based Defect classification and detection in SEM images: A Mask R-CNN approach. CoRR Bappaditya Dey, Enrique Dehaerne, Kasem Khalil, Sandip Halder, Philippe Leray, Magdy A. Bayoumi
2020	—	`conf`	EELWORM: a bioinspired multimodal amphibious soft robot. RoboSoft Edoardo Milana, Bert Van Raemdonck, Kevin Cornelis, Enrique Dehaerne, Jef De Clerck, Yarno De Groof, Toon De Vil, Benjamin Gorissen, Dominiek Reynaerts