Enrique Barajas

16 papers A 1C 2Journal 6Unranked 7
YearRankTypeTitle / Venue / Authors
2023 J jnl
Aging Compensation in a Class-A High-Frequency Amplifier with DC Temperature Measurements.
Sensors
Josep Altet, Xavier Aragonès, Enrique Barajas, Xavier Gisbert, Sergio Martínez, Diego Mateo
2022 J jnl
Potential of functional analysis applied to Sentinel-2 time-series to assess relevant agronomic parameters at the within-field level in viticulture.
Comput. Electron. Agric.
Sergio Vélez, Florian Rançon, Enrique Barajas, Guilhem Brunel, José Antonio Rubio, Bruno Tisseyre
2021 J jnl
BPF-Based Thermal Sensor Circuit for On-Chip Testing of RF Circuits.
Sensors
Josep Altet, Enrique Barajas, Diego Mateo, Alexandre Billong, Xavier Aragonès, Xavier Perpiñà, Ferran Reverter
2020 — conf
Experimental Monitoring of Aging in CMOS RF Linear Power Amplifiers: Correlation Between Device and Circuit Degradation.
IRPS
Rosana Rodríguez, Albert Crespo-Yepes, Javier Martín-Martínez, Montserrat Nafría, Xavier Aragonès, Diego Mateo, Enrique Barajas
2019 J jnl
A Versatile CMOS Transistor Array IC for the Statistical Characterization of Time-Zero Variability, RTN, BTI, and HCI.
IEEE J. Solid State Circuits
Javier Diaz-Fortuny, Javier Martín-Martínez, Rosana Rodríguez, Rafael Castro-López, Elisenda Roca, Xavier Aragonès, Enrique Barajas, Diego Mateo, Francisco V. Fernández, Montserrat Nafría
2019 C conf
Aging in CMOS RF Linear Power Amplifiers: Experimental Comparison and Modeling.
ISCAS
Xavier Aragonès, Diego Mateo, Enrique Barajas, Albert Crespo-Yepes, Rosana Rodríguez, Javier Martín-Martínez, Montserrat Nafría
2019 J jnl
Differential Temperature Sensors: Review of Applications in the Test and Characterization of Circuits, Usage and Design Methodology.
Sensors
Enrique Barajas, Xavier Aragonès, Diego Mateo, Josep Altet
2019 — conf
On the Use of Built-In Temperature Sensors to Monitor Aging in RF Circuits.
DCIS
Anant Rungta, Josep Altet, Enrique Barajas, Antonio Rubio, Xavier Aragonès, Diego Mateo
2019 J jnl
Output Power and Gain Monitoring in RF CMOS Class A Power Amplifiers by Thermal Imaging.
IEEE Trans. Instrum. Meas.
Xavier Perpiñà, Ferran Reverter, Javier Leon, Enrique Barajas, Miquel Vellvehí, Xavier Jordà, Josep Altet
2018 — conf
Analysis of Body Bias and RTN-Induced Frequency Shift of Low Voltage Ring Oscillators in FDSOI Technology.
PATMOS
Enrique Barajas, Xavier Aragonès, Diego Mateo, Francesc Moll, Antonio Rubio, Javier Martín-Martínez, Rosana Rodríguez, Marc Porti, Montserrat Nafría, Rafael Castro-López, Elisenda Roca, Francisco V. Fernández
2017 — conf
A transistor array chip for the statistical characterization of process variability, RTN and BTI/CHC aging.
SMACD
Javier Diaz-Fortuny, Javier Martín-Martínez, Rosana Rodríguez, Montserrat Nafría, Rafael Castro-López, Elisenda Roca, Francisco V. Fernández, Enrique Barajas, Xavier Aragonès, Diego Mateo
2014 — conf
Impact of adaptive proactive reconfiguration technique on Vmin and lifetime of SRAM caches.
ISQED
Peyman Pouyan, Esteve Amat, Enrique Barajas, Antonio Rubio
2010 C conf
Behavioural Modelling of DLLs for Fast Simulation and Optimisation of Jitter and Power Consumption.
DSD
Enrique Barajas, Diego Mateo, José Luis González
2007 A conf
Interactive presentation: Behavioral modeling of delay-locked loops and its application to jitter optimization in ultra wide-band impulse radio systems.
DATE
Enrique Barajas, R. Cosculluela, D. Coutinho, Diego Mateo, José Luis González, I. Cairò, S. Banda, M. Ikeda
2005 — conf
Characterization and noise analysis of a 12-bit current steering digital-to-analog converter.
ISCAS (1)
Tomás Lahoz, Enrique Barajas, José Luis González
2005 — conf
Discrete and continuous substrate noise spectrum dependence on digital circuit characteristics.
ISCAS (5)
Enrique Barajas, Luis Elvira, Miguel A. Méndez, Ferran Martorell, Diego Mateo, José Luis González