Ender Yilmaz

30 papers A* 1A 7B 5C 2Misc 2Journal 8Unranked 5
YearRankTypeTitle / Venue / Authors
2021 J jnl
Fault-based Built-in Self-test and Evaluation of Phase Locked Loops.
ACM Trans. Design Autom. Electr. Syst.
Mehmet Ince, Ender Yilmaz, Wei Fu, Joonsung Park, Krishnaswamy Nagaraj, LeRoy Winemberg, Sule Ozev
2019 J jnl
Adaptive Test for RF/Analog Circuit Using Higher Order Correlations among Measurements.
ACM Trans. Design Autom. Electr. Syst.
Yanjun Li, Ender Yilmaz, Pete Sarson, Sule Ozev
2019 B conf
Digital Built-in Self-Test for Phased Locked Loops to Enable Fault Detection.
ETS
Mehmet Ince, Ender Yilmaz, Wei Fu, Joonsung Park, Krishnaswamy Nagaraj, LeRoy Winemberg, Sule Ozev
2018 — conf
Design of aging aware 5 Gbps LVDS transmitter for automotive applications.
IRPS
Srikanth Jagannathan, Kumar Abhishek, Nihaar N. Mahatme, Ender Yilmaz
2018 — conf
Enabling fast process variation and fault simulation through macromodelling of analog components.
NATW
Mehmet Ince, Ender Yilmaz, Sule Ozev
2018 Misc conf
Online information utility assessment for per-device adaptive test flow.
VTS
Yanjun Li, Ender Yilmaz, Peter Sarson, Sule Ozev
2017 A conf
Built-in self-test for stability measurement of low dropout regulator.
ITC
Jae Woong Jeong, Ender Yilmaz, LeRoy Winemberg, Sule Ozev
2017 — conf
Evaluation of loop transfer function based dynamic testing of LDOs.
ITC-Asia
Mehmet Ince, Ender Yilmaz, Jae Woong Jeong, LeRoy Winemberg, Sule Ozev
2015 J jnl
Adaptive-Learning-Based Importance Sampling for Analog Circuit DPPM Estimation.
IEEE Des. Test
Ender Yilmaz, Sule Ozev
2014 J jnl
Built-In EVM Measurement With Negligible Hardware Overhead.
IEEE Des. Test
Ender Yilmaz, Afsaneh Nassery, Sule Ozev
2013 B conf
Adaptive quality binning for analog circuits.
ETS
Ender Yilmaz, Sule Ozev, Kenneth M. Butler
2013 A conf
Adaptive reduction of the frequency search space for multi-vdd digital circuits.
DATE
Chandra K. H. Suresh, Ender Yilmaz, Sule Ozev, Ozgur Sinanoglu
2013 J jnl
Efficient Process Shift Detection and Test Realignment.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
Ender Yilmaz, Sule Ozev, Kenneth M. Butler
2013 A conf
Electrical calibration of spring-mass MEMS capacitive accelerometers.
DATE
Lingfei Deng, Vinay Kundur, Naveen Sai Jangala Naga, Muhlis Kenan Ozel, Ender Yilmaz, Sule Ozev, Bertan Bakkaloglu, Sayfe Kiaei, Divya Pratab, Tehmoor Dar
2013 A conf
Fault analysis and simulation of large scale industrial mixed-signal circuits.
DATE
Ender Yilmaz, Geoff Shofner, LeRoy Winemberg, Sule Ozev
2013 J jnl
Per-Device Adaptive Test for Analog/RF Circuits Using Entropy-Based Process Monitoring.
IEEE Trans. Very Large Scale Integr. Syst.
Ender Yilmaz, Sule Ozev, Kenneth M. Butler
2012 B conf
Adaptive multi-site testing for analog/mixed-signal circuits incorporating neighborhood information.
ETS
Ender Yilmaz, Sule Ozev
2012 B conf
Adaptive testing: Conquering process variations.
ETS
Ender Yilmaz, Sule Ozev, Ozgur Sinanoglu, Peter C. Maxwell
2012 J jnl
Test Application for Analog/RF Circuits With Low Computational Burden.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
Ender Yilmaz, Sule Ozev
2011 A conf
Adaptive multidimensional outlier analysis for analog and mixed signal circuits.
ITC
Ender Yilmaz, Sule Ozev, Kenneth M. Butler
2011 Misc conf
An industrial case study of analog fault modeling.
VTS
Ender Yilmaz, Anne Meixner, Sule Ozev
2011 B conf
Fast and Accurate DPPM Computation Using Model Based Filtering.
ETS
Ender Yilmaz, Sule Ozev
2010 — conf
Accurate multi-specification DPPM estimation using layered sampling based simulation.
ISQED
Ender Yilmaz
2010 A conf
Adaptive test flow for mixed-signal/RF circuits using learned information from device under test.
ITC
Ender Yilmaz, Sule Ozev, Kenneth M. Butler
2009 A* conf
Adaptive test elimination for analog/RF circuits.
DAC
Ender Yilmaz, Sule Ozev
2009 J jnl
Analog Layout Generator for CMOS Circuits.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
Ender Yilmaz, Günhan Dündar
2009 A conf
Built-in EVM measurement for OFDM transceivers using all-digital DFT.
ITC
Ender Yilmaz, Afsaneh Nassery, Sule Ozev, Erkan Acar
2009 C conf
Defect-based test optimization for analog/RF circuits for near-zero DPPM applications.
ICCD
Ender Yilmaz, Sule Ozev
2008 C conf
Dynamic test scheduling for analog circuits for improved test quality.
ICCD
Ender Yilmaz, Sule Ozev
2007 — conf
New layout generator for analog CMOS circuits.
ECCTD
Ender Yilmaz, Günhan Dündar