Emmanuel Nti Darko

15 papers A 3C 1Misc 1Journal 3Unranked 7
YearRankTypeTitle / Venue / Authors
2025 C conf
A Compact 3-Segment 15-bit Capacitive DAC with Digital Calibration for Improved Linearity.
ISCAS
Emmanuel Nti Darko, Isaac Bruce, Ekaniyere Oko-Odion, Saeid Karimpour, Kushagra Bhatheja, Degang Chen
2025 A conf
An On-Chip Sensor For Online Monitoring of HCI-Induced Aging In Integrated Analog Circuits.
ITC
Saeid Karimpour, Emmanuel Nti Darko, Degang Chen
2025 J jnl
Digitally Calibrated Redundancy-Based String DAC: A Novel Architecture for Enhanced Static Linearity.
IEEE Trans. Circuits Syst. II Express Briefs
Isaac Bruce, Emmanuel Nti Darko, Ekaniyere Oko-Odion, Matthew Crabb, Degang Chen
2025 — conf
Efficient Hybrid Resistor-String and Capacitor DAC with Area Efficient Redundancy-Based Digital Calibration for High-Performance Applications.
I2MTC
Ekaniyere Oko-Odion, Emmanuel Nti Darko, Isaac Bruce, Matthew Crabb, Degang Chen
2025 Misc conf
High-Accuracy, Cost-Effective Built-In Self-Test Approach for High-Resolution Data Converters.
VTS
Emmanuel Nti Darko, Saeid Karimpour, Degang Chen
2025 J jnl
Ultra-Low Leakage Current Sensor With Large Dynamic Range.
IEEE Trans. Circuits Syst. II Express Briefs
Emmanuel Nti Darko, Saeid Karimpour, Daniel Adjei, Kushagra Bhatheja, Degang Chen
2025 A conf
Ultra-Pure High-Resolution Waveform Generation Using Low-Cost Data Converters with Dithering.
ITC
Emmanuel Nti Darko, Saeid Karimpour, Ekaniyere Oko-Odion, Godfred Bonsu, Degang Chen
2024 — conf
A 3-Segment Interpolating String DAC with Low-Cost Built-In-Self-Test Capabilities.
ISVLSI
Isaac Bruce, Emmanuel Nti Darko, Ekaniyere Oko-Odion, Kushagra Bhatheja, Matthew Crabb, Degang Chen
2024 J jnl
A BIST Approach to Approximate Co-Testing of Embedded Data Converters.
IEEE Des. Test
Kushagra Bhatheja, Shravan K. Chaganti, Johnathan Leisinger, Emmanuel Nti Darko, Isaac Bruce, Degang Chen
2024 — conf
A Direct Current-to-digital converter (DCDC) for Advanced Current Measurement in System-on-Chip (SOC) Designs.
MWSCAS
Saeid Karimpour, Isaac Bruce, Michael Sekyere, Ruohan Yang, Emmanuel Nti Darko, Degang Chen
2024 A conf
A Robust On-Chip Sensor for Online Monitoring of BTI-Induced Aging in Integrated Circuits.
ITC
Daniel Adjei, Emmanuel Nti Darko, Degang Chen
2024 — conf
Redundancy Based Resistor String DAC with an all Digital Calibration Algorithm.
MWSCAS
Isaac Bruce, Emmanuel Nti Darko, Ekaniyere Oko-Odion, Matthew Crabb, Degang Chen
2024 — conf
Ultra-Small Area, Highly Linear, Modified All Mosfet Digital-to-Analog Converters with Novel Real Time Digital Calibration Algorithm.
ISVLSI
Ekaniyere Oko-Odion, Isaac Bruce, Emmanuel Nti Darko, Michael Sekyere, Degang Chen
2023 — conf
Small Area, High Accuracy Sub-Radix Resistive Current Mode Digital-To-Analog Converter with Novel Calibration Algorithm.
MWSCAS
Isaac Bruce, Michael Sekyere, Emmanuel Nti Darko, Ekaniyere Oko-Odion, Kushagra Bhatheja, Degang Chen
2023 — conf
Ultra-Small Area, Highly Linear Sub-Radix R-2R Digital-To-Analog Converters with Novel Calibration Algorithm.
MWSCAS
Michael Sekyere, Emmanuel Nti Darko, Isaac Bruce, Ekaniyere Oko-Odion, Kushagra Bhatheja, Degang Chen