Elyse Rosenbaum

57 papers A* 4A 3Journal 22Unranked 28

Year	Rank	Type	Title / Venue / Authors
2025	J	`jnl`	Exploiting Chiplet Integration Technology for Fast High-Capacity DRAM Modules. IEEE Trans. Very Large Scale Integr. Syst. Zihan Xia, Chihun Song, Ram Krishna, Ashita Victor, Srujan Penta, Muhannad S. Bakir, Elyse Rosenbaum, Nam Sung Kim, Mingu Kang
2025	—	`conf`	New Loss Function for Learning Dielectric Thickness Distributions and Generative Modeling of Breakdown Lifetime. IRPS Weiman Yan, Ernest Wu, Elyse Rosenbaum
2025	—	`conf`	Optimized CDM-ESD Protection for 100+ Gbps Wireline IO in 16-nm CMOS. IRPS Shudong Huang, Elyse Rosenbaum
2025	—	`conf`	TDDB Characterization of High-k Gate Dielectric on a Sub-nanosecond Timescale. IRPS Matthew Drallmeier, Elyse Rosenbaum
2025	J	`jnl`	Toward Engineering AGI: Benchmarking the Engineering Design Capabilities of LLMs. CoRR Xingang Guo, Yaxin Li, Xiangyi Kong, Yilan Jiang, Xiayu Zhao, Zhihua Gong, Yufan Zhang, Daixuan Li, Tianle Sang, Beixiao Zhu, Gregory Jun, Yingbing Huang, Yiqi Liu, Yuqi Xue, Rahul Dev Kundu, Qi Jian Lim, Yizhou Zhao, Luke Alexander Granger, Mohamed Badr Younis, Darioush Keivan, Nippun Sabharwal, Shreyanka Sinha, Prakhar Agarwal, Kojo Vandyck, Hanlin Mai, Zichen Wang, Aditya Venkatesh, Ayush Barik, Jiankun Yang, Chongying Yue, Jingjie He, Libin Wang, Licheng Xu, Hao Chen, Jinwen Wang, Liujun Xu, Rushabh Shetty, Ziheng Guo, Dahui Song, Manvi Jha, Weijie Liang, Weiman Yan, Bryan Zhang, Sahil Bhandary Karnoor, Jialiang Zhang, Rutva Pandya, Xinyi Gong, Mithesh Ballae Ganesh, Feize Shi, Ruiling Xu, Yifan Zhang, Yanfeng Ouyang, Lianhui Qin, Elyse Rosenbaum, Corey Snyder, Peter Seiler, Geir E. Dullerud, Xiaojia Shelly Zhang, Zuofu Cheng, Pavan Kumar Hanumolu, Jian Huang, Mayank Kulkarni, Mahdi Namazifar, Huan Zhang, Bin Hu
2024	—	`conf`	On-Chip Single-Shot Pulse Generator for TDDB Characterization on a Sub-Nanosecond Timescale. IRPS Matthew Drallmeier, Yujie Zhou, Elyse Rosenbaum
2024	—	`conf`	Reduced RC Time Constant High Voltage Tolerant Supply Clamp for ESD Protection in 16nm FinFET Technology. IRPS Shudong Huang, Srivatsan Parthasarathy, Yuanzhong Paul Zhou, Jean-Jacques Hajjar, Elyse Rosenbaum
2023	—	`conf`	Collector Engineering of ESD PNP in BCD Technologies. IRPS Yujie Zhou, David LaFonteese, Elyse Rosenbaum
2023	—	`conf`	Optimization of SCR for High-Speed Digital and RF Applications in 45-nm SOI CMOS Technology. IRPS Shudong Huang, Srivatsan Parthasarathy, Yuanzhong Paul Zhou, Jean-Jacques Hajjar, Elyse Rosenbaum
2023	—	`conf`	Semantic Autoencoder for Modeling BEOL and MOL Dielectric Lifetime Distributions. IRPS Weiman Yan, Ernest Wu, Alexander G. Schwing, Elyse Rosenbaum
2022	—	`conf`	A High Voltage Tolerant Supply Clamp for ESD Protection in a 45-nm SOI Technology. IRPS Shudong Huang, Srivatsan Parthasarathy, Yuanzhong Paul Zhou, Jean-Jacques Hajjar, Elyse Rosenbaum
2022	—	`conf`	Input-to-State Stable Neural Ordinary Differential Equations with Applications to Transient Modeling of Circuits. L4DC Alan Yang, Jie Xiong, Maxim Raginsky, Elyse Rosenbaum
2022	J	`jnl`	Input-to-State Stable Neural Ordinary Differential Equations with Applications to Transient Modeling of Circuits. CoRR Alan Yang, Jie Xiong, Maxim Raginsky, Elyse Rosenbaum
2021	—	`conf`	Compact Model of ESD Diode Suitable for Subnanosecond Switching Transients. IRPS Shudong Huang, Elyse Rosenbaum
2021	—	`conf`	Considerations in High Voltage Lateral ESD PNP Design. IRPS Milan Shah, Yujie Zhou, David LaFonteese, Elyse Rosenbaum
2021	—	`conf`	Neural Networks for Transient Modeling of Circuits : Invited Paper. MLCAD Jie Xiong, Alan Yang, Maxim Raginsky, Elyse Rosenbaum
2020	—	`conf`	An Interpretable Predictive Model for Early Detection of Hardware Failure. IRPS Artsiom Balakir, Alan Yang, Elyse Rosenbaum
2020	J	`jnl`	Analysis and Design of Integrated Voltage Regulators for Supply Noise Rejection During System-Level ESD. IEEE Trans. Circuits Syst. Yang Xiu, Elyse Rosenbaum
2020	A	`conf`	Model-Augmented Conditional Mutual Information Estimation for Feature Selection. UAI Alan Yang, AmirEmad Ghassami, Maxim Raginsky, Negar Kiyavash, Elyse Rosenbaum
2020	—	`conf`	Sub-nanosecond Reverse Recovery Measurement for ESD Devices. IRPS Alex Ayling, Shudong Huang, Elyse Rosenbaum
2019	A	`conf`	Guilty As Charged: Computational Reliability Threats Posed By Electrostatic Discharge-induced Soft Errors. DATE Keven Feng, Sandeep Vora, Rui Jiang, Elyse Rosenbaum, Shobha Vasudevan
2019	J	`jnl`	Model-Augmented Nearest-Neighbor Estimation of Conditional Mutual Information for Feature Selection. CoRR Alan Yang, AmirEmad Ghassami, Maxim Raginsky, Negar Kiyavash, Elyse Rosenbaum
2018	—	`conf`	Stochastic modeling of air electrostatic discharge parameters. IRPS Yang Xiu, Samuel Sagan, Advika Battini, Xiao Ma, Maxim Raginsky, Elyse Rosenbaum
2016	J	`jnl`	A Study of BER-Optimal ADC-Based Receiver for Serial Links. IEEE Trans. Circuits Syst. I Regul. Pap. Yingyan Lin, Min-Sun Keel, Adam C. Faust, Aolin Xu, Naresh R. Shanbhag, Elyse Rosenbaum, Andrew C. Singer
2016	J	`jnl`	Compact distributed multi-finger MOSFET model for circuit-level ESD simulation. Microelectron. Reliab. Kuo-Hsuan Meng, Zaichen Chen, Elyse Rosenbaum
2016	J	`jnl`	Full-Component Modeling and Simulation of Charged Device Model ESD. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. Kuo-Hsuan Meng, Vrashank Shukla, Elyse Rosenbaum
2015	—	`conf`	Improved GGSCR layout for overshoot reduction. IRPS Zaichen Chen, Robert Mertens, Collin Reiman, Elyse Rosenbaum
2012	—	`conf`	FEC-based 4 Gb/s backplane transceiver in 90nm CMOS. CICC Adam C. Faust, Rajan Narasimha, Karan S. Bhatia, Ankit Srivastava, Chhay Kong, Hyeon-Min Bae, Elyse Rosenbaum, Naresh R. Shanbhag
2011	—	`conf`	CDM-ESD induced damage in components using stacked-die packaging. CICC Nicholas Olson, Nathan Jack, Vrashank Shukla, Elyse Rosenbaum
2011	—	`conf`	ESD protection networks for 3D integrated circuits. 3DIC Elyse Rosenbaum, Vrashank Shukla, Min-Sun Keel
2009	J	`jnl`	A new compact model for external latchup. Microelectron. Reliab. Farzan Farbiz, Elyse Rosenbaum
2009	—	`conf`	Moving signals on and off chip. CICC Elyse Rosenbaum, Hyeon-Min Bae, Karan S. Bhatia, Adam C. Faust
2008	—	`conf`	UVeriESD: An ESD verification tool for SoC design. APCCAS Kelvin K. Hsueh, Sin-Hao Ke, Jeffrey Lee, Elyse Rosenbaum
2007	J	`jnl`	A Compact, ESD-Protected, SiGe BiCMOS LNA for Ultra-Wideband Applications. IEEE J. Solid State Circuits Karan S. Bhatia, Sami Hyvonen, Elyse Rosenbaum
2006	—	`conf`	An 8-mW, ESD-protected, CMOS LNA for Ultra-Wideband Applications. CICC Karan S. Bhatia, Sami Hyvonen, Elyse Rosenbaum
2006	J	`jnl`	An automated and efficient substrate noise analysis tool. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. Hongmei Li, Cole E. Zemke, Giorgos Manetas, Vladimir I. Okhmatovski, Elyse Rosenbaum, Andreas C. Cangellaris
2006	J	`jnl`	Compact modeling of on-chip ESD protection devices using Verilog-A. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. Junjun Li, Sopan Joshi, Ryan Barnes, Elyse Rosenbaum
2005	J	`jnl`	Comprehensive ESD protection for RF inputs. Microelectron. Reliab. Sami Hyvonen, Sopan Joshi, Elyse Rosenbaum
2005	—	`conf`	On-chip ESD protection for RF I/Os: devices, circuits and models. ISCAS (2) Elyse Rosenbaum, Sami Hyvonen
2004	J	`jnl`	Critical evaluation of SOI design guidelines. IEEE Trans. Very Large Scale Integr. Syst. Rouwaida Kanj, Elyse Rosenbaum
2004	A*	`conf`	Noise characterization of static CMOS gates. DAC Rouwaida Kanj, Timothy Lehner, Bhavna Agrawal, Elyse Rosenbaum
2003	—	`conf`	A Verilog-A compact model for ESD protection NMOSTs. CICC Junjun Li, Sopan Joshi, Elyse Rosenbaum
2003	J	`jnl`	Simulator-independent compact modeling of vertical npn transistors for ESD and RF circuit simulation. Microelectron. Reliab. Sopan Joshi, Elyse Rosenbaum
2002	—	`conf`	A critical look at design guidelines for SOI logic gates. ISCAS (3) Rouwaida Kanj, Elyse Rosenbaum
2002	A	`conf`	Comprehensive frequency-dependent substrate noise analysis using boundary element methods. ICCAD Hongmei Li, Jorge Carballido, Harry H. Yu, Vladimir I. Okhmatovski, Elyse Rosenbaum, Andreas C. Cangellaris
2001	J	`jnl`	Breakdown and latent damage of ultra-thin gate oxides under ESD stress conditions. Microelectron. Reliab. Jie Wu, Patrick Juliano, Elyse Rosenbaum
2001	J	`jnl`	Electrothermal model for simulation of bulk-Si and SOI diodes in ESD protection circuits. Microelectron. Reliab. Yu Wang, Patrick Juliano, Sopan Joshi, Elyse Rosenbaum
2001	J	`jnl`	Trap generation and breakdown processes in very thin gate oxides. Microelectron. Reliab. Elyse Rosenbaum, Jie Wu
2000	J	`jnl`	Interconnect thermal modeling for accurate simulation of circuittiming and reliability. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. Danqing Chen, Erhong Li, Elyse Rosenbaum, Sung-Mo Kang
1999	—	`conf`	Interconnect thermal modeling for determining design limits on current density. ISPD Danqing Chen, Erhong Li, Elyse Rosenbaum, Sung-Mo Kang
1999	A*	`conf`	Substrate Modeling and Lumped Substrate Resistance Extraction for CMOS ESD/Latchup Circuit Simulation. DAC Tong Li, Ching-Han Tsai, Elyse Rosenbaum, Sung-Mo Kang
1998	J	`jnl`	ILLIADS-T: an electrothermal timing simulator for temperature-sensitive reliability diagnosis of CMOS VLSI chips. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. Yi-Kan Cheng, Prasun Raha, Chin-Chi Teng, Elyse Rosenbaum, Sung-Mo Kang
1997	J	`jnl`	iTEM: a temperature-dependent electromigration reliability diagnosis tool. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. Chin-Chi Teng, Yi-Kan Cheng, Elyse Rosenbaum, Sung-Mo Kang
1996	—	`conf`	ETS-A: A New Electrothermal Simulator for CMOS VLSI Circuits. ED&TC Yi-Kan Cheng, Elyse Rosenbaum, Sung-Mo Kang
1996	A*	`conf`	Hierarchical Electromigration Reliability Diagnosis for VLSI Interconnects. DAC Chin-Chi Teng, Yi-Kan Cheng, Elyse Rosenbaum, Sung-Mo Kang
1996	A*	`conf`	iCET: A Complete Chip-Level Thermal Reliability Diagnosis Tool for CMOS VLSI Chips. DAC Yi-Kan Cheng, Chin-Chi Teng, Abhijit Dharchoudhury, Elyse Rosenbaum, Sung-Mo Kang
1993	J	`jnl`	Berkeley reliability tools-BERT. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. Robert H. Tu, Elyse Rosenbaum, Wilson Y. Chan, Chester C. Li, Eric R. Minami, Khandker N. Quader, Ping K. Ko, Chenming Hu