Elie Maricau

18 papers A 9C 2Journal 3Unranked 4
YearRankTypeTitle / Venue / Authors
2013 A conf
Stochastic degradation modeling and simulation for analog integrated circuits in nanometer CMOS.
DATE
Georges G. E. Gielen, Elie Maricau
2012 A conf
Advances in variation-aware modeling, verification, and testing of analog ICs.
DATE
Dimitri de Jonghe, Elie Maricau, Georges G. E. Gielen, Trent McConaghy, Bratislav Tasic, Haralampos-G. D. Stratigopoulos
2012 — conf
Designing reliable analog circuits in an unreliable world.
CICC
Georges G. E. Gielen, Elie Maricau, Pieter De Wit
2012 A conf
Hierarchical analog circuit reliability analysis using multivariate nonlinear regression and active learning sample selection.
DATE
Elie Maricau, Dimitri de Jonghe, Georges G. E. Gielen
2012 — conf
Offset measurement method for accurate characterization of BTI-induced degradation in opamps.
ICECS
Swaraj Mahato, Pieter De Wit, Elie Maricau, Georges G. E. Gielen
2011 A conf
Analog circuit reliability in sub-32 nanometer CMOS: Analysis and mitigation.
DATE
Georges G. E. Gielen, Elie Maricau, Pieter De Wit
2011 J jnl
Computer-Aided Analog Circuit Design for Reliability in Nanometer CMOS.
IEEE J. Emerg. Sel. Topics Circuits Syst.
Elie Maricau, Georges G. E. Gielen
2011 — conf
Impact analysis of stochastic transistor aging on current-steering DACs in 32nm CMOS.
ICECS
Simon Vanden Bussche, Pieter De Wit, Elie Maricau, Georges G. E. Gielen
2011 A conf
Stochastic circuit reliability analysis.
DATE
Elie Maricau, Georges G. E. Gielen
2011 — conf
Transistor aging-induced degradation of analog circuits: Impact analysis and design guidelines.
ESSCIRC
Elie Maricau, Georges G. E. Gielen
2010 A conf
Design automation towards reliable analog integrated circuits.
ICCAD
Georges G. E. Gielen, Elie Maricau, Pieter De Wit
2010 J jnl
Efficient Variability-Aware NBTI and Hot Carrier Circuit Reliability Analysis.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
Elie Maricau, Georges G. E. Gielen
2010 A conf
Variability-aware reliability simulation of mixed-signal ICs with quasi-linear complexity.
DATE
Elie Maricau, Georges G. E. Gielen
2009 C conf
A methodology for measuring transistor ageing effects towards accurate reliability simulation.
IOLTS
Elie Maricau, Georges G. E. Gielen
2009 A conf
Efficient reliability simulation of analog ICs including variability and time-varying stress.
DATE
Elie Maricau, Georges G. E. Gielen
2009 C conf
Panel: Realistic low power design: Let errors occur and correct them later or mitigate errors via design guardbanding and process control?.
IOLTS
Abhijit Chatterjee, Jacob A. Abraham, Adit D. Singh, Elie Maricau, Rakesh Kumar, Christos A. Papachristou
2008 J jnl
An analytical model for hot carrier degradation in nanoscale CMOS suitable for the simulation of degradation in analog IC applications.
Microelectron. Reliab.
Elie Maricau, Pieter De Wit, Georges G. E. Gielen
2008 A conf
Emerging Yield and Reliability Challenges in Nanometer CMOS Technologies.
DATE
Georges G. E. Gielen, Pieter De Wit, Elie Maricau, Johan Loeckx, Javier Martín-Martínez, Ben Kaczer, Guido Groeseneken, Rosana Rodríguez, Montserrat Nafría