Elie Maricau - RankMe

18 papers A 9C 2Journal 3Unranked 4

Year	Rank	Type	Title / Venue / Authors
2013	A	`conf`	Stochastic degradation modeling and simulation for analog integrated circuits in nanometer CMOS. DATE Georges G. E. Gielen, Elie Maricau
2012	A	`conf`	Advances in variation-aware modeling, verification, and testing of analog ICs. DATE Dimitri de Jonghe, Elie Maricau, Georges G. E. Gielen, Trent McConaghy, Bratislav Tasic, Haralampos-G. D. Stratigopoulos
2012	—	`conf`	Designing reliable analog circuits in an unreliable world. CICC Georges G. E. Gielen, Elie Maricau, Pieter De Wit
2012	A	`conf`	Hierarchical analog circuit reliability analysis using multivariate nonlinear regression and active learning sample selection. DATE Elie Maricau, Dimitri de Jonghe, Georges G. E. Gielen
2012	—	`conf`	Offset measurement method for accurate characterization of BTI-induced degradation in opamps. ICECS Swaraj Mahato, Pieter De Wit, Elie Maricau, Georges G. E. Gielen
2011	A	`conf`	Analog circuit reliability in sub-32 nanometer CMOS: Analysis and mitigation. DATE Georges G. E. Gielen, Elie Maricau, Pieter De Wit
2011	J	`jnl`	Computer-Aided Analog Circuit Design for Reliability in Nanometer CMOS. IEEE J. Emerg. Sel. Topics Circuits Syst. Elie Maricau, Georges G. E. Gielen
2011	—	`conf`	Impact analysis of stochastic transistor aging on current-steering DACs in 32nm CMOS. ICECS Simon Vanden Bussche, Pieter De Wit, Elie Maricau, Georges G. E. Gielen
2011	A	`conf`	Stochastic circuit reliability analysis. DATE Elie Maricau, Georges G. E. Gielen
2011	—	`conf`	Transistor aging-induced degradation of analog circuits: Impact analysis and design guidelines. ESSCIRC Elie Maricau, Georges G. E. Gielen
2010	A	`conf`	Design automation towards reliable analog integrated circuits. ICCAD Georges G. E. Gielen, Elie Maricau, Pieter De Wit
2010	J	`jnl`	Efficient Variability-Aware NBTI and Hot Carrier Circuit Reliability Analysis. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. Elie Maricau, Georges G. E. Gielen
2010	A	`conf`	Variability-aware reliability simulation of mixed-signal ICs with quasi-linear complexity. DATE Elie Maricau, Georges G. E. Gielen
2009	C	`conf`	A methodology for measuring transistor ageing effects towards accurate reliability simulation. IOLTS Elie Maricau, Georges G. E. Gielen
2009	A	`conf`	Efficient reliability simulation of analog ICs including variability and time-varying stress. DATE Elie Maricau, Georges G. E. Gielen
2009	C	`conf`	Panel: Realistic low power design: Let errors occur and correct them later or mitigate errors via design guardbanding and process control?. IOLTS Abhijit Chatterjee, Jacob A. Abraham, Adit D. Singh, Elie Maricau, Rakesh Kumar, Christos A. Papachristou
2008	J	`jnl`	An analytical model for hot carrier degradation in nanoscale CMOS suitable for the simulation of degradation in analog IC applications. Microelectron. Reliab. Elie Maricau, Pieter De Wit, Georges G. E. Gielen
2008	A	`conf`	Emerging Yield and Reliability Challenges in Nanometer CMOS Technologies. DATE Georges G. E. Gielen, Pieter De Wit, Elie Maricau, Johan Loeckx, Javier Martín-Martínez, Ben Kaczer, Guido Groeseneken, Rosana Rodríguez, Montserrat Nafría