Elham K. Moghaddam

20 papers A* 1A 7C 1Misc 1Journal 6Unranked 4
YearRankTypeTitle / Venue / Authors
2021 J jnl
Time and Area Optimized Testing of Automotive ICs.
IEEE Trans. Very Large Scale Integr. Syst.
Nilanjan Mukherjee, Daniel Tille, Mahendar Sapati, Yingdi Liu, Jeffrey Mayer, Sylwester Milewski, Elham K. Moghaddam, Janusz Rajski, Jedrzej Solecki, Jerzy Tyszer
2019 J jnl
Logic BIST With Capture-Per-Clock Hybrid Test Points.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
Elham K. Moghaddam, Nilanjan Mukherjee, Janusz Rajski, Jedrzej Solecki, Jerzy Tyszer, Justyna Zawada
2019 A conf
Test Time and Area Optimized BrST Scheme for Automotive ICs.
ITC
Nilanjan Mukherjee, Jerzy Tyszer, Daniel Tille, Mahendar Sapati, Yingdi Liu, Jeffrey Mayer, Sylwester Milewski, Elham K. Moghaddam, Janusz Rajski, Jedrzej Solecki
2018 J jnl
Hardware Protection via Logic Locking Test Points.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
Michael Chen, Elham K. Moghaddam, Nilanjan Mukherjee, Janusz Rajski, Jerzy Tyszer, Justyna Zawada
2017 J jnl
Embedded Deterministic Test Points.
IEEE Trans. Very Large Scale Integr. Syst.
Cesar Acero, Derek Feltham, Yingdi Liu, Elham K. Moghaddam, Nilanjan Mukherjee, Marek Patyra, Janusz Rajski, Sudhakar M. Reddy, Jerzy Tyszer, Justyna Zawada
2016 A conf
Minimal area test points for deterministic patterns.
ITC
Yingdi Liu, Elham K. Moghaddam, Nilanjan Mukherjee, Sudhakar M. Reddy, Janusz Rajski, Jerzy Tyszer
2016 J jnl
On New Test Points for Compact Cell-Aware Tests.
IEEE Des. Test
Cesar Acero, Derek Feltham, Marek Patyra, Friedrich Hapke, Elham K. Moghaddam, Nilanjan Mukherjee, Vidya Neerkundar, Janusz Rajski, Jerzy Tyszer, Justyna Zawada
2016 — conf
On Test Points Enhancing Hardware Security.
ATS
Elham K. Moghaddam, Nilanjan Mukherjee, Janusz Rajski, Jerzy Tyszer, Justyna Zawada
2016 A conf
Test point insertion in hybrid test compression/LBIST architectures.
ITC
Elham K. Moghaddam, Nilanjan Mukherjee, Janusz Rajski, Jerzy Tyszer, Justyna Zawada
2015 A* conf
Design for low test pattern counts.
DAC
Haluk Konuk, Elham K. Moghaddam, Nilanjan Mukherjee, Janusz Rajski, Deepak Solanki, Jerzy Tyszer, Justyna Zawada
2015 A conf
Embedded deterministic test points for compact cell-aware tests.
ITC
Cesar Acero, Derek Feltham, Friedrich Hapke, Elham K. Moghaddam, Nilanjan Mukherjee, Vidya Neerkundar, Marek Patyra, Janusz Rajski, Jerzy Tyszer, Justyna Zawada
2015 J jnl
Isometric Test Data Compression.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
Amit Kumar, Mark Kassab, Elham K. Moghaddam, Nilanjan Mukherjee, Janusz Rajski, Sudhakar M. Reddy, Jerzy Tyszer, Chen Wang
2014 A conf
Isometric test compression with low toggling activity.
ITC
Amit Kumar, Mark Kassab, Elham K. Moghaddam, Nilanjan Mukherjee, Janusz Rajski, Sudhakar M. Reddy, Jerzy Tyszer, Chen Wang
2011 — conf
Low Test Data Volume Low Power At-Speed Delay Tests Using Clock-Gating.
Asian Test Symposium
Elham K. Moghaddam, Janusz Rajski, Sudhakar M. Reddy, Jakub Janicki
2011 A conf
Low power compression utilizing clock-gating.
ITC
Janusz Rajski, Elham K. Moghaddam, Sudhakar M. Reddy
2011 — conf
Power Aware Embedded Test.
Asian Test Symposium
Xijiang Lin, Elham K. Moghaddam, Nilanjan Mukherjee, Benoit Nadeau-Dostie, Janusz Rajski, Jerzy Tyszer
2010 Misc conf
At-speed scan test with low switching activity.
VTS
Elham K. Moghaddam, Janusz Rajski, Sudhakar M. Reddy, Mark Kassab
2010 A conf
Low capture power at-speed test in EDT environment.
ITC
Elham K. Moghaddam, Janusz Rajski, Sudhakar M. Reddy, Xijiang Lin, Nilanjan Mukherjee, Mark Kassab
2007 — conf
An On-Line BIST Technique for Delay Fault Detection in CMOS Circuits.
ATS
Elham K. Moghaddam, Shaahin Hessabi
2007 C conf
An On-Line BIST Technique for Stuck-Open Fault Detection in CMOS Circuits.
DSD
Elham K. Moghaddam, Shaahin Hessabi