| Year | Rank | Type | Title / Venue / Authors |
|---|---|---|---|
| 2026 | J | jnl |
IEEE Access
|
| 2026 | J | jnl |
CoRR
|
| 2026 | J | jnl |
CoRR
|
| 2025 | J | jnl |
CoRR
|
| 2025 | J | jnl |
CoRR
|
| 2025 | J | jnl |
IEEE Trans. Reliab.
|
| 2025 | J | jnl |
CoRR
|
| 2025 | J | jnl |
IEEE Trans. Dependable Secur. Comput.
|
| 2025 | J | jnl |
IEEE Access
|
| 2025 | J | jnl |
CoRR
|
| 2024 | J | jnl |
IEEE Trans. Circuits Syst. II Express Briefs
|
| 2024 | J | jnl |
CoRR
|
| 2023 | J | jnl |
IEEE Access
|
| 2022 | J | jnl |
IEEE Trans. Computers
|
| 2022 | J | jnl |
IEEE Access
|
| 2022 | J | jnl |
CoRR
|
| 2022 | J | jnl |
CoRR
|
| 2022 | J | jnl |
IEEE Trans. Parallel Distributed Syst.
|
| 2022 | J | jnl |
CoRR
|
| 2020 | J | jnl |
IEEE Trans. Reliab.
|
| 2020 | A | conf |
DATE
|
| 2019 | J | jnl |
IEEE Trans. Circuits Syst. II Express Briefs
|
| 2019 | A | conf |
DATE
|
| 2019 | — | conf |
ASP-DAC
|
| 2019 | J | jnl |
IEEE Trans. Computers
|
| 2017 | J | jnl |
Qual. Reliab. Eng. Int.
|
| 2016 | C | conf |
PDP
|
| 2016 | Misc | conf |
EDCC
|
| 2015 | J | jnl |
Microelectron. Reliab.
|